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    • 5. 发明授权
    • 플라즈마 처리 장치
    • 等离子处理设备
    • KR101076674B1
    • 2011-10-26
    • KR1020097018413
    • 2008-03-26
    • 미쯔이 죠센 가부시키가이샤
    • 모리야스나리타치바나히로유키미야타케나오마사타키자와카즈키
    • H01L21/205C23C16/455H01L21/3065H05H1/46
    • H05H1/46C23C16/402C23C16/45519C23C16/505H01J37/3244H01J37/32495
    • 플라즈마처리장치는, 처리대상기판이배치되는기판스테이지와, 안테나어레이를이용하여플라즈마를생성하는플라즈마생성부와, 상기안테나어레이의상방(上方)에설치된복수의가스방사구를가지는가스방사판을구비하는가스방사부와, 상기가스방사판의복수의가스방사구의일부분으로부터상기기판스테이지의표면으로향하여방사하여상기안테나소자의표면을통하도록, 제1 원료가스를공급하는제1 가스공급부와, 상기가스방사판의복수의가스방사구의다른부분으로부터상기기판스테이지의표면으로향하여방사하여상기안테나소자의간극(間隙)을통하도록, 제2 원료가스를공급하는제2 가스공급부를가진다. 제1 원료가스는, 안테나소자에노출된경우, 부착물이생기지않거나, 또는제2 원료가스보다도부착량이적다. 이것에의하여, 성막(成膜) 속도를향상시키는것과함께, 파티클의발생을억제할수 있다.
    • 该等离子体处理装置具备:载置被处理基板的基板载置台,使用该天线阵列来生成等离子体的等离子体生成部,以及在该天线阵列的上方具有多个气体放出口的气体放射板 第一气体供应部分,用于通过从所述气体辐射板的多个气体辐射工具的一部分朝向所述基板台的表面辐射来通过所述天线元件的表面供应第一源气体; 以及第二气体供给部,其供给第二原料气体,以从气体辐射板的多个气体喷出口的另一部分朝向基板载台的表面照射,以通过天线元件的间隙。 当第一原料气体暴露于天线元件时,不形成沉积物,或沉积量小于第二原料气体的沉积量。 因此,可以提高沉积速度并且可以抑制颗粒的发生。
    • 6. 发明公开
    • 플라즈마 처리 장치
    • 等离子体加工设备
    • KR1020090117777A
    • 2009-11-12
    • KR1020097018413
    • 2008-03-26
    • 미쯔이 죠센 가부시키가이샤
    • 모리야스나리타치바나히로유키미야타케나오마사타키자와카즈키
    • H01L21/205C23C16/455H01L21/3065H05H1/46
    • H05H1/46C23C16/402C23C16/45519C23C16/505H01J37/3244H01J37/32495
    • A plasma processing apparatus is provided with a substrate stage whereupon a substrate to be processed is arranged; a plasma generating section for generating plasma by using an antenna array; a gas radiating section having a gas radiating plate which is arranged above the antenna array and has a plurality of gas radiating ports; a first gas supply section, which supplies the first material gas by radiating the gas from some of the gas radiating ports on the gas radiating plate toward the surface of the substrate stage so that the gas passes over the surface of the antenna element; and a second gas supply section, which supplies a second material gas by radiating the gas from other gas radiating ports among the gas radiating ports on the gas radiating plate toward the surface of the substrate stage so that the gas passes through a space between the antenna elements. When the first material gas is exposed to the antenna element, the first material gas does not generate an attaching material or generates a smaller quantity of the attaching material compared with a case where a second material gas is used. Thus, film forming speed can be improved and generation of particles can be suppressed.
    • 等离子体处理装置设置有基板台,其中布置有待处理的基板; 用于通过使用天线阵列产生等离子体的等离子体产生部分; 气体辐射部分,具有布置在天线阵列上方并具有多个气体辐射口的气体辐射板; 第一气体供给部,其通过从气体辐射板上的一些气体排出口朝向基板台的表面喷射气体来供给第一原料气体,使得气体越过天线元件的表面; 以及第二气体供给部,其通过从气体辐射板的气体喷出口中的其它气体喷出口向基板台的表面喷射气体来供给第二原料气体,使得气体通过天线 元素。 当第一材料气体暴露于天线元件时,与使用第二材料气体的情况相比,第一材料气体不产生附着材料或产生较少量的附着材料。 因此,可以提高成膜速度,并且可以抑制颗粒的产生。