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    • 1. 发明专利
    • Delay measuring device and semiconductor device
    • 延迟测量装置和半导体器件
    • JP2010002222A
    • 2010-01-07
    • JP2008159470
    • 2008-06-18
    • Sony Corpソニー株式会社
    • MEGURO TETSUMASA
    • G01R31/28H01L21/82H01L21/822H01L27/04
    • PROBLEM TO BE SOLVED: To evaluate an instantaneous delay, and to obtain high detection accuracy.
      SOLUTION: A delay measuring device includes; a pulse generating circuit 11 for generating a reference pulse PS1 and a measuring pulse PS2 at respective prescribed timing; and a delay measuring circuit 12. The delay measuring circuit 12 inputs the reference pulse PS1 from the pulse generating circuit 11 and inputs a delayed pulse PS2d from a circuit to be measured 20 which is obtained after a propagation delay in an operation of inputting the measuring pulse PS2 to the circuit to be measured 20. The delay measuring circuit 12 detects a phase difference between the reference pulse PS1 and the delayed pulse PS2d at the start or end timing of the pulses, and outputs delay information representing the detected phase difference.
      COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:评估瞬时延迟并获得高检测精度。 解决方案:延迟测量装置包括: 脉冲发生电路11,用于在各自规定的时刻产生参考脉冲PS1和测量脉冲PS2; 和延迟测量电路12.延迟测量电路12从脉冲发生电路11输入参考脉冲PS1,并从输入测量的操作中的传播延迟之后获得的待测电路20的延迟脉冲PS2d输入 脉冲PS2到要测量的电路20.延迟测量电路12在脉冲的开始或结束定时检测参考脉冲PS1和延迟脉冲PS2d之间的相位差,并输出表示检测到的相位差的延迟信息。 版权所有(C)2010,JPO&INPIT
    • 2. 发明专利
    • Semiconductor integrated circuit and method for testing same
    • 半导体集成电路及其测试方法
    • JP2005322860A
    • 2005-11-17
    • JP2004141614
    • 2004-05-11
    • Sony Corpソニー株式会社
    • MEGURO TETSUMASAKUROSE ETSUKAZU
    • G01R31/28G11C7/00G11C29/02H01L21/66H01L21/82H01L21/822H01L27/04
    • G11C29/021G11C29/02G11C29/028G11C2029/0403G11C2029/4402G11C2029/5004
    • PROBLEM TO BE SOLVED: To provide semiconductor integrated circuits which can be driven by respectively different power supply voltages in accordance with manufacturing dispersion, and provide a test method for guaranteeing the operation.
      SOLUTION: In addition to a function block to be driven by receiving supply of power supply voltage, the semiconductor integrated circuit 10 comprises a process monitor circuit 11 for grasping a delay characteristic corresponding to a manufacturing process condition; a storage circuit 12 for storing data concerned with a process dispersion state acquired from the process monitor circuit 11; and a power supply voltage control circuit 13 for adaptively controlling the power supply voltage in accordance with the process dispersion state acquired from the process monitor circuit 11 and stored in the storage circuit 12.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供根据制造分散可分别由不同电源电压驱动的半导体集成电路,并提供用于保证操作的测试方法。 解决方案:半导体集成电路10除了通过接收电源电压的驱动而驱动的功能块之外,还包括用于掌握对应于制造工艺条件的延迟特性的处理监视电路11。 用于存储与从处理监视电路11获取的处理色散状态有关的数据的存储电路12; 以及电源电压控制电路13,用于根据从处理监视电路11获取并存储在存储电路12中的处理色散状态自适应地控制电源电压。(C)2006年,JPO&NCIPI
    • 3. 发明专利
    • Electronic equipment
    • JP2004032875A
    • 2004-01-29
    • JP2002184103
    • 2002-06-25
    • Sony Corpソニー株式会社
    • SEKI TAKEHIRONAKAI MASAKATSUMEGURO TETSUMASA
    • H02M3/155
    • PROBLEM TO BE SOLVED: To provide an electronic equipment which can suppress the overhead caused by the switchover of a control system and can keep a switching regulator in high efficiency within a wide load current range.
