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    • 62. 发明公开
    • 노광장치, 노광방법, 및 디바이스의 제조방법
    • 曝光装置,曝光方法和装置制造方法
    • KR1020090026082A
    • 2009-03-11
    • KR1020080087508
    • 2008-09-05
    • 캐논 가부시끼가이샤
    • 타케나카츠토무
    • H01L21/027
    • G03B27/54G03F9/7026G03F9/7065G03F9/7088H01L21/682
    • An exposure apparatus, and a manufacturing method of a device and an exposure method are provided to prevent the measurement error from being generated by the chromatic aberration during TTL(Through-The-Lens) process. An exposure apparatus comprises an illumination optical system(IL) for illuminating the disk with the exposure light from the light source of exposure(LS1); a projection optical system(PO) projecting the pattern of disk on the top of the substrate; a measuring unit for measuring the relative position between the substrate and the disk through the projection optical system. An exposure apparatus exposes the substrate to the exposure light of the wavelength of plural wavelengths or the broadband. The measuring unit converts the wavelength of the exposure light into the wavelength of the specific or the narrow band.
    • 提供曝光装置,以及装置的制造方法和曝光方法,以防止TTL(透镜)处理期间的色差产生测量误差。 曝光装置包括用于利用来自曝光光源(LS1)的曝光光来照亮盘的照明光学系统(IL)。 投影光学系统(PO)将盘的图案投影在基板的顶部上; 测量单元,用于通过投影光学系统测量基板和盘之间的相对位置。 曝光装置将衬底暴露于多个波长或宽带的波长的曝光光。 测量单元将曝光光的波长转换成特定或窄带的波长。
    • 63. 发明公开
    • 노광장치 및 디바이스 제조방법
    • 曝光装置和装置制造方法
    • KR1020080114598A
    • 2008-12-31
    • KR1020080060555
    • 2008-06-26
    • 캐논 가부시끼가이샤
    • 안도미와코
    • H01L21/027
    • G03B27/54G03F7/70091G03F9/7003G03F9/7069
    • An exposure apparatus and manufacturing method of device are provided to prevent excessive degradation of measuring accuracy by including a projection optical system. An exposure apparatus includes an illumination optical system(IL), a round stage(RS), a projection optical system(PO), a wafer stage(WS), an measuring system(M), and a controller(CNT). The illumination optical system changes a lighting condition. The round stage maintains the round. The wafer stage maintains the wafer. A pattern of the round stage is projected on a target substrate through the projection optical system by illuminating a corresponding round stage using the illumination optical system. The measuring system performs an exposure control measurement using a first mark arranged on the round stage and a second mark arranged on the wafer stage. The controller sets up an illumination condition different from a predetermined illumination condition.
    • 提供了一种曝光装置和装置的制造方法,以通过包括投影光学系统来防止测量精度的过度劣化。 曝光装置包括照明光学系统(IL),圆台(RS),投影光学系统(PO),晶片台(WS),测量系统(M)和控制器(CNT)。 照明光学系统改变照明条件。 圆舞台保持轮回。 晶片台保持晶片。 通过使用照明光学系统照射相应的圆形台阶,圆台的图案通过投影光学系统投射在目标基板上。 测量系统使用布置在圆台上的第一标记和布置在晶片台上的第二标记来执行曝光控制测量。 控制器建立与预定照明条件不同的照明条件。
    • 64. 发明公开
    • 노광장치 및 디바이스 제조방법
    • 曝光装置和装置制造方法
    • KR1020080094593A
    • 2008-10-23
    • KR1020080035851
    • 2008-04-18
    • 캐논 가부시끼가이샤
    • 아라이타다시하세가와야스오
    • H01L21/027
    • G03B27/54G03F7/70941
    • An exposure apparatus and a device manufacturing method are provided to prevent deterioration or variation of imaging performance by varying an aperture shape of a diaphragm according to exposition conditions. An exposure apparatus includes a light system(120), a projection optical system(106), and a diaphragm(108). The light system lights a light area of a disc(111). The projection optical system projects a pattern of the disc on a substrate(109). The diaphragm blocks flare components among flare lights from the projection optical system toward the substrate and passes the rest components of the flare lights. A shape of an aperture of the diaphragm is different from that of the light area. The aperture shape of the diaphragm is varied based on a distance from the aperture in a second direction across a first direction in parallel with a scanning direction of the substrate.
