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2. 发明专利

JPH03245008A METHOD AND APPARATUS FOR MEASURING ANGLE 失效
公开(公告)号：JPH03245008A
公开(公告)日：1991-10-31
申请号：JP4125890
申请日：1990-02-23
申请人： TAKANO HIDEHIKO , AMADA CO LTD
发明人： TAKANO HIDEHIKO , NIWA YOSHIAKI , SENGOKU AKIRA , AOKI TAKAYUKI
IPC分类号： G01B11/26 , B21D5/02 , G06T7/60
摘要： PURPOSE:To measure the inclination angle of a surface to be measured by projecting planar light on one plane to be measured, and picking up the image of a light-ray pattern caused by the planar light with a CCD sensor and the like on planar coordinates. CONSTITUTION:The crossed axes angle of a work W having two planes 1 and 2 as planes to be measured is measured. At this time, an intersection line 3 between the two planes 1 and 2 is made to agree with the X axis. A CCD camera 4 as a vision sensor is provided on the Z axis which is orthogonally intersected with the X axis. The image is picked up with the camera 4 toward an intersection O of both axes X and Z in a field of view 5. The YZ plane is inclined by an angle beta, and this plane is made to be the plane to be illuminated with planar light. The planar light 7 passing an original point O is projected on this plane. The planar light 7 which is emitted from an light emitting device 8 hits the planes to be measured a 1 and 2, and linear light-ray patterns 9 and 10 passing the original point O are formed on both planes. At this time the crossed axes angle between the two planes 1 and 2 can be expressed as the sum of the inclination angles alpha1 and alpha2 of the planes 1 and 2 with respect to the Z axis.

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