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    • 1. 发明申请
    • METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
    • 制造半导体器件的方法
    • US20110312125A1
    • 2011-12-22
    • US13220251
    • 2011-08-29
    • Akhiro Nomoto
    • Akhiro Nomoto
    • H01L51/40
    • H01L51/0013H01L51/0014H01L51/0026H01L51/0036H01L51/0043H01L51/0097H01L51/0541H01L51/0545
    • A method for manufacturing a semiconductor device is provided. The method includes the steps of: (1) coating a solution containing an organic semiconductor material on a water-repellent surface of a water-repellent stamp substrate; (2) drying the thus coated organic semiconductor material-containing solution on the water-repellent surface to crystallize the organic semiconductor material in contact with the water-repellent surface, thereby forming a semiconductor layer; (3) thermally treating the semiconductor layer formed on the stamp substrate; and (4) pressing the stamp substrate at a side, in which the thermally treated organic semiconductor layer is formed, against a surface of a substrate to be transferred so that the organic semiconductor layer is transferred to the surface of the substrate to be transferred.
    • 提供一种制造半导体器件的方法。 该方法包括以下步骤:(1)将包含有机半导体材料的溶液涂覆在防水印模基板的拒水表面上; (2)将这样涂布的含有机半导体材料的溶液干燥在防水表面上,使有机半导体材料与防水表面接触,从而形成半导体层; (3)对形成在印模基板上的半导体层进行热处理; 和(4)将形成有热处理的有机半导体层的一侧的印模基板压在要转印的基板的表面上,使得有机半导体层被转印到待转印的基板的表面上。
    • 2. 发明申请
    • METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
    • 制造半导体器件的方法
    • US20070184585A1
    • 2007-08-09
    • US11620527
    • 2007-01-05
    • Akhiro Nomoto
    • Akhiro Nomoto
    • H01L21/84H01L21/00
    • H01L51/0013H01L51/0014H01L51/0026H01L51/0036H01L51/0043H01L51/0097H01L51/0541H01L51/0545
    • A method for manufacturing a semiconductor device is provided. The method includes the steps of: (1) coating a solution containing an organic semiconductor material on a water-repellent surface of a water-repellent stamp substrate; (2) drying the thus coated organic semiconductor material-containing solution on the water-repellent surface to crystallize the organic semiconductor material in contact with the water-repellent surface, thereby forming a semiconductor layer; (3) thermally treating the semiconductor layer formed on the stamp substrate; and (4) pressing the stamp substrate at a side, in which the thermally treated organic semiconductor layer is formed, against a surface of a substrate to be transferred so that the organic semiconductor layer is transferred to the surface of the substrate to be transferred.
    • 提供一种制造半导体器件的方法。 该方法包括以下步骤:(1)将包含有机半导体材料的溶液涂覆在防水印模基板的拒水表面上; (2)将这样涂布的含有机半导体材料的溶液干燥在防水表面上,使有机半导体材料与防水表面接触,从而形成半导体层; (3)对形成在印模基板上的半导体层进行热处理; 和(4)将形成有热处理的有机半导体层的一侧的印模基板压在要转印的基板的表面上,使得有机半导体层被转印到待转印的基板的表面上。
    • 3. 发明授权
    • Method for manufacturing semiconductor device
    • 制造半导体器件的方法
    • US08017431B2
    • 2011-09-13
    • US11620527
    • 2007-01-05
    • Akhiro Nomoto
    • Akhiro Nomoto
    • H01L51/30
    • H01L51/0013H01L51/0014H01L51/0026H01L51/0036H01L51/0043H01L51/0097H01L51/0541H01L51/0545
    • A method for manufacturing a semiconductor device is provided. The method includes the steps of: (1) coating a solution containing an organic semiconductor material on a water-repellent surface of a water-repellent stamp substrate; (2) drying the thus coated organic semiconductor material-containing solution on the water-repellent surface to crystallize the organic semiconductor material in contact with the water-repellent surface, thereby forming a semiconductor layer; (3) thermally treating the semiconductor layer formed on the stamp substrate; and (4) pressing the stamp substrate at a side, in which the thermally treated organic semiconductor layer is formed, against a surface of a substrate to be transferred so that the organic semiconductor layer is transferred to the surface of the substrate to be transferred.
    • 提供一种制造半导体器件的方法。 该方法包括以下步骤:(1)将包含有机半导体材料的溶液涂覆在防水印模基板的拒水表面上; (2)将这样涂布的含有机半导体材料的溶液干燥在防水表面上,使有机半导体材料与防水表面接触,从而形成半导体层; (3)对形成在印模基板上的半导体层进行热处理; 和(4)将形成有热处理的有机半导体层的一侧的印模基板压在要转印的基板的表面上,使得有机半导体层被转印到待转印的基板的表面上。