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    • 3. 发明授权
    • Memory array with multiple read ports
    • 具有多个读端口的内存阵列
    • US07092310B2
    • 2006-08-15
    • US11010902
    • 2004-12-13
    • Martin EckertJuergen PilleDieter Wendel
    • Martin EckertJuergen PilleDieter Wendel
    • G11C8/00
    • G11C7/1075G11C8/16
    • A multiport array comprises a read section which is separated from an array of memory cells and which forms a plurality of data-out ports each consisting of a predetermined number of output lines. The read section comprises a multiplex network containing a plurality of multiplex arrays each associated with one of the data-out ports (0,1, . . . ,15). The multiplex arrays are connected to the data read lines of the memory cells and are selected by read addresses. The multiplex arrays comprise transmission elements which connect selected ones of the data read lines to the associated data-out port.
    • 多端口阵列包括与存储器单元阵列分离并且形成多个数据输出端口的读取部件,每个数据输出端口由预定数量的输出线路组成。 读取部分包括多路复用网络,该多路复用网络包含多个多路复用阵列,每个多路复用阵列与数据输出端口(0,1,...,15)之一相关联。 多路复用阵列连接到存储单元的数据读取线,并通过读地址进行选择。 多路复用阵列包括将选定数据读取线连接到相关联的数据输出端口的传输元件。
    • 7. 发明授权
    • Test fail analysis on VLSI chips
    • VLSI芯片测试故障分析
    • US08180142B2
    • 2012-05-15
    • US12326166
    • 2008-12-02
    • Martin EckertGeorg GoeckeMarta JungingerKlaus KempterMarkus Ulbricht
    • Martin EckertGeorg GoeckeMarta JungingerKlaus KempterMarkus Ulbricht
    • G06K9/03
    • G06T7/001G06T2207/30148
    • Compact graphical representations of common test fail signatures and process related test fails are provided through methods of selecting, calculating and/or presenting information. The input may be a list of failing tests on a sample of devices under test from chip and/or wafer process fails. The failing tests are identified and then other tests that fail at the same time may be identified. Several graphical outputs are provided, including all possible combinations between test fails and between test fails and process fails. The dependencies are printed as sorted two dimensional bitmaps that are compact representations of the results using color codes. Subtraction of two independent bitmaps is provided, which eliminates common properties and emphasizes differences between multiple bitmaps which allows for quick identification of differences of process fails potentially different between the two different bitmaps indicating potential root causes for the selected one of the test fails.
    • 通过选择,计算和/或呈现信息的方法提供常见测试失败签名和过程相关测试失败的紧凑图形表示。 输入可以是从芯片和/或晶片处理失败的被测器件的样本的失败测试的列表。 确定失败的测试,然后可以确定同时失败的其他测试。 提供了几个图形输出,包括测试失败和测试失败和进程失败之间的所有可能的组合。 依赖关系作为排序的二维位图打印,这些位图是使用颜色代码的结果的紧凑表示。 提供了两个独立位图的减法,这消除了通用属性,并且强调了多个位图之间的差异,这允许快速识别两个不同位图之间的差异的过程失败,这两个不同的位图表示所选择的一个测试失败的潜在根本原因。