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    • 10. 发明公开
    • 핸들러 및 부품 검사 장치
    • 处理器和零件检查装置
    • KR1020130027432A
    • 2013-03-15
    • KR1020120098038
    • 2012-09-05
    • 세이코 엡슨 가부시키가이샤
    • 후지모리히로아끼시모지마도시오끼하세가와노부오
    • G01R31/26H01L21/66H01L21/67
    • B65G49/00G01R31/2893
    • PURPOSE: A handler and a part inspection apparatus are provided to improve movement speed of a return unit during return of an electronic part by reducing size and weight of a return unit. CONSTITUTION: A return guide(31) is forward and backward movably connected with a second elevation mechanism(51). A connection unit of a plate shape is extended along a mount surface and is formed in the lower part of the second elevation mechanism. Two first elevation mechanisms(52,53) are commonly connected to the mount surface side of the connection unit. A connection unit of the second elevation mechanism embeds a first elevation motors(52M,53M) called two driving sources of the first elevation mechanism. The lower part of the first elevation mechanism respective to a base support(11) elevates or descends since the first elevation motor forwardly rotates or reversely rotates.
    • 目的:提供处理器和零件检查装置,以通过减小返回单元的尺寸和重量来改善电子部件返回期间返回单元的移动速度。 构成:返回引导件(31)与第二升降机构(51)向前和向后可移动地连接。 板状的连接单元沿着安装面延伸并形成在第二升降机构的下部。 两个第一升降机构(52,53)通常连接到连接单元的安装表面侧。 第二升降机构的连接单元嵌入称为第一升程机构的两个驱动源的第一升程马达(52M,53M)。 第一升降机构的下部相对于基座支撑件(11)升高或降低,因为第一升降马达向前或向后旋转。