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    • 1. 发明专利
    • Scintillation detector
    • SCINTILLATION检测器
    • JP2008039548A
    • 2008-02-21
    • JP2006213206
    • 2006-08-04
    • Ohyo Koken Kogyo Co Ltd応用光研工業株式会社
    • YAMAMOTO TATSUOTAKASO TATSUMIFUKUZAWA AKIRA
    • G01T1/208C09K11/00C09K11/80G01T1/20
    • PROBLEM TO BE SOLVED: To provide a scintillation detector that will not have average DC level from varying, even with respect to significant changes in the luminance of incident radiation.
      SOLUTION: A negative bias voltage is applied to a photocathode K from a bias power supply terminal 6, in order to bring the anode A of a photomultiplier tube 2 to be at the zero potential. Rather than DC coupling, AC coupling using a capacitor is configured in each of signal paths between the output of the photomultiplier tube 2 and the input of a DC-type waveform shaping amplifier 3, and between an output of the DC-type waveform shaping amplifier 3 and an output terminal 5 of the scintillation detector.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:即使对于入射辐射的亮度的显着变化,也提供不具有平均DC电平变化的闪烁检测器。 解决方案:为了使光电倍增管2的阳极A处于零电位,从偏压电源端子6向负电偏压施加负偏压。 而不是DC耦合,使用电容器的AC耦合被配置在光电倍增管2的输出和DC型波形整形放大器3的输入之间的每个信号路径中,并且在DC型波形整形放大器 3和闪烁检测器的输出端子5。 版权所有(C)2008,JPO&INPIT