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    • 1. 发明专利
    • Method of manufacturing tunnel magnetoresistance element and nonvolatile memory device
    • 制造隧道磁阻元件和非易失性存储器件的方法
    • JP2007324215A
    • 2007-12-13
    • JP2006150210
    • 2006-05-30
    • Fujitsu Ltd富士通株式会社
    • OCHIAI TAKAOUMEHARA SHINJIROASHIDA YUTAKASATO MASASHIGEKOBAYASHI KAZUO
    • H01L43/12G11B5/39H01L21/8246H01L27/105H01L43/08
    • H01F10/3254B82Y10/00B82Y25/00B82Y40/00G11B5/3163G11B5/3906G11B5/3909G11C11/16H01F10/3272H01F41/304
    • PROBLEM TO BE SOLVED: To provide a method of manufacturing a tunnel magnetoresistance element which can suppress peeling of a film during manufacturing, and to provide a method of manufacturing a nonvolatile memory device. SOLUTION: An electrode 2, an antiferromagnetic film 3, a ferromagnetic film 4, a non-magnetic film 5, a ferromagnetic film 6, a tunnel insulation film 7, a ferromagnetic film 8, a Ta film 9, an Ru film 10, and a Ta film 11 are formed in sequence on a substrate 1. The thickness of the Ta film 11 is about 0.5 nm for example. The Ta film 11 is naturally oxidized after formation. Next, heat treatment is conducted to improve the characteristic of a TMR film 21. The heat treatment is applied at about 200-300°C for example. The conventional manufacturing method causes peeling of the film during the heat treatment, resulting in faults such as opening and wrinkling. Such the faults can be prevented because the Ta film 11 is formed on the uppermost surface by using this method. Then, the Ta film 11 or the like is patterned. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:提供一种制造隧道磁阻元件的方法,该方法可以抑制制造期间膜的剥离,并提供一种制造非易失性存储器件的方法。 解决方案:电极2,反铁磁膜3,铁磁膜4,非磁性膜5,铁磁膜6,隧道绝缘膜7,铁磁膜8,Ta膜9,Ru膜 如图10所示,Ta膜11依次形成在基板1上。例如,Ta膜11的厚度为约0.5nm。 Ta膜11在形成后自然氧化。 接下来,进行热处理以提高TMR膜21的特性。例如,在约200-300℃下进行热处理。 常规的制造方法在热处理期间导致膜的剥离,导致诸如开口和起皱的缺陷。 由于通过使用这种方法在最上表面上形成了Ta膜11,所以能够防止这种故障。 然后,对Ta膜11等进行图案化。 版权所有(C)2008,JPO&INPIT
    • 2. 发明专利
    • Magnetic storage device and its method of operation
    • 磁存储器件及其操作方法
    • JP2007266301A
    • 2007-10-11
    • JP2006089272
    • 2006-03-28
    • Fujitsu Ltd富士通株式会社
    • ASHIDA YUTAKASATO MASASHIGEUMEHARA SHINJIROOCHIAI TAKAOKOBAYASHI KAZUO
    • H01L21/8246G11C11/15H01L27/105H01L43/08
    • G11C11/1675
    • PROBLEM TO BE SOLVED: To achieve the compatibility of the reduction of critical current density J C , the improvement in output voltage, and the prevention of malfunction in order to obtain a large capacity (exceeding G bit) MRAM by spin-transfer torque writing method MRAM (STS-MRAM), being related to a magnetic storage device and its method of operation. SOLUTION: Between a free magnetic layer 4C composed of one or more ferromagnetic layers and nonmagnetic layers and a pinned magnetic layer 4A of multilayered ferri-pin structure, in the case of GMR type, it is fundamental that a nonmagnetic metal layer 4B is interposed and a magnetoresistance effect element composed by being provided with a heating layer 4E in the vicinity of the free magnetic layer 4C is equipped to operate it. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:为了获得临界电流密度J SB的降低的兼容性,提高输出电压,并防止故障,以获得大容量(超过G 位)MRAM通过自旋传递转矩写入方法MRAM(STS-MRAM),与磁存储装置及其操作方法有关。 解决方案:在由一个或多个铁磁层和非磁性层组成的自由磁性层4C和多层铁 - 引线结构的钉扎磁性层4A之间,在GMR型的情况下,非磁性金属层4B 并且设置由在自由磁性层4C附近设置有加热层4E而构成的磁阻效应元件来进行操作。 版权所有(C)2008,JPO&INPIT
    • 3. 发明专利
    • Magnetic reluctance sensor
    • 磁性传感器
    • JP2003298149A
    • 2003-10-17
    • JP2003029028
    • 2003-02-06
    • Fujitsu Ltd富士通株式会社
    • KIKUCHI HIDEYUKIKOBAYASHI KAZUO
    • G11B5/39H01F10/14H01F10/32H01L43/08
    • PROBLEM TO BE SOLVED: To provide a magnetic reluctance sensor for detecting a magnetic field by a spin valve effect, thereby enhancing detection sensitivity by increasing a change in resistance.
      SOLUTION: This fundamental structure comprises first and second magnetic thin film layers 3, 5 made of NiFe or the like which are formed across an antiferromagnetic thin film layer 4 made of FeMn or the like magnetized in one direction, first and second non-magnetic thin film layers 2, 6 made of Cu or the like contiguous to the magnetic thin film layers 3, 5, respectively, and third and fourth magnetic thin film layers 1, 7 made of NiFe or the like contiguous to the non-magnetic thin film layers 2, 6, respectively. The fundamental structures are laminated in a plurality of pairs on a substrate 8 to form a pair of terminals on an uppermost layer.
