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1. 发明专利

JP2003315482A Ventilation facility at top part of reactor pressure vessel 有权
标题翻译：反应堆压力容器顶部的通风设施
公开(公告)号：JP2003315482A
公开(公告)日：2003-11-06
申请号：JP2002118377
申请日：2002-04-19
申请人： Toshiba Corp , 株式会社東芝
发明人： YAMAMOTO YUJI , KURODA MICHITOMO , SHIOIRI AKIO
IPC分类号： G21C13/00 , G21C15/18
CPC分类号： Y02E30/40
摘要： PROBLEM TO BE SOLVED: To provide ventilation facilities at the top part of a reactor pressure vessel capable of efficiently and reliably preventing non-condensable gases from being accumulated in the vicinity of the top part of the reactor pressure vessel and performing highly reliable and stable operation.
SOLUTION: The ventilation facilities 20 at the top part of the reactor pressure vessel (RPV) is provided with both an RPV head spray system 31 for supplying cooling water for an RPV head spray nozzle 36 at the upper part of the RPV 22 and a RPV ventilation system 30 for guiding non-condensable gases which occurs during operation of a reactor to a main steam pipe 37. The RPV head spray system 31 is provided with a branched ventilation system 32 branched from a check valve 39, provided on RPV head spray piping 38, on the side of the RPV 22. The branched ventilation system 32 is constituted in such a way as to guide the non-condensable gases which occur in the RPV 22 to the side of the main steam pipe 27 with the RPV ventilation system 30 during normal operation of the reactor.
COPYRIGHT: (C)2004,JPO
摘要翻译：要解决的问题：在反应堆压力容器的顶部设置通风设备，能够有效且可靠地防止不可冷凝气体积聚在反应堆压力容器的顶部附近并且执行高可靠性稳定运行。解决方案：反应堆压力容器（RPV）顶部的通风设备20设有RPV喷头系统31，用于在RPV 22的上部为RPV喷头喷嘴36供应冷却水以及RPV通风系统30，用于将在反应器操作期间发生的不可冷凝气体引导到主蒸汽管道37.RPV喷头系统31设置有分支式通气系统32，其从设置在RPV上的止回阀39分支头部喷射管道38在RPV 22的一侧。分支通气系统32构成为将RPV 22中发生的不可冷凝气体引导到主蒸汽管27侧的RPV 通风系统30在反应堆的正常运行期间。版权所有（C）2004，JPO

2. 发明专利

JP2013002871A Partial discharge measuring system using repeated impulse voltages and partial discharge measuring method 审中-公开
标题翻译：使用重复脉冲电压和部分放电测量方法的部分放电测量系统
公开(公告)号：JP2013002871A
公开(公告)日：2013-01-07
申请号：JP2011132218
申请日：2011-06-14
申请人： Toshiba Corp , 株式会社東芝 , Toshiba Mitsubishi-Electric Industrial System Corp , 東芝三菱電機産業システム株式会社 , Toshiba Industrial Products Manufacturing Corp , 東芝産業機器製造株式会社
发明人： HIROSE TATSUYA , HIROSHIMA SATOSHI , YOSHIMITSU TETSUO , TSUDA TOSHIHIRO , YAMAMOTO YUJI
IPC分类号： G01R31/12 , G01R31/34
摘要： PROBLEM TO BE SOLVED: To provide a partial discharge measuring system using repeated impulse voltages in which work by a user can be reduced as much as possible.SOLUTION: A partial discharge measuring system using repeated impulse voltages comprises impulse voltage application means, impulse voltage control means and partial discharge count means. The impulse voltage application means generates a plurality of impulse voltages and applies them to a measuring target. The partial discharge count means counts how many times partial discharge occurs on the basis of a detection signal outputted from partial discharge detection means which detects the partial discharge in the measuring target. The impulse voltage control means controls the impulse voltage application means to apply a specific number of impulse voltages having the same peak value to the measuring target. The partial discharge count means counts how many times the partial discharge occurs each time the specified number of impulse voltages are applied to the measuring target.
摘要翻译：要解决的问题：提供使用重复脉冲电压的局部放电测量系统，其中可以尽可能地减少用户的工作。解决方案：使用重复脉冲电压的局部放电测量系统包括脉冲电压施加装置，脉冲电压控制装置和局部放电计数装置。脉冲电压施加装置产生多个脉冲电压并将其施加到测量目标。局部放电计数装置根据从检测测量目标物中的局部放电的局部放电检测装置输出的检测信号，计数发生局部放电的次数。脉冲电压控制装置控制脉冲电压施加装置将具有相同峰值的特定数量的脉冲电压施加到测量目标。局部放电计数装置计算每当向测量对象施加规定数量的脉冲电压时，发生局部放电的次数。版权所有（C）2013，JPO＆INPIT

