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    • 1. 发明专利
    • STEP HEIGHT MEASURING INSTRUMENT
    • JP2000205810A
    • 2000-07-28
    • JP1124899
    • 1999-01-20
    • YOSHIDA TEKKOSHO KKSAI KENKA
    • TANIGUCHI HIROSHISAI KENKA
    • G01B7/02G01B21/02G01D5/165
    • PROBLEM TO BE SOLVED: To provide a step height measuring instrument which is useful to inspect welding, etc. SOLUTION: This measuring instrument is equipped with 1st and 2nd drawing compass type rods R1 and R2 of equal effective length (a) which are made rotatable by each having one end pivoted on a 1st shaft 1 and a reference base 4 which pivots the other end of the 1st rod R1 rotatably on a 2nd shaft 2 and also has a flat base surface 3. Further, the measuring instrument is equipped with a 1st potentiometer P1 which detects the elevation angle α to the 1st rod R1 and the bottom surface 3 of the reference base 4, a 2nd potentiometer 2 which detects the opening angle β between the 1st and 2nd rods R1 and R2, a calculating circuit part which finds the elevation angle α and opening angle β by inputting the output voltages of the 1st potentiometer P1 and 2nd potentiometer P2 and calculates the step size Y' of a measurement surface S2 that a point atop of the 2nd rod R2 specifies to the reference surface S1 where the reference base 4 is placed by a preprogrammed microcomputer, and a display device which displays the calculated step size Y'.