专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2011059100A Three-dimensional interferometric microscopic observation 有权
标题翻译：三维干涉微观观察
公开(公告)号：JP2011059100A
公开(公告)日：2011-03-24
申请号：JP2010140065
申请日：2010-06-21
申请人： Howard Hughes Medical Inst , ハワードヒューズメディカルインスティチュート
发明人： HESS HARALD F , SHTENGEL GLEB
IPC分类号： G01B9/02 , G01B11/00 , G01N21/64 , G02B5/04 , G02B21/00
CPC分类号： G01N21/6458 , G01B9/02097 , G01B9/04 , G02B21/18 , G02B27/14
摘要： PROBLEM TO BE SOLVED: To provide a method and a device of three-dimensional interferometric microscopic observation including a process for emitting an optical beam, a process for determining a position of an optical source, and a process for analyzing a shape of one or more beam images.
SOLUTION: In the device, a statistically sparse subset of switchable optical sources in a sample is activated, and the activated switchable optical sources are excited, and according to these, the optical beams are emitted from the activated switchable optical sources along at least two optical paths. First wave front modification in a first optical beam emitted from the activated switchable optical sources along a first optical path is introduced and second wave front modification in a second optical beam emitted from the activated switchable optical sources along a second optical path is introduced, the second wave modification is distinct from the first wave front modification. The first and second optical beams are interfered each other to generates a plurality of output beams, and three-dimensional position information of the optical sources is determined based on the intensity of each output beam from the plurality of output beam.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种包括用于发射光束的方法的三维干涉显微观察的方法和装置，用于确定光源的位置的处理以及用于分析光源的形状的处理一个或多个光束图像。解决方案：在设备中，样本中的可切换光源的统计稀疏子集被激活，并激活可激活的可切换光源，并且根据这些，光束从激活的可切换光源沿着至少两条光路。引入沿着第一光路从激活的可切换光源发射的第一光束中的第一波前修改，并且引入沿着第二光路从激活的可切换光源发射的第二光束中的第二波前修改，第二波前修改波浪修改与第一波前修改不同。第一和第二光束彼此干涉以产生多个输出光束，并且基于来自多个输出光束的每个输出光束的强度来确定光源的三维位置信息。版权所有（C）2011，JPO＆INPIT

2. 发明专利

JP2013156631A Systems and methods for three-dimensional interferometric microscopy 有权
标题翻译：三维干涉显微镜的系统和方法
公开(公告)号：JP2013156631A
公开(公告)日：2013-08-15
申请号：JP2013007569
申请日：2013-01-18
申请人： Howard Hughes Medical Inst , ハワードヒューズメディカルインスティチュート
发明人： HESS HARALD F
IPC分类号： G02B21/00 , G01N21/64
CPC分类号： G01B9/02041 , G01B9/02007 , G01B9/02081 , G01B9/02097 , G01B9/04 , G01B2290/45 , G01B2290/55 , G01N21/6456 , G01N21/6458 , G02B21/0056 , G02B21/0076 , G02B21/008 , G02B21/14 , G02B21/367 , H04N13/0214
摘要： PROBLEM TO BE SOLVED: To provide a microscopy system which can derive a quantitative measure of phase and positional information from a single interferometric measurement or a time sequence of measurements.SOLUTION: A microscopy system 100 comprises: optical components 130 and 140; a beam splitter 150; optical components 160 and 170; and detectors 165 and 175. The optical components 130 and 140 can be any type of optical components that define an optical path 132 and 142, respectively, from a sample S to the beam splitter 150. For example, optical components 130 and 140 each can include a set of mirrors, lenses or objectives. The optical components 130 and 140, for example, can include lenses or objectives that collimate optical energy emitted from a point light source of the sample.
摘要翻译：要解决的问题：提供可以从单个干涉测量或测量时间序列导出相位和位置信息的定量测量的显微镜系统。显微镜系统100包括：光学部件130和140; 分束器150; 光学部件160和170; 和检测器165和175.光学部件130和140可以是分别从样品S到分束器150限定光路132和142的任何类型的光学部件。例如，光学部件130和140各自可以包括一套镜子，镜头或目标。例如，光学部件130和140可以包括准直从样品的点光源发射的光能的透镜或物镜。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式