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    • 1. 发明授权
    • Mass spectrometer for both positive and negative particle detection
    • 质谱仪用于检测正和负的粒子
    • US06979818B2
    • 2005-12-27
    • US10860776
    • 2004-06-03
    • Adi A. ScheidemannMark W. DasselMark WadsworthEustathios Vassiliou
    • Adi A. ScheidemannMark W. DasselMark WadsworthEustathios Vassiliou
    • H01F7/02H01J49/02H01J49/10H01J49/20H01J49/32H01J37/244
    • H01J49/30H01J49/0095H01J49/20
    • A mass spectrometer suitable to measure both positive and negative particles, such as ions for example in a vacuum chamber. This spectrometer is provided with a turnable permanent magnet segment, which provides the gap of a yoke with adequate magnetic flux having the appropriate direction to separate the positive or the negative particles. Changing the polarity adjusts the flight path of the ions. Thus, negatively charged ions and positively charged ions will follow similar flight paths under opposite polarities, permitting the use of a single array of detectors. One or more coils may be used in place of or in addition to the turnable permanent magnet segment in order to provide the appropriate magnetic flux to the gap, and/or facilitate the turning process of the turnable magnet segment. The turnable magnet and/or the coils may be inside or outside the vacuum chamber. The detector may comprise at least one detector area, two charge mode amplifiers coupled to the detector area, a first CCD shift register coupled to a first one of the charge mode amplifiers and a second CCD shift register coupled to a second one of the charge mode amplifiers.
    • 适用于测量正,负颗粒的质谱仪,例如在真空室中的离子。 该光谱仪设置有可转动永磁体段,其提供具有适当方向的足够磁通量的磁轭的间隙以分离正或负的颗粒。 改变极性调整离子的飞行路径。 因此,带负电荷的离子和带正电荷的离子将在相反的极性下遵循相似的飞行路径,允许使用单个检测器阵列。 可以使用一个或多个线圈代替可转动永久磁铁段或除了可转动永磁体段之外,以便向间隙提供适当的磁通量和/或便于可转动磁体段的转动过程。 可转动磁体和/或线圈可以在真空室的内部或外部。 检测器可以包括至少一个检测器区域,耦合到检测器区域的两个充电模式放大器,耦合到第一个充电模式放大器的第一CCD移位寄存器和耦合到充电模式中的第二个的第二CCD移位寄存器 放大器
    • 8. 发明授权
    • Charged particle beam detection system
    • 带电粒子束检测系统
    • US07282709B2
    • 2007-10-16
    • US10611327
    • 2003-06-30
    • Robert Bruce DarlingAdi A. ScheidemannFrank J. Schumacher, IVPatrick L. Jones
    • Robert Bruce DarlingAdi A. ScheidemannFrank J. Schumacher, IVPatrick L. Jones
    • H01J40/00
    • H01J49/025H01J49/10H01J2237/24507H01J2237/24542
    • A charged particle beam detection system that includes a Faraday cup detector array (FCDA) for position-sensitive charged particle beam detection is described. The FCDA is combined with an electronic multiplexing unit (MUX) that allows collecting and integrating the charge deposited in the array, and simultaneously reading out the same. The duty cycle for collecting the ions is greater than 98%. This multiplexing is achieved by collecting the charge with a large number of small and electronically decoupled Faraday cups. Because Faraday cups collect the charge independent of their charge state, each cup is both a collector and an integrator. The ability of the Faraday cup to integrate the charge, in combination with the electronic multiplexing unit, which reads out and empties the cups quickly compared to the charge integration time, provides the almost perfect duty cycle for this position-sensitive charged particle detector. The device measures further absolute ion currents, has a wide dynamic range from 1.7 pA to 1.2 μA with a crosstalk of less than 750:1. The integration of the electronic multiplexing unit with the FCDA further allows reducing the number of feedthroughs that are needed to operate the detector.
