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    • 72. 发明专利
    • Detection apparatus for organic trace component
    • 有机跟踪组件的检测装置
    • JP2002367559A
    • 2002-12-20
    • JP2001170784
    • 2001-06-06
    • Mitsubishi Heavy Ind Ltd三菱重工業株式会社
    • DEGUCHI YOSHIHIROFUKUDA NORIHIRODOBASHI SHINSAKU
    • G01N27/62G01N27/64G01N33/00H01J49/10H01J49/40H01J49/42
    • PROBLEM TO BE SOLVED: To provide a detection apparatus and method for organic trace components capable of quick analysis at high sensitivity.
      SOLUTION: The detection apparatus includes, a capillary column 54 serving as a sample introduction means for introducing a sample 51 continuously as a leaking molecular beam 53, a laser beam application means 66 for applying a laser beam 55 to the leaking molecular beam 53 for laser ionization, an ion converging part 56 consisting of a plurality of ion electrodes 56-1 to 3 for converging the molecules ionized, an ion trap 57 for selectively enriching the molecules converged; and a time-of-flight mass spectrometer 60 having ion detectors 59 for detecting ions emitted at predetermined intervals and reflected by reflectrons 58. The voltage of a first end cap electrode 61 which constitutes the ion trap 57 is lower than the voltage of the ion converging part 56 converging the molecules ionized, so that the molecules ionized are accelerated toward the first end cap electrode 61 and efficiently drawn into space in the ion trap 57.
      COPYRIGHT: (C)2003,JPO
    • 要解决的问题:提供能够以高灵敏度快速分析的有机痕量成分的检测装置和方法。 解决方案:检测装置包括:毛细管柱54,用作样品引入装置,用于连续地引入样品51作为泄漏分子束53;激光束施加装置66,用于将激光束55施加到泄漏的分子束53用于激光 离子化,由多个离子电极56-1至3组成的用于会聚离子化分子的离子会聚部分56,用于选择性富集分子的离子阱57收敛; 以及具有用于检测以预定间隔发射并由反射镜58反射的离子的离子检测器59的飞行时间质谱仪60。构成离子阱57的第一端盖电极61的电压低于离子的电压 收敛部分56会聚分子离子化,使得离子化的分子朝向第一端盖电极61加速并有效地拉入离子阱57中的空间。
    • 74. 发明专利
    • Fine particle component analyzer
    • 精细粒子成分分析仪
    • JP2008111757A
    • 2008-05-15
    • JP2006295717
    • 2006-10-31
    • Central Res Inst Of Electric Power IndMitsubishi Heavy Ind Ltd三菱重工業株式会社財団法人電力中央研究所
    • DEGUCHI YOSHIHIROTANAKA NOBUYUKIFURUYA MASAHIROTSUZAKI MASAHARU
    • G01N1/22G01N15/02G01N15/06G01N27/60G01N27/62G01N30/00
    • PROBLEM TO BE SOLVED: To provide a fine particle component analyzer capable of certainly analyzing even a component of relatively low concentration.
      SOLUTION: The fine particle component analyzer 10 includes a sampling device 11 for sampling atmosphere, an electrostatic classifier 12 for classifying and sending a fine particle 2 of nano-meter size, as a target particle diameter, from the sampling gas 1 sampled by the sampling device 11, a concentrating device 15 that adsorbs part of the fine particle 2 sent out from the classifier 12 and sends out the component of the adsorbed fine particle 2, a mass spectrometer 14 of a laser ionization flight time type for analyzing the component of the fine particle 2 from the classifier 12 and the component of the fine particle 2 from the concentrating device 15, and three-way control valves 16A-16C that are switched so as to supply one of the component of the fine particle 2 from the classifier 12 and the component of the fine particle 2 from the concentrating device 15 to the mass spectrometer 14.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:提供即使是相对低浓度的成分也能够可靠地分析的微粒成分分析装置。 解决方案:细颗粒成分分析仪10包括用于取样气体的取样装置11,用于从取样气体1中分选并送出纳米尺寸的微粒2作为目标粒径的静电分级器12 通过采样装置11,吸收从分级器12发出的微粒子2的一部分并送出吸附微粒子2的成分的浓缩装置15,用于分析吸附微粒子2的成分的激光电离飞行时间型的质谱仪14 来自分选机12的细粒子2的成分和来自浓缩装置15的细粒子2的成分,以及三通控制阀16A〜16C,其被切换成将微粒2的成分中的一方从 分选机12和从浓缩装置15到质谱仪14的细粒子2的成分。(C)2008,JPO&INPIT
    • 75. 发明专利
    • Apparatus and method for measuring particulate component in gas
    • 用于测量气体中颗粒成分的装置和方法
    • JP2006071492A
    • 2006-03-16
    • JP2004255986
    • 2004-09-02
    • Central Res Inst Of Electric Power IndMitsubishi Heavy Ind Ltd三菱重工業株式会社財団法人電力中央研究所
    • DEGUCHI YOSHIHIROKAWAZOE KOHEITANAKA NOBUYUKI
    • G01N21/63G01N15/00G01N21/67G01N27/62G01N27/64
    • PROBLEM TO BE SOLVED: To provide an apparatus and a method for measuring a particulate component in a gas which eliminate a gas component and finely analyze the particulate component only.
