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    • 1. 发明授权
    • Tire pressure estimation
    • 轮胎压力估计
    • US07263458B2
    • 2007-08-28
    • US10563524
    • 2003-07-07
    • Peter HallTony GustavssonPeter LindskogFredrik GustavssonUrban Forssell
    • Peter HallTony GustavssonPeter LindskogFredrik GustavssonUrban Forssell
    • B60C23/00B60C23/02
    • B60C23/062B60C23/061
    • A method of estimating the occurrence of a specific tire pressure deviation between actual and nominal pressure values for one or a plurality of wheels (i) is provided. One or more wheel radius analysis measurement values (ΔR) are subsequently obtained from a wheel radius analysis component (104), wherein the wheel radius analysis measurement values (ΔR) are related to single wheel radius values (Δri) of which each is indicative of the wheel radius of a particular wheel (i). One or more wheel vibration data values (Δƒi) are subsequently obtained from a wheel vibration analysis component (102), wherein each of the wheel vibration data values (Δƒi) is indicative of a vibration phenomena in the time dependent behavior of the rotational velocity of a particular wheel (i). One or more tire pressure output values (ηi, Δpi) are calculated on the basis of both the wheel radius analysis measurement values (ΔR) and the wheel vibration data values (Δƒi) wherein each tire pressure output value (ηi, Δpi) is indicative of the specific tire pressure deviation for a particular wheel (i).
    • 提供了一种估计一个或多个轮(i)的实际和标称压力值之间的特定轮胎压力偏差的发生的方法。 随后从车轮半径分析部件(104)获得一个或多个车轮半径分析测量值(DeltaR),其中车轮半径分析测量值(ΔR)与单轮半径值(Deltar< >),其各自表示特定车轮(i)的车轮半径。 随后从车轮振动分析部件(102)获得一个或多个车轮振动数据值(Deltaf< i>),其中车轮振动数据值(Deltaf< 表示特定车轮(i)的旋转速度的时间相关行为中的振动现象。 基于车轮半径分析测量值(DeltaR)和车轮振动数据值两者来计算一个或多个轮胎压力输出值(eta,Deltap) (Deltaf)其中每个轮胎压力输出值(eta,DeltapΠi)表示特定车轮的特定轮胎压力偏差 (一世)。
    • 5. 发明授权
    • Method of producing a microstructured product
    • 生产微结构产品的方法
    • US08755101B2
    • 2014-06-17
    • US12810672
    • 2008-12-19
    • Axel LundvallFredrik NikolajeffFredrik GustavssonRobert Eklund
    • Axel LundvallFredrik NikolajeffFredrik GustavssonRobert Eklund
    • G03H1/08
    • B29C59/046B29C35/0888B29C2035/0827B29C2035/0877B29C2059/023G02B3/0012
    • The present invention provides a method of producing a two-sided microstructured product and a registration structure that can be used for the method. The method comprises the steps of: (800) providing primary product features (80) at a first surface of a substrate sheet (50); (810) providing secondary product features (90) at an opposed surface; (820) registering the mutual alignment of the primary and secondary product features (80, 90) to estimate alignment parameters; and (830) aligning the provision of primary and secondary product features (80, 90). The registration structure comprises a registration-array of focusing elements (20) at a first surface and a registration-array of reference objects (30) at an opposed surface aligned with primary and secondary product features (80,90) that provides a holographic representation (10) of the reference objects (30) in order to estimate the alignment of product features (80,90).
    • 本发明提供可以用于该方法的双面微结构化产品和配准结构的制造方法。 该方法包括以下步骤:(800)在基片(50)的第一表面处提供初级产品特征(80); (810)在相对的表面处提供次要产品特征(90); (820)记录所述主要和次要产品特征(80,90)的相互对准以估计对准参数; 和(830)对齐主要和次要产品功能的提供(80,90)。 注册结构包括在第一表面处的聚焦元件(20)的配准阵列和在与主要和次要产品特征(80,90)对准的相对表面处的参考对象(30)的配准阵列,其提供全息图 (10),以便估计产品特征的对准(80,90)。
    • 10. 发明申请
    • METHOD OF PRODUCING A MICROSTRUCTURED PRODUCT
    • 生产微结构产品的方法
    • US20110058239A1
    • 2011-03-10
    • US12810672
    • 2008-12-19
    • Axel LundvallFredrik NikolajeffFredrik GustavssonRobert Eklund
    • Axel LundvallFredrik NikolajeffFredrik GustavssonRobert Eklund
    • G03H1/08B29C59/00
    • B29C59/046B29C35/0888B29C2035/0827B29C2035/0877B29C2059/023G02B3/0012
    • The present invention provides a method of producing a two-sided microstructured product and a registration structure that can be used for the method. The method comprises the steps of: (800) providing primary product features (80) at a first surface of a substrate sheet (50); (810) providing secondary product features (90) at an opposed surface; (820) registering the mutual alignment of the primary and secondary product features (80, 90) to estimate alignment parameters; and (830) aligning the provision of primary and secondary product features (80, 90). The registration structure comprises a registration-array of focusing elements (20) at a first surface and a registration-array of reference objects (30) at an opposed surface aligned with primary and secondary product features (80,90) that provides a holographic representation (10) of the reference objects (30) in order to estimate the alignment of product features (80,90).
    • 本发明提供可以用于该方法的双面微结构化产品和配准结构的制造方法。 该方法包括以下步骤:(800)在基片(50)的第一表面处提供初级产品特征(80); (810)在相对的表面处提供次要产品特征(90); (820)记录所述主要和次要产品特征(80,90)的相互对准以估计对准参数; 和(830)对齐主要和次要产品功能的提供(80,90)。 注册结构包括在第一表面处的聚焦元件(20)的配准阵列和在与主要和次要产品特征(80,90)对准的相对表面处的参考对象(30)的配准阵列,其提供全息图 (10),以便估计产品特征的对准(80,90)。