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    • 3. 发明公开
    • 히터의 온도조절방법
    • 调节加热温度的方法
    • KR1020140079342A
    • 2014-06-26
    • KR1020140018039
    • 2014-02-17
    • 주식회사 유진테크
    • 제성태양일광이재호김경훈김명인신양식
    • H01L21/205H01L21/683
    • According to one embodiment of the present invention, a method of adjusting the temperature of a h eater includes the steps of: providing a cooling ring around a heater provided at an upper portion thereof with a substrate, the cooling ring having a plurality of gas passages spaced apart from each other along a circumference of the heater; and determining a high-temperature region of the heater having a temperature higher than a preset temperature depending on the temperature distribution of the heater, and supplying a coolant only to a gas passage provided outside the high-temperature region among the gas passages, thereby adjusting the temperature distribution of the heater. In the adjusting step, a plurality of gas supply tubes are coupled to the gas passages, respectively, and the valves are installed on the gas supply tubes, respectively, so that the valves on the gas passages provided outside the high-temperature region is opened and the remaining valves are closed.
    • 根据本发明的一个实施例,一种调节食物的温度的方法包括以下步骤:在其上部设置有加热器的冷却环设置有基底,所述冷却环具有间隔开的多个气体通道 沿着加热器的圆周彼此分开; 并且根据加热器的温度分布来确定具有高于预设温度的温度的加热器的高温区域,并且仅将冷却剂仅供给到设置在气体通道中的高温区域外部的气体通道,由此调节 加热器的温度分布。 在调节步骤中,分别将多个气体供给管连接到气体通道,并且阀分别安装在气体供给管上,使得设置在高温区域外部的气体通道上的阀打开 其余阀门关闭。
    • 5. 发明授权
    • 기판처리장치
    • 基板处理设备
    • KR101387518B1
    • 2014-05-07
    • KR1020120094384
    • 2012-08-28
    • 주식회사 유진테크
    • 양일광송병규김경훈김용기신양식
    • H01L21/205
    • C23C16/455C23C16/4412C23C16/45519C23C16/45559C23C16/45591C23C16/481H01L21/67115
    • 본발명의일 실시예에의하면기판에대한공정이이루어지는기판처리장치에있어서상부가개방된형상을가지며, 일측에상기기판이출입하는통로가형성되는메인챔버; 상기메인챔버내부에설치되며, 상기기판이놓여지는서셉터; 상기메인챔버의개방된상부에설치되며, 상기서셉터의상부에위치하는상부설치공간과상기상부설치공간의외측에배치되는가스공급통로를가지는챔버덮개; 상기상부설치공간에설치되며, 상기기판을가열하는히팅블럭; 및상기가스공급통로와연결되어상기공정공간을향해공정가스를공급하는가스공급포트를포함한다.
    • 根据本发明的一个实施例,提供了一种基板处理设备,其中基板被处理,主腔室具有顶部开放形状并且具有基板进入和离开的通道, 安装在主腔室中并且衬底放置在其上的基座; 腔室盖,设置在所述主腔室的开口上部,所述腔室盖具有位于所述基座上方的上部安装空间和设置在所述上​​部安装空间外部的供气通道; 安装在上部安装空间中用于加热基板的加热块; 并且气体供应端口连接到气体供应通道并且向处理空间供应处理气体。
    • 6. 发明公开
    • 측방배기 방식 기판처리장치
    • 用于加工具有侧泵类型的装置的装置
    • KR1020130090101A
    • 2013-08-13
    • KR1020120011175
    • 2012-02-03
    • 주식회사 유진테크
    • 양일광송병규김경훈신양식
    • C23C16/00C23C16/455H01L21/205
    • C23C16/4412C23C16/45565C23C16/52
    • PURPOSE: A side ventilation type substrate processing apparatus is provided to secure uniformity of a thin film which is deposited on a substrate by evenly ventilating the substrate. CONSTITUTION: A side ventilation type substrate processing apparatus comprises a chamber body (10), a chamber lid (20), a shower head (40), and a susceptor (50). The chamber body has an opened upper part and an internal space in which a process for a substrate is performed. The chamber lid closes the upper part of the chamber body. The shower head supplies a process gas to the internal space. The susceptor can be switched to a loading position on which the substrate is loaded or to a process position on which the process is performed.