3. 发明专利

JP2012243151A Chip size estimation device for semiconductor integrated circuit and chip size estimation method for semiconductor integrated circuit 审中-公开
标题翻译：用于半导体集成电路的半导体集成电路和芯片尺寸估计方法的芯片尺寸估计器件
公开(公告)号：JP2012243151A
公开(公告)日：2012-12-10
申请号：JP2011113926
申请日：2011-05-20
申请人： Toshiba Corp , 株式会社東芝
发明人： YAMAMOTO YUJI
IPC分类号： G06F17/50 , H01L21/82
CPC分类号： G06F17/504
摘要： PROBLEM TO BE SOLVED: To provide a chip size estimation device of a semiconductor integrated circuit and a chip estimation method of the semiconductor integrated circuit for accurately and easily estimating a chip size.SOLUTION: The chip size estimation device of a semiconductor integrated circuit includes: an input part 1 for inputting the minimum number of function gates as the number of gates which is absolutely necessary for the achievement of the function of a circuit; a set value storage part 21 for preliminarily setting the coefficient of the number of gates under the consideration of performance as the rate of the number of gates necessary for the achievement of a predetermined operating speed to the minimum number of function gates for every cell library; and a calculation part 22 for estimating the total area of the circuit by using the number of gates to be calculated from the minimum number of function gates and the coefficient of the number of gates under the consideration of performance.
摘要翻译：要解决的问题：提供半导体集成电路的芯片尺寸估计装置和用于准确且容易地估计芯片尺寸的半导体集成电路的芯片估计方法。解决方案：半导体集成电路的芯片尺寸估计装置包括：输入部件1，用于输入最小数量的功能门，作为实现电路功能绝对必要的门数; 设定值存储部21，用于将考虑到性能的门数的系数预先设定为实现预定操作速度所需的门数与每个单元库的最小数量的功能门的数量; 以及计算部22，用于通过使用从功能门的最小数量计算的门数和考虑性能的门数的系数来估计电路的总面积。版权所有（C）2013，JPO＆INPIT

4. 发明专利

JP2010055379A Device and method for designing semiconductor circuit 审中-公开
标题翻译：用于设计半导体电路的器件和方法
公开(公告)号：JP2010055379A
公开(公告)日：2010-03-11
申请号：JP2008219749
申请日：2008-08-28
申请人： Toshiba Corp , 株式会社東芝
发明人： YAMAMOTO YUJI , KIMURA KAZUNARI
IPC分类号： G06F17/50 , H01L21/82
摘要： PROBLEM TO BE SOLVED: To accurately estimate delay variation due to layout pattern correction.
SOLUTION: A device for designing a semiconductor circuit includes: a pattern correction part 1; a pattern change extraction part 2; a correlation database 3; a delay variation estimation part 4; a timing verification part 5; a comparison determination part 6; and a timing reverification part 7. In order to estimate a delay variation value by using the information on the correlation between a variation and delay variation classified for each kind of pattern changes stored in the correlation database 3 beforehand, it can be determined in a short time period whether timing should be verified again after correcting a layout pattern. As a result, when the delay variation value does not exceed a margin, the timing need not be verified again, and therefore the design time can be reduced. That is to say, the delay variation due to layout pattern correction can be accurately estimated and a frequency for reverifying timing can be reduced.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：准确估计由于布局图案校正引起的延迟变化。解决方案：一种用于设计半导体电路的器件包括：图案校正部分1; 图案改变提取部2; 相关数据库3; 延迟变化估计部4; 定时验证部5; 比较判定部6; 以及定时重新定义部分7.为了通过使用关于预先存储在相关数据库3中的每种类型的模式变化分类的变化和延迟变化之间的相关性的信息来估计延迟变化值，可以在短时间内确定时间段是否在校正布局图案后再次验证定时。结果，当延迟变化值不超过余量时，不需要再次验证时序，因此可以减少设计时间。也就是说，可以精确地估计由于布局图案校正引起的延迟变化，并且可以减少重新定时的频率。版权所有（C）2010，JPO＆INPIT

