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    • 7. 发明公开
    • 트렌지스터 제조방법
    • 制造晶体管的方法
    • KR1020140080589A
    • 2014-07-01
    • KR1020120144277
    • 2012-12-12
    • 한국전자통신연구원
    • 오힘찬황치선
    • H01L21/336H01L29/78
    • H01L29/66969H01L29/7869H01L29/78696
    • A transistor according to an embodiment of the present invention includes source/drain electrodes on a substrate, a semiconductor layer which is interposed between the source/drain electrodes on the substrate, a reducing prevention layer which is arranged on the semiconductor layer, and a gate electrode which is arranged in a region corresponding to the semiconductor layer. The semiconductor layer includes a first semiconductor oxide layer. The source/drain electrodes include the same element as a first oxide semiconductor layer. The source/drain electrodes include a second semiconductor oxide having a lower oxygen content ratio. The transistor has improved reliability and operates with high speed.
    • 根据本发明实施例的晶体管包括衬底上的源/漏电极,介于衬底上的源/漏电极之间的半导体层,布置在半导体层上的还原防止层,以及栅极 电极,其布置在与半导体层对应的区域中。 半导体层包括第一半导体氧化物层。 源极/漏极包括与第一氧化物半导体层相同的元件。 源极/漏极包括具有较低氧含量比的第二半导体氧化物。 晶体管具有改进的可靠性并以高速运行。
    • 8. 发明公开
    • 빛과 전압 스트레스에 강한 산화물 박막 트랜지스터 및 그의 제조 방법
    • 非常稳定的薄膜晶体管在偏置和照明应力下的制造方法
    • KR1020120127166A
    • 2012-11-21
    • KR1020110094568
    • 2011-09-20
    • 한국전자통신연구원
    • 오힘찬박상희황치선유민기
    • H01L29/786H01L21/336
    • H01L29/7869H01L29/66742H01L29/78606
    • PURPOSE: An oxide thin film transistor and a manufacturing method thereof are provided to improve reliability of a photovoltage by forming a diffusion preventing layer which prevents a hole and an ionized oxygen vacancy from moving in a low temperature of 50°C-200°C. CONSTITUTION: A gate electrode(20) is formed on a substrate(10). A gate insulating layer(30) is formed on the upper side of the substrate including the gate electrode. A source electrode(40a) and a drain electrode(40b) are formed on both sides of the gate insulating layer. An active layer(50) and a protective layer(60) are formed on the top of the substrate including a part of the drain electrode and the source electrode. The active layer comprises an oxide semiconductor and a diffusion preventing layer.
    • 目的:提供一种氧化物薄膜晶体管及其制造方法,以通过形成防止空穴和电离氧空位在50℃-200℃的低温下移动的扩散防止层来提高光电压的可靠性。 构成:在基板(10)上形成栅电极(20)。 在包括栅电极的基板的上侧形成栅极绝缘层(30)。 源极电极(40a)和漏电极(40b)形成在栅极绝缘层的两侧。 在包括漏电极和源电极的一部分的衬底的顶部上形成有源层(50)和保护层(60)。 有源层包括氧化物半导体和扩散防止层。