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    • 3. 发明专利
    • Multilayer wiring board
    • 多层接线板
    • JP2012164816A
    • 2012-08-30
    • JP2011024169
    • 2011-02-07
    • Murata Mfg Co LtdRenesas Electronics Corpルネサスエレクトロニクス株式会社株式会社村田製作所
    • ICHIMURA TAKASHIYAMANAGA ISAOAZUMA TAKAHIROAKIMOTO TETSUYAKARIYAZAKI SHUICHISHIRAI WATARUTSUKUDA TATSUAKI
    • H05K3/46H01L23/12H05K1/02
    • PROBLEM TO BE SOLVED: To provide a multilayer wiring board which can reduce power supply impedance at an antiresonant frequency while keeping the power supply impedance at a resonant frequency low.SOLUTION: On a multilayer wiring board 1, an IC 50 and two multilayer ceramic capacitors (decoupling capacitors) 60, 67 connected in parallel with each other between a power source and a ground of the IC 50 are mounted. The two multilayer ceramic capacitors 60, 67 include the multilayer ceramic capacitor 67 connected by a wiring pattern 15 including a resistance pattern 16 having a predetermined resistance value and the multilayer ceramic capacitor 60 connected by a wiring pattern 14 not including the resistance pattern 16. An ESR of the multilayer ceramic capacitor 60 is set at 100 mΩ or less and combined resistance of an ESR and the resistance pattern 16 of the multilayer ceramic capacitor 67 is set at no fewer than 1.5 Ω nor more than 20 Ω.
    • 要解决的问题:提供一种能够在将电源阻抗保持在谐振频率低的同时降低反谐振频率下的电源阻抗的多层布线基板。 解决方案:在多层布线板1上安装IC 50和在电源和IC 50的接地之间彼此并联连接的两个多层陶瓷电容器(去耦电容器)60,67。 两层叠陶瓷电容器60,67包括由包括具有预定电阻值的电阻图案16的布线图案15连接的多层陶瓷电容器67,并且层叠陶瓷电容器60通过不包括电阻图案16的布线图案14连接。 层叠陶瓷电容器60的ESR设定为100mΩ以下,并且层叠陶瓷电容器67的ESR和电阻图案16的组合电阻被设定为不低于1.5Ω,也不大于20Ω。 版权所有(C)2012,JPO&INPIT
    • 4. 发明专利
    • Semiconductor integrated circuit device
    • 半导体集成电路设备
    • JP2014099436A
    • 2014-05-29
    • JP2012248943
    • 2012-11-13
    • Renesas Electronics Corpルネサスエレクトロニクス株式会社
    • SHIRAI WATARUTSUCHIYA KEITA
    • H01L23/12H01L23/14H01L25/10H01L25/11H01L25/18
    • H01L2224/16225H01L2224/32225H01L2224/73204H01L2924/13091H01L2924/00
    • PROBLEM TO BE SOLVED: To solve the problem in a semiconductor integrated circuit device, such as a flip-chip connected BGA, in which a semiconductor chip is flip-chip connected on an organic multilayer wiring board as an interposer, that although a non-fusing type bump electrode, such as a copper pillar, is used to reduce the bump pitch of the flip-chip connection, a flip-chip connected BGA, etc. using this non-fusing type bump electrode tends to cause a separation or crack to occur in a wiring interlayer film of the semiconductor chip.SOLUTION: The present invention is to ensure that, in a semiconductor integrated circuit device such as a flip-chip connected BGA using, as an interposer, a multilayer build-up board having an organic core board, a copper pillar is disposed so that its position does not overlap, in a plane view, a buried via penetrating the organic core board.
    • 要解决的问题为了解决半导体集成电路器件中的问题,例如半导体芯片连接的BGA,其中半导体芯片以倒装芯片连接在作为插入器的有机多层布线板上, 使用诸如铜柱的熔合型凸起电极来减小倒装芯片连接的凸起间距,使用该非熔合型凸块电极的倒装芯片连接的BGA等,往往会导致分离或破裂 发生在半导体芯片的布线层间膜中。解决方案:本发明是为了确保在半导体集成电路器件如倒装芯片连接的BGA中使用具有有机物的多层叠层板作为插入件 核心板,铜柱被布置成使得其位置在平面图中不重叠穿过有机芯板的埋入通孔。