      COPYRIGHT: (C)2004,JPO
    • 要解决的问题:提供一种通过自旋阀效应检测磁场的磁阻传感器,从而通过增加电阻的变化来提高检测灵敏度。 解决方案:该基本结构包括由在一个方向上被磁化的FeMn等制成的反铁磁性薄膜层4上形成的由NiFe等制成的第一和第二磁性薄膜层3,5, 由分别与磁性薄膜层3,5连续的Cu等制成的磁性薄膜层2,6以及与非磁性材料相邻的NiFe等制成的第三和第四磁性薄膜层1,7 薄膜层2,6。 基底结构在衬底8上以多对层叠,以在最上层形成一对端子。 版权所有(C)2004,JPO
    • 4. 发明专利
    • Magnetic sensor
    • 磁传感器
    • JP2003282999A
    • 2003-10-03
    • JP2002084256
    • 2002-03-25
    • Fujitsu Ltd富士通株式会社
    • SATO MASASHIGEKIKUCHI HIDEYUKIKOBAYASHI KAZUO
    • G01R33/09H01L43/08
    • PROBLEM TO BE SOLVED: To realize a magnetic sensor of low consumption power which can detect fine change of an external magnetic field with high precision.
      SOLUTION: This magnetic sensor has a structure wherein a first electrode 113, a ground layer 102, a first antiferromagnetic layer 103, a first ferromagnetic layer 104, a first non-magnetic layer 105, a ferromagnetic intermediate layer 106, a second non-magnetic layer 110, a second ferromagnetic layer 111, a second antiferromagnetic layer 112 and a third electrode 115 are laminated in this order on a substrate 101, and a second electrode 114 is connected with the ferromagnetic intermediate layer 106. Directions of magnetization of the first ferromagnetic layer 104 and the second ferromagnetic layer 111 are parallel and fixed in an opposite directions with each other. Direction of magnetization of the ferromagnetic intermediate layer 106 is made freely rotatable corresponding to an external magnetic field.
      COPYRIGHT: (C)2004,JPO
    • 要解决的问题:实现能够以高精度检测外部磁场的微小变化的低功耗的磁传感器。 解决方案:该磁传感器具有这样的结构,其中第一电极113,接地层102,第一反铁磁层103,第一铁磁层104,第一非磁性层105,铁磁中间层106,第二 非磁性层110,第二铁磁层111,第二反铁磁层112和第三电极115依次层叠在基板101上,第二电极114与铁磁中间层106连接。磁化方向 第一铁磁层104和第二铁磁层111彼此相反地平行并固定。 铁磁中间层106的磁化方向可以根据外部磁场自由旋转。 版权所有(C)2004,JPO
    • 8. 发明专利
    • MAGNETIC SENSOR
    • JPH09231516A
    • 1997-09-05
    • JP3614596
    • 1996-02-23
    • FUJITSU LTD
    • SATO MASASHIGETANAKA ATSUSHIKOBAYASHI KAZUO
    • G01R33/09G11B5/39
    • PROBLEM TO BE SOLVED: To provide a magnetic sensor which is a magnetic sensor for detecting magnetic fields and more particularly a magnetic sensor adequate for use in the magnetic reading head of a magnetic recorder and has a high resistance change rate and is strong to disturbance magnetic fields. SOLUTION: This magnetic sensor is a laminate 10 laminated with a ferromagnetic material layer 12 consisting of an FeCo alloy, an insulating layer 14 consisting of Al2 O3 and a compd. semiconductor layer 16 consisting of GaAs. This compd. semiconductor layer 16 is irradiated circularly polarized light to form polarized electrons. While the compd. semiconductor layer 16 is irradiated with the circularly polarized light, a DC voltage is impressed on the ferroelectric magnetic material layer 12 and the compd. semiconductor layer 16 by a DC power source. When the magnetization direction of the external magnetic field changes, the magnetization direction of the ferromagnetic material layer 12 changes according thereto and the magnetic reluctance between the ferromagnetic material layer 12 and the compd. semiconductor layer 16 changes. This change in the magnetic reluctance is measured by a voltmeter 22.
    • 10. 发明专利
    • MAGNETO-RESISTIVE TRANSDUCER
    • JPH0877519A
    • 1996-03-22
    • JP21484694
    • 1994-09-08
    • FUJITSU LTD
    • KOBAYASHI KAZUOKIKUCHI HIDEYUKIKISHI HITOSHIODAGIRI MITSURU
    • G11B5/39
    • PURPOSE: To improve sensitivity by providing the above transducer with a first ferromagnetic layer which rotate in a magnetic direction, a second ferromagnetic layer which is fixed in the magnetization direction and a third ferromagnetic layer which is magnetostatically coupled to both of the second ferromagnetic layer and a hard ferromagnetic layer. CONSTITUTION: The magnetic lines of force put into and out of the side parts of the hard ferromagnetic layer 26 and the second ferromagnetic layer 25 are mainly put into and out of the side parts of the third ferromagnetic layer 28 when there are no magnetic fields from magnetic recording media. Consequently, the direction of the magnetization M1 of the first magnetic layer 23 is nearly perpendicular to the direction of the magnetization M2 of the second ferromagnetic layer 25 in the sate that the magnetic fields of the magnetic recording media are not impressed and, therefore, the sensitivity to the magnetic fields from the magnetic recording media is improved.