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1. 发明专利

JP2002190269A SAMPLE BLOCK 失效
公开(公告)号：JP2002190269A
公开(公告)日：2002-07-05
申请号：JP2000388667
申请日：2000-12-21
申请人： JEOL LTD
发明人： SUZUKI TOSHIAKI , ENDO NORIAKI
IPC分类号： H01J37/20
摘要： PROBLEM TO BE SOLVED: To provide a sample block suitable for holding a sample supporting film. SOLUTION: The sample block has pillar-like holes 51A, 51B along an edge part of a sample block 50 with partially cut parts in the direction parallel to an axis O. The bottom surface of these holes are used for holding a supporting film. A sample supporting film 38 is picked up with a pair of tweezers and is placed horizontally on a supporting film holder 51A formed on the sample block 50. A sample 26 to be observed is adhered horizontally on the sample supporting film 38. The part of the supporting film holder 51A of the support film 38 to which the observed sample 26 is adhered, protruding from the bottom surface of the supporting film holder 51A, or a part of it, is pinched with a pair of tweezers and is mounted on a observed sample mounting part formed on the tip of the body 9A in a sample holder.

2. 发明专利

JP2005293865A Sample holder and sample tilt holder 有权
标题翻译：样品支架和样品倾斜支架
公开(公告)号：JP2005293865A
公开(公告)日：2005-10-20
申请号：JP2004102815
申请日：2004-03-31
申请人： Jeol Ltd , 日本電子株式会社
发明人： SUZUKI TOSHIAKI , NISHIOKA HIDEO , SATO YASUHIKO , OKUNISHI EIJI , ENDO NORIAKI
IPC分类号： G01N1/32 , G01N1/28 , H01J37/20
摘要： PROBLEM TO BE SOLVED: To provide a sample holder for easily arranging a sample to a biaxial tilt holder.
SOLUTION: A rod-like introduction section 21 is formed so that it can be fitted to the goniometer of a transmission electron microscope. A chip-on cartridge 22 comprises a mounting section 23 and a shuttle (sample retaining section) 24. In the chip-on cartridge 22, a conventional chip-on cartridge is divided into two portions. One end of the mounting section 23 is formed so that it can be detachably mounted to the tip of the introduction section 21. The shuttle 24 is formed so that it can be detachably mounted to the other end of the mounting section 23. Therefore, a sample holder 20 shown in Fig. (b) can be obtained, by mounting the shuttle 24 to the mounting section 23 and by mounting the mounting section 23 to the tip of the introductions section 21.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供用于将样品容易地布置到双轴倾斜保持器的样品保持器。解决方案：形成杆状导入部21，使其能够配合到透射型电子显微镜的测角器上。芯片盒22包括安装部分23和梭子（样品保持部分）24。在芯片上的卡盘22中，常规的打码卡盒被分成两部分。安装部23的一端形成为能够可拆卸地安装在导入部21的前端。梭24形成为可拆卸地安装在安装部23的另一端。因此，图1所示的样品保持器20。（b）可以通过将梭24安装到安装部23并且将安装部23安装到引入部21的末端来获得。（C）版权所有（C）2006，JPO＆NCIPI

3. 发明专利

JP2004198276A Method for fabricating sample for transmission electron microscope 有权
公开(公告)号：JP2004198276A
公开(公告)日：2004-07-15
申请号：JP2002367715
申请日：2002-12-19
申请人： Jeol Ltd , 日本電子株式会社
发明人： SUZUKI TOSHIAKI , NISHIOKA HIDEO , SATO YASUHIKO , OKUNISHI EIJI , ENDO NORIAKI
IPC分类号： G01N1/06 , G01N1/28 , G01N1/32 , H01J37/20
摘要： PROBLEM TO BE SOLVED: To provide a method for fabricating a sample for a transmission electron microscope which easily fabricates the thin film sample with a desired cross section. SOLUTION: A sample block 1 cut from a sample raw material is placed on a placement face 2a of a sample base 2 so as to laterally turn a processed face of the sample block 1. The processed face of the sample block 1 is orthogonal to the placement face 2a. After the placement, the sample base 2 is mounted to a FIB and a thin film process for the sample block 1 is implemented. COPYRIGHT: (C)2004,JPO&NCIPI

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