5. 发明专利

JP2008245133A Electronic device 审中-公开
标题翻译：电子设备
公开(公告)号：JP2008245133A
公开(公告)日：2008-10-09
申请号：JP2007085771
申请日：2007-03-28
申请人： Toshiba Corp , 株式会社東芝
发明人： YAMAZAKI NOBUYUKI , YAMAMOTO YUJI
IPC分类号： H04M1/23
摘要： PROBLEM TO BE SOLVED: To provide an electronic device in which a spare panel can be surely mounted on a device housing and exchange work of the spare panel can be easily implemented, the electronic device being configured by freely mounting removably the spare panel on the outer surface of the device housing.
SOLUTION: The electronic device comprises a first engage means constituted of a claw part and a recessed part between one terminal portion of a spare panel in a rectangular shape and a device housing; a second engage means constituted of a claw part and a recessed part between another terminal portion of the spare panel and a fixing member mounted on the device housing; and further, an adhesive sheet which is adhered with a rear side of the spare panel for holding the spare panel on an outer surface of the device housing.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种电子设备，其中备用面板可以可靠地安装在设备外壳上，并且可以容易地实现备用面板的交换工作，电子设备通过可拆卸地自由地安装备用面板在设备外壳的外表面上。解决方案：电子设备包括由爪形部分和矩形形式的备用面板的一个端子部分与器件壳体之间的凹部构成的第一接合装置; 第二接合装置，其由备用面板的另一个端子部分和安装在所述设备壳体上的固定构件之间的爪部和凹部构成; 并且还具有粘附在备用面板的后侧的粘合片，用于将备用面板保持在装置壳体的外表面上。版权所有（C）2009，JPO＆INPIT

6. 发明专利

JP2013124913A Partial discharge measurement method and method for manufacturing rotary electric machine 审中-公开
标题翻译：部分放电测量方法和制造旋转电机的方法
公开(公告)号：JP2013124913A
公开(公告)日：2013-06-24
申请号：JP2011273366
申请日：2011-12-14
申请人： Toshiba Corp , 株式会社東芝 , Toshiba Industrial Products Manufacturing Corp , 東芝産業機器製造株式会社
发明人： HIROSHIMA SATOSHI , HIROSE TATSUYA , YAMAMOTO YUJI
IPC分类号： G01R31/12 , G01R31/06 , H02K11/00
摘要： PROBLEM TO BE SOLVED: To provide a partial discharge measurement method for precisely measuring partial discharge between coil winding wires of a rotary electric machine.SOLUTION: The partial discharge measurement method for measuring partial discharge between coil winding wires of the rotary electric machine applies mutually identical impulse voltage generated by a surge power supply between a voltage application terminal of each phase coil and a stator core of the rotary electric machine, measures a partial discharge signal outputted by a partial discharge detector for detecting partial discharge occurring to the rotary electric machine, and determines whether or not there occurs partial discharge between the coil winding wires on the basis of whether or not there are more than one group of partial discharge signals measured with respect to application of arbitrary impulse voltage during an application period of the arbitrary impulse voltage.
摘要翻译：要解决的问题：提供一种用于精确测量旋转电机的线圈绕组之间的局部放电的局部放电测量方法。解决方案：用于测量旋转电机的线圈绕组之间的局部放电的局部放电测量方法在每个相线圈的电压施加端子和旋转电机的定子芯之间施加由浪涌电源产生的相同的脉冲电压电机，测量由部分放电检测器输出的用于检测旋转电机发生的局部放电的局部放电信号，并根据是否存在多于一个的线圈绕组，确定线圈绕组之间是否发生局部放电在任意脉冲电压的施加期间，针对施加任意脉冲电压而测量的一组局部放电信号。版权所有（C）2013，JPO＆INPIT

