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    • 55. 发明公开
    • 네가티브형 레지스트 조성물 및 이것을 이용한 패턴 형성 방법
    • 使用它的负极性组合物和图案处理方法
    • KR1020100129223A
    • 2010-12-08
    • KR1020100050149
    • 2010-05-28
    • 신에쓰 가가꾸 고교 가부시끼가이샤
    • 다나까,아끼노부마스나가,게이이찌도몬,다이스께와따나베,사또시
    • G03F7/004H01L21/027
    • G03F7/0382G03F7/004G03F7/0045H01L21/027H01L21/0271
    • PURPOSE: A negative resist composition is provided to adopt chemically amplified resists as a photoresist, to exhibit excellent sensitivities to such high energy radiations and to provide higher resolutions. CONSTITUTION: A negative resist composition comprises (A) a base polymer which is soluble in alkali and which is insolubilized in alkali by an action of an acid; and/or a combination of a crosslinking agent and a base polymer which is soluble in alkali and which is reacted with the crosslinking agent by an action of an acid to thereby be insolubilized in alkali, (B) an acid generator, and (C) a nitrogen-containing compound as a basic component. The polymer to be used as the base polymer is: a polymer, which is obtained by polymerizing two or more kinds of monomers represented by the following general formula(1), or which is obtained by polymerizing a monomer mixture containing one or more kinds of monomers represented by the general formula(1) and one or more kinds of styrene monomers represented by the following general formula(2); or a polymer obtained by subjecting the functional groups of the polymerizedly obtained polymer to a further chemical conversion. The repeating units derived from the monomers represented by the general formula(1) are included in the obtained polymer at a sum ratio of 50 mole% or more relative to a total amount of all repeating units constituting the obtained polymer.
    • 目的:提供负抗蚀剂组合物以采用化学放大抗蚀剂作为光致抗蚀剂,以对这种高能量辐射表现出优异的敏感性并提供更高的分辨率。 构成:负性抗蚀剂组合物包含(A)可溶于碱的碱性聚合物,其通过酸的作用在碱中不溶解; 和/或交联剂和碱性聚合物的组合,其可溶于碱,并通过酸的作用与交联剂反应,从而不溶于碱,(B)酸产生剂,和(C) 作为基本成分的含氮化合物。 用作基础聚合物的聚合物是:通过聚合由以下通式(1)表示的两种或更多种单体获得的聚合物,或通过将含有一种或多种 由通式(1)表示的单体和由以下通式(2)表示的一种或多种苯乙烯单体; 或通过使聚合获得的聚合物的官能团进一步进行化学转化而获得的聚合物。 衍生自由通式(1)表示的单体的重复单元相对于构成所得聚合物的全部重复单元的总量,以50摩尔%以上的总和比包含在所得聚合物中。