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    • 4. 发明公开
    • 화학 증착 필름의 침착 속도를 강화시키는 방법
    • 包含有机化学物质的化学气相沉积膜沉积速率的方法用于集成电路中的介质介质
    • KR1020040088362A
    • 2004-10-16
    • KR1020040022134
    • 2004-03-31
    • 에어 프로덕츠 앤드 케미칼스, 인코오포레이티드
    • 브르티스레이먼드니콜라스루카스아론스콧오넬마크레오나드빈센트진루이스빗너마크다니엘카웍키쥬니어유진조지프피터슨브라이언케이쓰
    • H01B3/46
    • H01L21/02118C23C16/30C23C16/56H01L21/02126H01L21/02203H01L21/02216H01L21/02274H01L21/02318H01L21/3122H01L21/31633H01L21/31695
    • PURPOSE: Provided is a method for enhancing the deposition rate of a film comprising organic chemical species and optionally organosilicon compounds, which has low dielectric constant and sufficient mechanical properties suitable for interlayer dielectric in integrated circuits. CONSTITUTION: The chemical vapor deposition method for forming an organosilica porous film represented by the formula of SivOwCxHyFz (wherein v+w+x+y+z = 100%, v is 10-35 atom%, w is 10-65 atom%, x is 5-30 atom%, y is 10-50 atom%, and z is 0-15 atom%). The method comprises the steps of: introducing chemical reagents comprising at least one organosilicon precursor, an organic precursor and a rate enhancer into a reaction chamber, wherein the chemical reagents are present in a gas state; applying energy to the chemical reagents so as to react the chemical reagents on at least a part of a substrate, thereby depositing a multiphasic film, wherein the multiphasic film includes at least one structure-forming phase and at least one pore-forming phase; and exposing the multiphasic film to an energy source for a time sufficient to remove the pore-forming phase substantially and to provide a porous organosilica film having a plurality of pores and a dielectric constant of 2.6 or less.
    • 目的:提供一种用于增强包含有机化学物质和任选的有机硅化合物的膜的沉积速率的方法,其具有低介电常数和足够的机械性能,适用于集成电路中的层间电介质。 构成:用于形成由式SivOwCxHyFz(其中v + w + x + y + z = 100%,v为10-35原子%,w为10-65原子%)表示的有机硅多孔膜的化学气相沉积方法, x为5-30原子%,y为10〜50原子%,z为0〜15原子%)。 该方法包括以下步骤:将包含至少一种有机硅前体,有机前体和速率增强剂的化学试剂引入反应室,其中化学试剂以气体状态存在; 向所述化学试剂施加能量以使所述化学试剂在至少一部分基底上反应,从而沉积多相膜,其中所述多相膜包括至少一个结构形成相和至少一个成孔相; 并将多相膜暴露于能量源足够的时间基本上去除成孔相,并提供具有多个孔和介电常数为2.6或更小的多孔有机硅膜。