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    • 3. 发明授权
    • Electrical impedance tomography of nanoengineered thin films
    • 纳米工程薄膜的电阻抗层析成像
    • US08159235B2
    • 2012-04-17
    • US12209318
    • 2008-09-12
    • Jerome P. LynchTsung-Chin HuoNicholas A. KotovNadine Wong Shi KamKenneth J. Loh
    • Jerome P. LynchTsung-Chin HuoNicholas A. KotovNadine Wong Shi KamKenneth J. Loh
    • G01R27/08
    • G01R27/02
    • The present teachings relate to the application of electrical impedance tomography (EIT) to demonstrate the multifunctionality of carbon nanocomposite thin films under various types of environmental stimuli. Carbon nanotube (CNT) thin films are fabricated by a layer-by-layer (LbL) technique or other techniques and mounted with electrodes along their boundaries. The response of the thin films to various stimuli determined by relying on electric current excitation and corresponding boundary potential measurements. The spatial conductivity variations are reconstructed based on a mathematical model for the EIT technique. Here, the ability of the EIT method to provide two-dimensional mapping of the conductivity of CNT thin films is validated by (1) electrically imaging intentional structural defects in the thin films and (2) mapping the film's response to various pH environments.
    • 本教导涉及电阻抗层析成像(EIT)的应用,以证明在各种环境刺激下碳纳米复合薄膜的多功能性。 碳纳米管(CNT)薄膜通过逐层(LbL)技术或其他技术制造,并沿其边界安装电极。 通过依靠电流激励和对应的边界电位测量确定薄膜对各种刺激的响应。 基于EIT技术的数学模型重建空间电导率变化。 在这里,EIT方法提供CNT薄膜电导率的二维映射的能力通过(1)电沉积薄膜中有意的结构缺陷和(2)将薄膜的响应映射到各种pH环境来验证。