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    • 5. 发明专利
    • METHOD AND DEVICE FOR RECOGNIZING PATTERN
    • JP2001291105A
    • 2001-10-19
    • JP2000101966
    • 2000-04-04
    • KAWASAKI HEAVY IND LTD
    • ENOMOTO MASAYUKIKANAMARU TAKAO
    • G06T1/00G06T7/00G06T7/60
    • PROBLEM TO BE SOLVED: To provide a new pattern recognizing method which can quickly calculate the position and attitude of a pattern and is hardly affected even if lighting and the reflection states of an object surface change. SOLUTION: In this method, a plurality of contour points of a template are detected to store a shift vector V in which the length (r) of a straight line connecting a contour point and a preliminarily defined reference point and the angle θ formed between the straight line and a normal vector at the contour point are defined as attributes (S1), contour points of an object pattern in an image are detected (S2 and S3) to calculate a pattern normal vector in a contour point of the object pattern (S4), shift vector conversion is performed for calculating the coordinates of a mapping point obtained by being shifted as much as the length (r) of the shift vector with respect to the pattern normal vector in the direction of the attribute angle θ (S5), the angle difference data between the pattern normal vector and a template normal vector are accumulated in a coordinate correspondence memory corresponding to the calculated mapping point coordinates (S6), an address where the number of pieces of data converges after the shift vector conversion is detected to obtain the object position on the basis of coordinates corresponding to the memory address (S8) and the object posture is obtained from the frequency distribution of angle difference data stored in the address (S9).