    • 描述了一种包括用于位置敏感带电粒子束检测的法拉第杯检测器阵列(FCDA)的带电粒子束检测系统。 FCDA与电子多路复用单元(MUX)组合,可以收集和积分阵列中的电荷并同时读出。 收集离子的占空比大于98%。 通过用大量小型和电子去耦法拉第杯收集电荷来实现这种复用。 由于法拉第杯独立于充电状态收集电荷,因此每个杯子都是收集器和积分器。 与充电积分时间相比,法拉第杯与电子多路复合单元组合的能力与电子多路复用单元相结合,能够快速地清空和提供杯子,这为位置敏感的带电粒子检测器提供了几乎完美的占空比。 该器件测量进一步的绝对离子电流,具有1.7 pA至1.2μA的宽动态范围,串扰小于750:1。 电子复用单元与FCDA的集成进一步允许减少操作检测器所需的馈通数量。
    • 9. 发明授权
    • Charged particle beam detection system
    • 带电粒子束检测系统
    • US06847036B1
    • 2005-01-25
    • US09744360
    • 1999-10-06
    • Robert Bruce DarlingAdi A. ScheidemannFrank J. Schumacher IVPatrick L. Jones
    • Robert Bruce DarlingAdi A. ScheidemannFrank J. Schumacher IVPatrick L. Jones
    • G01N27/00G01T1/29G21F1/00H01J37/04H01J40/00H01J49/02H01J49/10H01J49/26
    • H01J49/025H01J49/10H01J2237/24507H01J2237/24542
    • A charged particle beam detection system (10) that includes a Faraday cup detector array (FCDA) for position-sensitive charged particle beam detection is described. The FCDA is combined with an electronic multiplexing unit (MUX) (2) that allows collecting and intgrating the charge deposited in the array, and simultaneously reading out the same. The duty cycle for collecting the ions is greater than 98%. This multiplexing (2) is achieved by collecting the charge with a large number of small and electronically decoupled Faraday cups. Because Faraday cups collect the charge independent of their charge state, each cup is both a collector and an integrator. The ability of the Faraday cup to integrate the charge, in combination with the electronic multiplexing unit (2), which reads out and empties the cups quickly compared to the charge integration time, provides the almost perfect duty cycle for this position-sensitive charged particle detector (10). The device (10) measures further absolute ion currents, has a wide dynamic range from 1.7 pA to 1.2 μA with a crosstalk of less than 750:1. The integration of the electronic multiplexing unit (2) with the FCDA further allows reducing the number of feedthroughs that are needed to operate the detector (10).
    • 描述了包括用于位置敏感带电粒子束检测的法拉第杯检测器阵列(FCDA)的带电粒子束检测系统(10)。 FCDA与电子复用单元(MUX)(2)组合,允许收集和整合堆积在阵列中的电荷,同时读出它们。 收集离子的占空比大于98%。 这种多路复用(2)通过用大量小的和电子去耦的法拉第杯收集电荷来实现。 由于法拉第杯独立于充电状态收集电荷,因此每个杯子都是收集器和积分器。 与电荷积分时间相比,法拉第杯与电子多路复用单元(2)组合的能力与电子多路复用单元(2)组合能够快速地排空并提供了空白,为这种位置敏感的带电粒子提供了几乎完美的占空比 检测器(10)。 器件(10)测量进一步的绝对离子电流,具有从1.7pA到1.2μA的宽动态范围,串扰小于750:1。 电子多路复用单元(2)与FCDA的集成进一步允许减少操作检测器(10)所需的馈通数量。
    • 10. 发明授权
    • Optical bench for a mass spectrometer system
    • 光谱仪系统的光学台
    • US07442920B2
    • 2008-10-28
    • US11205758
    • 2005-08-16
    • Adi A. ScheidemannMark S. McGrawClare R. LongGottfried P. Kibelka
    • Adi A. ScheidemannMark S. McGrawClare R. LongGottfried P. Kibelka
    • B01D59/44
    • H01J49/02H01J49/28H05K1/0271H05K1/0284H05K2201/2009
    • Mass spectrometer systems for measuring mass/charge ratios of analytes are described. A mass spectrometer system includes a vacuum flange, a PCB base plate coupled to the vacuum flange, and an ion optic assembly coupled to the PCB base plate. The PCB base plate may include signal-processing electronics. The system may include an electrical cable coupled to the PCB base plate for supplying power, control, and I/O to the ion optic assembly and the signal processing electronics. Alternatively, a mass spectrometer system includes a PCB base plate and an ion optic assembly. The PCB base plate has a sealant portion and an electrical portion. The ion optic assembly is coupled to the electrical portion. The system may include a vacuum housing for enclosing the ion optic assembly. The vacuum housing is coupled to the sealant portion of the PCB base plate for sustaining a vacuum while the system is in operation.
    • 描述了用于测量分析物质量/电荷比的质谱仪系统。 质谱仪系统包括真空法兰,联接到真空法兰的PCB基板和耦合到PCB基板的离子光学组件。 PCB基板可以包括信号处理电子器件。 该系统可以包括耦合到PCB基板的电缆,用于向离子光学组件和信号处理电子器件供电,控制和I / O。 或者,质谱仪系统包括PCB基板和离子光学组件。 PCB基板具有密封剂部分和电气部分。 离子光学组件耦合到电气部分。 该系统可以包括用于封闭离子光学组件的真空壳体。 真空壳体联接到PCB基板的密封剂部分,以在系统运行时维持真空。