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1. 发明授权

US5552591A Presence/absence bar code 失效
标题翻译：存在/不存在条形码
公开(公告)号：US5552591A
公开(公告)日：1996-09-03
申请号：US21298
申请日：1993-02-22
申请人： Douglas C. Bossen , Chin-Long Chen , Frederick H. Dill , Douglas S. Goodman , Mu-Yue Hsiao , Paul V. McCann , James M. Mulligan , Ricky A. Rand
发明人： Douglas C. Bossen , Chin-Long Chen , Frederick H. Dill , Douglas S. Goodman , Mu-Yue Hsiao , Paul V. McCann , James M. Mulligan , Ricky A. Rand
IPC分类号： G06K1/12 , G06K7/016 , G06K7/10 , G06K19/06
CPC分类号： G06K7/10861 , G06K1/126 , G06K19/06028 , G06K7/0166 , G06K2019/06253
摘要： A single width bar code exhibiting inherent self clocking characteristics is provided so as to be particularly useful in the identification of semiconductor wafers in very large scale integrated circuit manufacturing processes. The codes described herein are robust, reliable and highly readable even in the face of relatively high variations in scanning speed. The codes are also desirably dense in terms of character representations per linear centimeter, an important consideration in semiconductor manufacturing wherein space on the chips and the wafer is at a premium. Additionally, a preferred embodiment of the present invention exhibits a minimum number for the maximum number of spaces between adjacent bars in code symbol sequences.
摘要翻译：提供了具有固有的自身时钟特性的单宽度条形码，以便在非常大规模的集成电路制造工艺中的半导体晶片的识别中特别有用。即使面对相对高的扫描速度变化，这里描述的代码是鲁棒的，可靠的和高度可读的。这些代码在每个线性厘米的字符表示方面也是令人满意的，这在半导体制造中是重要的考虑因素，其中芯片和晶片上的空间是非常重要的。另外，本发明的一个优选实施例在代码符号序列中显示相邻条之间的最大空格数的最小数目。

2. 发明授权

US5380998A Single width bar code with end code providing bidirectionality 失效
标题翻译：单宽条形码，带终端代码提供双向性
公开(公告)号：US5380998A
公开(公告)日：1995-01-10
申请号：US072260
申请日：1993-06-03
申请人： Douglas C. Bossen , Chin-Long Chen , Mu-Yue Hsiao , James M. Mulligan
发明人： Douglas C. Bossen , Chin-Long Chen , Mu-Yue Hsiao , James M. Mulligan
IPC分类号： G06K1/12 , G06K7/10 , G06K19/06
CPC分类号： G06K19/06028 , G06K2019/06253
摘要： A single width bar code is appended with an end mark which includes a blank interval and a bar. The resulting bar code is bidirectional and inherently self clocking so as to be particularly useful in the identification of semiconductor wafers in very large scale integrated circuit manufacturing processes. The codes described are robust, reliable, and highly readable even in the face of relatively high variations in scanning speed. The codes are also desirably dense in terms of character representations per linear measurements, an important consideration in semiconductor manufacturing wherein space on chips and wafers is at a premium. Additionally, a preferred embodiment of the present invention exhibits a minimum number for the maximum number of spaces between adjacent bars in code symbol sequences.
摘要翻译：单个宽度条形码附加结尾标记，其中包括空白间隔和条形。所得到的条形码是双向的并且固有地自我计时，以便在非常大规模的集成电路制造过程中的半导体晶片的识别中特别有用。所描述的代码是稳健，可靠和高度可读的，即使在扫描速度相对较高的变化的情况下。代码在每个线性测量的字符表示方面也是令人满意的，这在半导体制造中是重要的考虑因素，其中芯片和晶片上的空间是非常重要的。另外，本发明的一个优选实施例在代码符号序列中显示相邻条之间的最大空格数的最小数目。

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