7. 发明专利

JP2006252319A Design device and automatic design method for semiconductor integrated circuit 有权
标题翻译：半导体集成电路的设计器件和自动设计方法
公开(公告)号：JP2006252319A
公开(公告)日：2006-09-21
申请号：JP2005069788
申请日：2005-03-11
申请人： Toshiba Corp , Toshiba Microelectronics Corp , 東芝マイクロエレクトロニクス株式会社 , 株式会社東芝
发明人： YAMAMOTO YUJI
IPC分类号： G06F17/50 , H01L21/82 , H01L21/822 , H01L27/04
CPC分类号： G06F17/5068 , G06F17/5077
摘要： PROBLEM TO BE SOLVED: To provide a design device and an automatic design method for a semiconductor integrated circuit, capable of suppressing increase in processing time and deterioration of wirability which are caused by substitution of area-preferential cells by yield-preferential cells.
SOLUTION: This device comprises an extraction part 11 extracting through-wiring tracks which linearly pass through area preferential cells and yield-preferential cells increasing the yield of the area preferential cells, both the cells being contained in first layout information; a layout part 12 substituting the area-preferential cells contained in the first layout information by the yield-preferential cells to form second layout information; and a calculation part 13 calculating, based on the second layout information and information of the through-wiring tracks, the ratio of the number of intersections where through-wiring cannot be arranged to the number of all intersections of wiring tracks of a semiconductor integrated circuit.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：为了提供一种半导体集成电路的设计装置和自动设计方法，能够抑制加工时间的增加和通过产量优先电池代替面积优先电池而引起的布线劣化。解决方案：该装置包括提取部分11，其提取线性通过区域优先信元的通过线路轨迹，并且产生优先信元增加区域优先信元的收益率，两个信元都包含在第一布局信息中; 布置部分12用收益率优先单元代替包含在第一布局信息中的区域优先单元以形成第二布局信息; 以及计算部13，基于第二布图信息和贯通线轨迹的信息，计算出不能配置贯通布线的交点数与半导体集成电路的布线轨迹的所有交点的数量的比例。版权所有（C）2006，JPO＆NCIPI

8. 发明专利

JP2003043188A Nuclear reactor water heed equipment 审中-公开
标题翻译：核反应堆水处理设备
公开(公告)号：JP2003043188A
公开(公告)日：2003-02-13
申请号：JP2001235004
申请日：2001-08-02
申请人： Toshiba Corp , 株式会社東芝
发明人： YAMAMOTO YUJI , KOBAYASHI MINORU , HIKASA MASAAKI , BABA TAKAO , KINOSHITA KOICHI
IPC分类号： G21C19/307 , F28F19/02 , G21D1/00 , G21D3/08
CPC分类号： Y02E30/40
摘要： PROBLEM TO BE SOLVED: To reduce Co-60 concentration of reactor water by reducing an eluting quantity of Co, Cr, and Ni eluted from high pressure feed water heaters.
SOLUTION: In a boiling water nuclear power plant, one end of a high temperature water supply pipe 11 and a high temperature water return pipe 12 are connected to the water chamber side (the heat transfer tube inside surface side) or the shell side (the heat transfer tube outside) of the high pressure feed water heaters 1 (1A, 1B, 2A, and 2B) for feeling high temperature water to a reactor pressure vessel 9, and the other ends of these pipes 11 and 12 are connected to a high temperature water circulating device 10. The high temperature water heated by the high temperature water circulating device 10 is circulated in the high temperature feed water heaters 2B, 1B, 1A, and 2A, and an oxide film layer is formed on inside and outside surfaces of heat transfer tubes. The inflow of Co, Cr and Ni eluted from the high pressure feed water heaters to the reactor pressure vessel can be prevented by this oxide film layer.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：通过降低从高压给水加热器洗脱的Co，Cr和Ni的洗脱量来降低反应器水的Co-60浓度。解决方案：在沸水核电站中，高温给水管11和高温回水管12的一端连接到水室侧（传热管内表面侧）或壳侧（用于将高温水反应到反应堆压力容器9的高压给水加热器1（1A，1B，2A和2B）的传热管外部，并且这些管11和12的另一端连接到高压高温水循环装置10加热的高温水在高温给水加热器2B，1B，1A，2A中循环，氧化膜层形成在传热管。可以通过该氧化膜层防止从高压给水加热器洗脱到反应器压力容器的Co，Cr和Ni的流入。

