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    • 4. 发明公开
    • 연마 패드, 정반 홀 커버 및 연마장치 및 연마방법 및 반도체 디바이스의 제조방법
    • 抛光垫,抛光板孔盖,抛光装置,抛光方法和制造半导体器件的方法
    • KR1020050059123A
    • 2005-06-17
    • KR1020057003272
    • 2003-08-26
    • 도레이 카부시키가이샤
    • 시로,구니야스고바야시,쯔또무하시사까,가즈히꼬
    • H01L21/304
    • B24B37/205
    • A windowed polishing pad used for forming a flat surface on a glass, a semiconductor, a dielectric/metal composite, an integrated circuit and so on, wherein less scratches are given to the surface of a substrate and the polishing condition can be optically measured well during the polishing. The polishing pad has a polishing layer and a transparent window member for the optical measurement of the polishing condition, which is provided in an opening formed in a part of the polishing layer. The indentation of the transparent window member when a certain load is applied to almost entire upper surface of the window member is larger than the indentation of the polishing layer when the same load is applied to a part of the upper surface of the polishing layer having an area equal to that of the window member.
    • 用于在玻璃上形成平坦表面的窗口抛光垫,半导体,电介质/金属复合材料,集成电路等,其中对基材表面施加较少的刮痕,并且可以光学测量抛光条件 在抛光期间。 抛光垫具有抛光层和用于光学测量抛光条件的透明窗构件,其设置在形成在抛光层的一部分中的开口中。 当向窗构件的几乎整个上表面施加一定的负荷时,透明窗构件的压痕大于抛光层的凹陷,当对该抛光层的上表面的一部分施加相同的载荷时, 面积等于窗口构件的面积。