      SOLUTION: This electronic equipment is provided with a load circuit 44 which outputs a rectification system switching signal S45 to instruct a switching regulator 41 to operate in PWW control and synchronous rectification system in active mode, and outputs a rectification system switching signal S45 to instruct the switching regulator 41 to operate in diode rectification system in standby mode; and the above-mentioned switching regulator 41 which includes a control circuit 419 for judging whether to drive it in synchronous rectification system or to drive it in diode rectification system according to the instruction of the rectification system switching signal S45, outputting control signals CTL1 and CTL2 to driver circuits 420 and 421 according to the judged rectification system, and performing the drive control of a p-channel switching transistor 411 and an n-channel switching transistor 412.
      COPYRIGHT: (C)2004,JPO
    • 4. 发明专利
    • Clock generator and clock conversion circuit
    • 时钟发生器和时钟转换电路
    • JP2003330569A
    • 2003-11-21
    • JP2002138020
    • 2002-05-14
    • Sony Corpソニー株式会社
    • MEGURO TETSUMASA
    • G06F1/04G06F1/06G06F1/08G06F1/32H03K5/00H03K23/64
    • G06F1/08G06F1/3203Y02D10/126
    • PROBLEM TO BE SOLVED: To solve a problem that a frequency not suitable for a task is often generated with a clock generator which generates clocks of a plurality of frequencies, and that useless power is consumed in that event. SOLUTION: The clock generator includes: a clock generater 11 which generates clocks clk of predetermined frequencies; a counter 13 which operates in synchronization with the clock clk and counts pulses of the clock clk; a comparator 14 which compares the counter value of the counter 13 with the number of pulses cmpd of the clock of a desired frequency freq; and output gates 15, 16 which control the supply and half of the pulse of the clock clk inputted from the clock generation part 11, on the basis of the comparison result obtained with the comparator 14. COPYRIGHT: (C)2004,JPO
    • 要解决的问题:为了解决通常使用产生多个频率的时钟的时钟发生器来生成不适合任务的频率的问题,并且在该事件中消耗无用功率的问题。 时钟发生器包括:时钟发生器11,其生成预定频率的时钟clk; 计数器13,其与时钟clk同步操作并计数时钟clk的脉冲; 比较器14,其将计数器13的计数器值与期望频率的时钟的脉冲数cmpd进行比较; 以及输出门15,16,其根据比较器14获得的比较结果控制从时钟产生部分11输入的时钟clk的脉冲供应和一半的脉冲数。(C)2004, JPO
    • 9. 发明专利
    • FREQUENCY CONTROL CIRCUIT
    • JP2003140767A
    • 2003-05-16
    • JP2001343041
    • 2001-11-08
    • SONY CORP
    • MEGURO TETSUMASA
    • G06F1/32G06F1/04H03K5/00
    • PROBLEM TO BE SOLVED: To provide a frequency control circuit in which power consumption can be reduced without increasing the variation of a clock frequency. SOLUTION: This frequency control circuit is provided with a control circuit 15 for outputting a first control signal S151 to a clock supplying circuit 12 when a through-put T is requested in order to instruct the clock supplying circuit 12 to decide two clock frequencies and each period from the value of the through-put T and the value of a through-put to be realized from a clock frequency which can be generated by the clock supplying circuit 12, and to select those two clock frequencies in each decided period, and to output it as a system clock, and for outputting a second control signal S152 to a power supply voltage supplying circuit 13 in order to instruct the power supply voltage supplying circuit 13 to supply a power supply voltage with which the operation of a target circuit can be ensured in each of those two clock frequencies instructed to the clock supply circuit 12.
    • 10. 发明专利
    • POWER SUPPLY VOLTAGE FREQUENCY CONTROL CIRCUIT
    • JP2003150269A
    • 2003-05-23
    • JP2001343168
    • 2001-11-08
    • SONY CORP
    • MEGURO TETSUMASA
    • G06F1/04H02M3/157H03K5/00
    • PROBLEM TO BE SOLVED: To provide a power supply voltage frequency control circuit capable of ensuring the operation of a target circuit when changing a clock frequency according to processing, and supplying a power supply voltage according to the change. SOLUTION: This circuit is provided with a clock supply circuit 12 capable of supplying a system clock SYSCLK with a plurality of clock frequency, and supplying a system clock with a clock frequency corresponding to a first control signal S141 to a target circuit 11 for performing processing synchronously with a system clock, a power supply voltage supply circuit 13 for supplying a power supply voltage whose value corresponds to a second control signal S142 to a target circuit 11, and a control circuit 14 for outputting a first control signal S141 to the clock supply circuit 12, and for outputting the second control signal S142 to the power supply voltage supply circuit 13 according to the instruction of a frequency change value and a change time from the target circuit 13.