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    • 1. 发明专利
    • Measurement method of light-emitting diode tangential plane temperature
    • 发光二极管平板温度的测量方法
    • JP2009294196A
    • 2009-12-17
    • JP2008233496
    • 2008-09-11
    • National Central Univ國立中央大學
    • CHIN SHIJINKO BONKUNKYO KOKUKUNCHEN KUAN-CHIEHLIN FENG-LONG
    • G01K7/01
    • H05B33/089
    • PROBLEM TO BE SOLVED: To provide a measurement method of a tangential plane temperature of a light-emitting diode. SOLUTION: A temperature oscillation status of the light-emitting diode is determined by performing for a light-emitting diode: a first step of preparing a temperature curve of a light-emitting diode; a second step of inputting at least a fixed amount AC voltage into the light-emitting diode; a third step of measuring a temperature of an external package body specific position of the light-emitting diode, introducing a temperature measured from the specific position into a temperature curve, calculating a tangential plane temperature of the light-emitting diode by means of an interpolation method; and a fourth step of substituting the calculation result of the third step into a predetermined numerical analysis pattern. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:提供发光二极管的切向平面温度的测量方法。 解决方案:通过执行发光二极管来确定发光二极管的温度振荡状态:制备发光二极管的温度曲线的第一步骤; 将至少一定数量的AC电压输入到所述发光二极管中的第二步骤; 第三步骤,测量发光二极管的外部封装体特定位置的温度,将从特定位置测量的温度引入温度曲线,通过插值法计算发光二极管的切平面温度 方法; 以及将第三步骤的计算结果代入预定数值分析模式的第四步骤。 版权所有(C)2010,JPO&INPIT