      SOLUTION: The apparatus is provided with a depressurization chamber 11 comprising a first depressurization chamber 11-1 and a second depressurization chamber 11-2 having the different degree of depressurization, a gas introducing section 13 provided in the first depressurization chamber 11-1 having the high degree of depressurization and introducing the gas containing the particulate component, a separation section 14 for communicating the first depressurization chamber 11-1 having the high degree of depressurization with the second depressurization chamber 11-2 having the low degree of depressurization and separating the introduced gas component 12a and particulate component 12b, a laser light L emitted from a laser apparatus as a plasma conversion apparatus for converting the particulate component 12b introduced into the second depressurization chamber 11-2 having the low degree of depressurization into a plasma, and a photodetector 17 as a detector for measuring the plasma 16 generated by the plasma conversion apparatus 15.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供一种用于测量气体中的颗粒成分的装置和方法,其消除气体成分并仅对颗粒组分进行精细分析。 解决方案:该设备设置有包括第一减压室11-1和具有不同减压程度的第二减压室11-2的减压室11,设置在第一减压室11-1中的气体导入部13, 具有高度减压并引入含有颗粒组分的气体的分离部分14,用于将具有高减压度的第一减压室11-1与具有低减压度的第二减压室11-2连通; 分离引入的气体成分12a和颗粒成分12b,从激光装置发射的激光L作为等离子体转换装置,将引入低压降低的第二减压室11-2中的颗粒成分12b转化为等离子体, 以及作为用于测量血浆16代的检测器的光电检测器17 由等离子体转换装置15擦除。版权所有(C)2006,JPO&NCIPI
    • 76. 发明专利
    • Laser decomposition apparatus and decomposition method therefor
    • 激光分解装置及其分解方法
    • JP2005081259A
    • 2005-03-31
    • JP2003316703
    • 2003-09-09
    • Mitsubishi Heavy Ind Ltd三菱重工業株式会社
    • DEGUCHI YOSHIHIROYAMAURA TSUYOTOSHI
    • A61L9/18B01D53/32B01D53/60B01D53/74B01J19/12H01S3/00
    • PROBLEM TO BE SOLVED: To provide a laser decomposition apparatus and a method therefor capable of decomposing a material to be decomposed such as a harmful substance by means of excited high energy by applying a laser beam of a specified wavelength which excites water vaper to a region containing various kinds of harmful components in order to provide a comfortable environment. SOLUTION: The laser decomposition apparatus 100 is provided with a laser device 102 that applies a laser beam 101 of exciting water vapor, a specified water vapor exciting laser beam 101 is applied to the region 104 where there is the material 103 to be decomposed and the material 103 to be decomposed is decomposed by the water vapor which is turned into the high excited state by irradiation of the laser beam 101. COPYRIGHT: (C)2005,JPO&NCIPI
    • 解决问题:提供一种激光分解装置及其方法,其能够通过施加激发水量的特定波长的激光束,通过激发的高能量分解诸如有害物质等有害物质的分解材料 到含有各种有害成分的区域,以提供舒适的环境。 解决方案:激光分解装置100设置有施加激发水蒸气的激光束101的激光装置102,将特定的水蒸汽激发激光束101施加到区域104,在那里存在材料103 被分解的材料103被通过激光束101的照射变成高激发态的水蒸气分解。(C)2005,JPO&NCIPI
    • 77. 发明专利
    • Photometric apparatus
    • 光学设备
    • JP2005024250A
    • 2005-01-27
    • JP2003186545
    • 2003-06-30
    • Mitsubishi Heavy Ind Ltd三菱重工業株式会社
    • DEGUCHI YOSHIHIRODOBASHI SHINSAKUKOYAMA TOMONORISHINADA OSAMUOTA KAZUHIRO
    • G01N21/65G01N21/64
    • PROBLEM TO BE SOLVED: To provide a photometric apparatus applied to generation gas, or the like in coal gasification.
      SOLUTION: The photometric apparatus comprises a light source 13 for making gas 11 to be measured in a measuring field 10 irradiated with a light 12 of a fixed wavelength, such as a laser beam; a spectrograph 15 for measuring the intensity of each wavelength by Raman scattered light 14 generated from the gas 11 by the radiation of the laser beams 12; a first photodetector 17 for measuring a Mie scattered light 16 generated from dust in the gas 11 by the radiation of the laser beams 12; a second photodetector 19 for measuring fluorescence 18 generated from a hydrocarbon in the gas 11 by the radiation of the light 12; and a data processing means 20 that is a calculation section for calculating the amount of heat generated, the amount of dust, and the amount of hydrocarbon in the gas 11 from the result of the measuring.
      COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:提供一种应用于煤气化中的发电气体等的测光装置。 解决方案:该测光装置包括用于在照射固定波长的光12(例如激光束)的测量场10中制造要测量的气体11的光源13; 用于通过激光束12的辐射从气体11产生的拉曼散射光14测量每个波长的强度的光谱仪15; 第一光电检测器17,用于测量通过激光束12的辐射从气体11中的灰尘产生的三重散射光16; 第二光电检测器19,用于通过光12的辐射测量由气体11中的烃产生的荧光18; 以及数据处理装置20,其是从测量结果计算产生的热量,灰尘量和气体量的烃的量的计算部分。 版权所有(C)2005,JPO&NCIPI