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    • 22. 发明公开
    • 단락에 대한 방사원 보호 방법
    • 用于保护辐射源的方法,用于产生针对短路的EUV辐射和/或软X射线
    • KR1020080019708A
    • 2008-03-04
    • KR1020087000998
    • 2006-06-06
    • 코닌클리케 필립스 엔.브이.
    • 바우드레반게,도미니크마르셀존커스,예로엔
    • G21H5/00G21G4/00G03F7/20
    • H05G2/003H05G2/005
    • The present invention relates to a method of protecting a radiation source producing extreme ultraviolet radiation (EUV) and/or soft X-rays against short circuits. The method applies to radiation sources producing said EUV-radiation and/or soft X-rays by means of an electrically operated discharge, which is ignited in a vapor between at least two electrodes (1, 2) in a discharge space, wherein said vapor is produced from a metal melt (6), which is applied to a surface in said discharge space and at least partially evaporated by an energy beam (9). Such a radiation source has one or several small gaps (17) between said electrodes (1, 2) and/or between components (4, 5) electrically connected to said electrodes (1, 2). These gaps (17) can cause short circuits when evaporated metal condenses there. In the present method during operation of the radiation source at least one surface bordering said gaps (17) and/or one or several protective elements (16, 18) covering said gaps (17) or arranged inside said gaps (17) are heated to a temperature at which the vapor pressure of said metal is high enough to evaporate metal material condensed on said surface or protective elements. With the present method the lifetime of the radiation source is extended. ® KIPO & WIPO 2008
    • 本发明涉及一种保护产生极紫外辐射(EUV)和/或软X射线的辐射源免于短路的方法。 该方法适用于通过在放电空间中的至少两个电极(1,2)之间的蒸气中点燃的电操作放电产生所述EUV辐射和/或软X射线的辐射源,其中所述蒸气 由金属熔体(6)制成,其被施加到所述放电空间中的表面并且被能量束(9)至少部分蒸发。 这种辐射源在所述电极(1,2)之间和/或电连接到所述电极(1,2)的部件(4,5)之间具有一个或几个小间隙(17)。 当蒸发的金属在那里冷凝时,这些间隙(17)可能导致短路。 在本方法中,在辐射源的操作期间,覆盖所述间隙(17)和/或覆盖所述间隙(17)或布置在所述间隙(17)内的一个或多个保护元件(16,18)的至少一个表面被加热到 所述金属的蒸汽压高到足以蒸发在所述表面上凝结的金属材料或保护元件的温度。 利用本方法,延长了辐射源的寿命。 ®KIPO&WIPO 2008
    • 23. 发明公开
    • 극단 자외광 광원 장치 및 극단 자외광 발생 방법
    • 极光紫外线光源装置和超极紫外光发生方法
    • KR1020080011048A
    • 2008-01-31
    • KR1020070056007
    • 2007-06-08
    • 우시오덴키 가부시키가이샤
    • 시라이다카히로벳소가즈노리사토히로토데라모토유스케
    • G21K5/00
    • H05G2/003H05G2/005
    • An EUV(Extreme Ultra Violet) light source apparatus and an extreme ultra violet light generating method are provided to suppress the movement of debris into an EUV condenser while supplying plasma raw material to a discharge region. An EUV light source apparatus includes a case, a raw material supplying device(2), an energy beam irradiating device, a pair of discharge electrodes(1a,1b), a pulse power supplying device, a light collecting optical device, and an EUV light extracting unit. The raw material supplying device emits the EUV light inside the case and supplies liquid or solid raw material(2a). The energy beam irradiating device irradiates the energy beam to the raw material and vaporizes the raw material. The pair of discharge electrodes generate plasma at a high temperature and are spaced apart from each other at a predetermined distance. The pulse power supplying device supplies a pulse power to the discharge electrodes. The light collecting device collects the EUV light emitted from the plasma at a high temperature. The EUV light extracting unit extracts the collected EUV light.
    • 提供了一种EUV(Extreme Ultra Violet)光源装置和极紫外光发生方法,用于在向等离子体原料供给放电区域时抑制碎片进入EUV冷凝器的运动。 EUV光源装置包括壳体,原料供给装置(2),能量束照射装置,一对放电电极(1a,1b),脉冲供电装置,聚光光学装置以及EUV 光提取单元。 原料供给装置在壳体内发射EUV光,供给液体或固体原料(2a)。 能量束照射装置将能量束照射到原料并蒸发原料。 一对放电电极在高温下产生等离子体并且以预定距离彼此间隔开。 脉冲供电装置向放电电极供给脉冲电力。 光收集装置在高温下收集从等离子体发射的EUV光。 EUV光提取单元提取收集的EUV光。
    • 24. 发明公开
    • EUV광원
    • EUV光源
    • KR1020070003996A
    • 2007-01-05
    • KR1020067020324
    • 2005-02-24
    • 사이머 엘엘씨
    • 파틀로윌리암엔.보워링노베르트에르.어쇼브알렉산더아이.포멘코브이고르브이.올리버아이.로저비아텔라존자크로버트엔.