    • 提供曝光装置和装置制造方法,以通过根据曝光条件改变隔膜的孔径形状来防止成像性能的劣化或变化。 曝光装置包括光系统(120),投影光学系统(106)和光圈(108)。 光系统点亮盘(111)的光区域。 投影光学系统将盘的图案投影在基板(109)上。 隔膜块将投影光学系统的耀斑光中的组分向基板照射,并通过火炬灯的其余部分。 隔膜的孔径形状与光区域不同。 隔膜的孔径形状基于与基板的扫描方向平行的第一方向的第二方向上的孔的距离而变化。
    • 65. 发明公开
    • 광원 장치
    • 光源设备
    • KR1020080070494A
    • 2008-07-30
    • KR1020070092904
    • 2007-09-13
    • 하마마츠 포토닉스 가부시키가이샤
    • 마츠이료타로
    • H01J61/52H01J61/84G03B27/54G03F7/20
    • G03B27/54G03B21/16G03B21/20G03B21/2026G03F7/70016H01J61/52
    • A light source is provided to prevent a reflective surface from being blurred by spraying inertia gas on the reflective surface using a gas spray structure. A light source device includes a light source, a reflective mirror(4), and a gas spray structure(5). The reflective mirror reflects the light radiated from the light source on a reflective surface and emits the light from an exit opening. The gas spray structure includes a through-hole, where the light from the reflective mirror penetrates. The gas spray structure sprays gas on the reflective surface. The light source device includes a case(2), where the light source, the reflective mirror, and the gas spray structure are contained. The case circulates the air from outside. The gas spray structure includes a supply unit, a spray unit, and a distributing path.
    • 提供光源以通过使用气体喷射结构在反射表面上喷射惯性气体来防止反射表面模糊。 光源装置包括光源,反射镜(4)和气体喷射结构(5)。 反射镜将从光源辐射的光反射在反射表面上并从出口开口发射光。 气体喷射结构包括通孔,其中来自反射镜的光穿透。 气体喷射结构在反射面上喷射气体。 光源装置包括壳体(2),其中包含光源,反射镜和气体喷射结构。 这种情况从外面传播空气。 气体喷射结构包括供给单元,喷射单元和分配路径。
    • 67. 发明公开
    • 노광 장치 및 디바이스 제조 방법
    • 曝光装置和装置制造方法
    • KR1020080056094A
    • 2008-06-20
    • KR1020070130568
    • 2007-12-14
    • 캐논 가부시끼가이샤
    • 우에무라타카노리
    • H01L21/027
    • G03B27/54G03F7/70091G03F7/70333
    • An exposure apparatus and a method for manufacturing a device are provided to improve the quality of a pattern image even though a depth of focus is increased by exposing a substrate under a condition that a normal line of the substrate is tilted with respect to an optical axis. An illumination optical system(20) illuminates a reticle(30) arranged on a target illumination surface with light from a light source(10). A projection optical system(40) projects a pattern of the reticle onto a substrate. A stage(60) drives the substrate. The illumination optical system includes an optical distribution forming unit(200) for forming an intensity distribution of a trapezoid shape over the target illumination surface along a scanning direction of the reticle to illuminate each point on the target illumination surface. The stage tilts a normal line of the substrate with respect to an optical axis of the projection optical system to expose the substrate with the intensity distribution and an optical angle distribution formed by the optical distribution forming unit.
    • 提供一种曝光装置和装置的制造方法,以便即使在基板的法线相对于光轴倾斜的条件下曝光基板来增加图案图像的质量 。 照明光学系统(20)利用来自光源(10)的光照射布置在目标照明表面上的掩模版(30)。 投影光学系统(40)将掩模版的图案投影到基板上。 舞台(60)驱动衬底。 照明光学系统包括:光分布形成单元,用于沿着标线板的扫描方向在目标照射面上形成梯形的强度分布,照射目标照明面上的各点。 该阶段相对于投影光学系统的光轴倾斜基板的法线,以便以光分布形成单元形成的强度分布和光学角度分布露出基板。