9. 发明专利

JP2003035796A Boiling water reactor power plant, method for deaerating reactor pressure vessel in the plant and method for inspecting pressure resistance and leakage 审中-公开
标题翻译：锅炉水反应堆发电厂，装置中的反应器压力容器的方法和用于检查耐压和漏电的方法
公开(公告)号：JP2003035796A
公开(公告)日：2003-02-07
申请号：JP2001224614
申请日：2001-07-25
申请人： Toshiba Corp , 株式会社東芝
发明人： YAMAMOTO YUJI , MAEKAWA MASATOSHI , HIRAGUCHI JUNICHI , MIZUNO SATOSHI , BABA TAKAO , YOTSUYANAGI TADASHI
IPC分类号： G21C17/00 , G21D1/02
CPC分类号： Y02E30/40
摘要： PROBLEM TO BE SOLVED: To maintain low the concentration of dissolved oxygen by deaerating the inside of a reactor pressure vessel without affecting processes on the part of a turbine in an inspection of a pressure resistance and leakage of the reactor pressure vessel.
SOLUTION: A nuclear power plant has a deaerating system for exhausting a gas in the reactor pressure vessel 2 outside from a top vent pipe 35 connected to the top part of the reactor pressure vessel 2 through a vacuum pump 1 other than a main condenser vacuum pump 29 and an exhaust gas condenser 4 in a gaseous waste treatment system without passing through a main condenser 9 during the shutdown of the nuclear power plant. In another aspect, moreover, the plant has a deaerating system which exhausts a gas outside from the top vent pipe 3 through the main condenser vacuum pump 29 and the exhaust gas condenser 4 in the gaseous waste treatment system and possesses a recirculation system 48 which returns a part of the gas that has passed through the main condenser vacuum pump 29 so that the gas can pass trough it again.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：通过对反应堆压力容器的内部进行脱气来维持低浓度的溶解氧，而不会影响涡轮机的一部分的过程，以检查耐压性和反应堆压力容器的泄漏。解决方案：一个核电厂有一个脱气系统，用于通过除主冷凝器真空泵之外的真空泵1从连接到反应堆压力容器2的顶部的顶部通风管35向外排出反应堆压力容器2中的气体 29和排气冷凝器4在气态废物处理系统中，而在核电站关闭期间不通过主冷凝器9。此外，在另一方面，该设备具有脱气系统，其通过气态废物处理系统中的主冷凝器真空泵29和废气冷凝器4从顶部排气管3排出气体，并且具有返回的再循环系统48 已经通过主冷凝器真空泵29的气体的一部分，使得气体可以再次通过。

10. 发明专利

JP2014236577A 永久磁石式回転電機有权
标题翻译：永磁旋转电机
公开(公告)号：JP2014236577A
公开(公告)日：2014-12-15
申请号：JP2013116294
申请日：2013-05-31
申请人：株式会社東芝 , Toshiba Corp , 東芝産業機器システム株式会社 , Toshiba Industrial Products & Systems Corp
发明人： MATSUSHITA MAKOTO , TAKAHASHI NORIO , MISU DAISUKE , TAKEUCHI KATSUNORI , HASHIBA YUTAKA , KAWAKAMI MASAYUKI , ARAKI TAKASHI , YAMAMOTO YUJI , KATSURAYAMA HISAMI
IPC分类号： H02K1/27 , H02K1/22 , H02K21/14
CPC分类号： H02K1/276 , H02K1/2766 , H02K21/14 , H02K2213/03
摘要：【課題】永久磁石の使用量を減少しながら、高効率となる永久磁石式回転電機を提供する。【解決手段】固定子12と、この固定子12の内側に回転可能に設けられ、回転子鉄心24を有する回転子14と、この回転子14の回転子鉄心24内にV字形状に配置された磁石埋め込み孔内に埋設された永久磁石26と、を備えた永久磁石式回転電機である。回転子14内にV字形状に配置された2つの永久磁石26間の中心位置と回転子14の中心Oとを結ぶ直線と、回転子14の中心Oと一方の永久磁石26の外周側頂点とを結ぶ直線との間の角度&thetas;が回転子14の極数をPとした場合に0.65
摘要翻译：要解决的问题：提供一种用于减少永磁体使用的高效率的永磁式旋转电机。解决方案：一种永磁旋转电机，包括：定子12; 可旋转地设置在定子2内的转子14，具有转子铁心24; 以及嵌入在转子14的转子铁芯24中以V形布置的磁体埋入孔中的永磁体26。在连接转子14中的V形的两个永久磁铁26与转子14的中心O之间的中心位置的直线与将转子14的中心O连接的直线与外周峰当转子14的极数被指定为P时，一个永磁体26满足关系0.65 <Θ（=＆amp; tt; /（180 / P））<0.80。当定子铁的槽20的背面深度铁芯16被指定为D，将永磁体26的转子铁心24的径向的埋入深度设为t，D / t = A满足0.8

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