    • H01J35/20G03F9/00G03F7/20H01J65/04
    • G03F7/70033B82Y10/00G03F7/70175G03F7/70916G21K1/062G21K2201/061G21K2201/065G21K2201/067H05G2/003H05G2/005H05G2/006H05G2/008
    • An apparatus and method for EUV light production is disclosed which may comprise a laser produced plasma (" LPP") extreme ultraviolet ("EUV") light source control system comprising a target delivery system adapted to deliver moving plasma initiation targets and an EUV light collection optic having a focus defining a desired plasma initiation site, comprising: a target tracking and feedback system comprising: at least one imaging device providing as an output an image of a target stream track, wherein the target stream track results from the imaging speed of the camera being too slow to image individual plasma formation targets forming the target stream imaged as the target stream track; a stream track error detector detecting an error in the position of the target stream track in at least one axis generally perpendicular to the target stream track from a desired stream track intersecting the desired plasma initiation site. At least one target crossing detector may be aimed at the target track and detecting the passage of a plasma formation target through a selected point in the target track. A drive laser triggering mechanism utilizing an output of the target crossing detector to determine the timing of a drive laser trigger in order for a drive laser output pulse to intersect the plasma initiation target at a selected plasma initiation site along the target track at generally its closest approach to the desired plasma initiation site. A plasma initiation detector may be aimed at the target track and detecting the location along the target track of a plasma initiation site for a respective target. An intermediate focus illuminator may illuminate an aperture formed at the intermediate focus to image the aperture in the at least one imaging device. The at least one imaging device may be at least two imaging devices each providing an error signal related to the separation of the target track from the vertical centerline axis of the image of the intermediate focus based upon an analysis of the image in the respective one of the at least two imaging devices. A target delivery feedback and control system may comprise a target delivery unit; a target delivery displacement control mechanism displacing the target delivery mechanism at least in an axis corresponding to a first displacement error signal derived from the analysis of the image in the first imaging device and at least in an axis corresponding to a second displacement error signal derived from the analysis of the image in the second imaging device. ® KIPO & WIPO 2007
    • 公开了一种用于EUV光产生的装置和方法,其可以包括激光产生的等离子体(“LPP”)极紫外(“EUV”)光源控制系统,其包括适于递送移动等离子体引发靶的目标传送系统和EUV光收集 光学元件具有限定期望的等离子体起始位置的焦点,包括:目标跟踪和反馈系统,包括:至少一个成像装置,其提供目标流轨迹的图像作为输出,其中,所述目标流轨迹来自所述目标流轨迹的成像速度 摄像机太慢,不能成像形成被作为目标流轨迹成像的目标流的各个等离子体形成目标; 流轨迹误差检测器,从与期望的等离子体起始位置相交的期望的流轨道检测在大致垂直于目标流轨迹的至少一个轴上的目标流轨迹位置的误差。 至少一个目标交叉检测器可以瞄准目标轨道并且检测等离子体形成目标通过目标轨道中的选定点的通过。 驱动激光触发机构利用目标交叉检测器的输出来确定驱动激光触发的定时,以便驱动激光输出脉冲在等离子体引发目标处沿着目标轨道在一般最接近的等离子体起始位置处相交 接近所需的等离子体引发位点。 等离子体起始检测器可以瞄准目标轨道并且检测针对相应目标的等离子体起始位置沿着目标轨迹的位置。 中间焦点照明器可以照亮形成在中间焦点处的孔,以对至少一个成像装置中的孔进行成像。 所述至少一个成像装置可以是至少两个成像装置,每个成像装置基于对所述中间焦点的图像的图像的分析,提供与所述目标轨道与所述中间焦点的图像的垂直中心线轴线分离相关的误差信号 所述至少两个成像装置。 目标传送反馈和控制系统可以包括目标传送单元; 目标传送位移控制机构至少在对应于从第一成像装置中的图像的分析导出的第一位移误差信号的轴上移动目标传送机构,并且至少在与由第二位移误差信号 对第二成像装置中的图像进行分析。 ®KIPO&WIPO 2007