    • 目的:提供侧通风型基板处理装置,以通过使基板均匀通风来确保沉积在基板上的薄膜的均匀性。 构成:侧通风型基板处理装置包括室主体(10),室盖(20),淋浴头(40)和基座(50)。 室主体具有打开的上部和内部空间,在该内部空间中执行基板的处理。 室盖关闭室体的上部。 淋浴头为内部空间提供加工气体。 可以将基座切换到装载基板的装载位置或切换到进行处理的处理位置。
    • 7. 发明授权
    • 기판처리장치 및 기판처리방법
    • 基板处理装置及基板处理方法
    • KR100963287B1
    • 2010-06-11
    • KR1020080016142
    • 2008-02-22
    • 주식회사 유진테크
    • 양일광
    • H01L21/02
    • H01J37/32357C23C16/4405C23C16/452H01J37/3244
    • 기판처리장치는 기판에 대한 공정공간을 제공하는 챔버; 상기 공정공간을 향하여 제1 소스가스를 공급하는 제1 공급부재; 상기 공정공간에 전계를 형성하여 상기 제1 소스가스로부터 라디칼을 생성하는 플라즈마 소스; 그리고 상기 제1 공급부재의 하부에 위치하며, 상기 기판을 향하여 제2 소스가스를 공급하는 제2 공급부재를 포함한다. 상기 장치는 상기 챔버 내에 설치된 지지부재를 더 포함하며, 상기 제2 공급부재는 상기 지지부재 상에 놓여진 상기 기판의 중심에 대응되도록 하단이 배치되어 상기 기판의 중심을 향하여 상기 제2 소스가스를 공급하는 공급노즐을 구비할 수 있다.
      제1 공급부재, 제2 공급부재, 분사판, 확산판
    • 基板处理装置包括用于为基板提供处理空间的腔室; 第一供应部件,用于向处理空间供应第一源气体; 等离子体源,用于在处理空间中产生电场以从第一源气体产生自由基; 以及第二供应构件,其定位在第一供应构件的下方并向基板供应第二源气体。 该装置还包括:安装在所述腔中的支撑部件,所述第二供应部件是一个下端,以对应于设置在放置在支撑件上的基板的中心,并朝向基板的中心供应所述第二源气体 供应喷嘴可以被提供。
    • 8. 发明公开
    • 플라즈마 처리장치 및 플라즈마 안테나
    • 等离子体加工装置和等离子体天线
    • KR1020100049208A
    • 2010-05-12
    • KR1020080108283
    • 2008-11-03
    • 주식회사 유진테크
    • 우상호양일광송병규
    • H05H1/34H05H1/30H05H1/24
    • H01J37/3211H01J37/321H05H1/46
    • PURPOSE: The process uniformity about the processed article which uses the plasma by being created the plasma having the density which the plasma processing apparatus and plasma antenna uniform inside the chamber is secured. CONSTITUTION: A plasma antenna comprises an antenna(100) and a second antenna(200). Antenna comprises a first input antenna(120), a first output antenna(140), and a first helix antenna(160). The first helix antenna accomplishes helix according to the clockwise direction from the lower part of the production chamber towards the top. The first input antenna is connected to the bottom of the first helix antenna. The first output antenna is connected to the upper end of the first helix antenna.
    • 目的:通过产生具有等离子体处理装置和等离子体天线在室内均匀的密度的等离子体来使用等离子体的加工制品的工艺均匀性得到确保。 构成:等离子体天线包括天线(100)和第二天线(200)。 天线包括第一输入天线(120),第一输出天线(140)和第一螺旋天线(160)。 第一螺旋天线根据从制造室的下部朝向顶部的顺时针方向实现螺旋。 第一输入天线连接到第一螺旋天线的底部。 第一输出天线连接到第一螺旋天线的上端。
    • 10. 发明公开
    • 기판처리장치 및 기판처리방법
    • 装置和处理基板的方法
    • KR1020090102213A
    • 2009-09-30
    • KR1020080027506
    • 2008-03-25
    • 주식회사 유진테크
    • 양일광
    • H01L21/205H01L21/3065
    • C23C16/45591C23C16/507H01J37/321H01J37/3244H01J37/32449
    • PURPOSE: A substrate processing device and a substrate processing method are provided to improve uniformity of a process in the whole surface of a substrate. CONSTITUTION: A substrate processing device includes a chamber(10), a gas supply unit(40), a coil(16), and a control ring(50). A chamber provides an internal space for processing the substrate. The gas supply unit supplies the source gas to the internal space. The coil forms the electric field in the inner space and generates the plasma from the source gas. The control ring is arranged on the path of the plasma facing a support unit. The control ring controls the flow of the plasma. The chamber has a process chamber and a generating chamber.
    • 目的:提供基板处理装置和基板处理方法,以改善基板整个表面中的工艺的均匀性。 构成:基板处理装置包括室(10),气体供给单元(40),线圈(16)和控制环(50)。 室提供用于处理衬底的内部空间。 气体供应单元将源气体供应到内部空间。 线圈在内部空间中形成电场,并从源气体产生等离子体。 控制环布置在面向支撑单元的等离子体的路径上。 控制环控制等离子体的流动。 该室具有处理室和发生室。