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    • 51. 发明专利
    • Damage predictive diagnosis of reproduction element of magnetic head and control circuit for executing protection operation of record data
    • 用于执行记录数据的保护操作的磁头和控制电路的再现元件的损伤预测性诊断
    • JP2008299979A
    • 2008-12-11
    • JP2007146409
    • 2007-06-01
    • Fujitsu Ltd富士通株式会社
    • AMAMIYA YOSHIHIRO
    • G11B5/455G11B19/04
    • G11B19/048G11B5/40G11B5/455G11B19/041
    • PROBLEM TO BE SOLVED: To improve the reliability of a magnetic recording and playback device by detecting overvoltage by disturbance applying to a reproduction element to thereby expect a future damage of the reproduction element and migrating record data of a recording and reproducing medium used by a magnetic head to another recording and reproducing medium to thereby surely protect the record data when the damage is expected.
      SOLUTION: This control circuit is arranged, which is provided with: a monitor for detecting voltage of the reproduction element of the magnetic head; a comparator for discriminating a threshold of breakdown strength to the reproduction element; and a counter for counting a signal (the number of times of generating ESD and EOS) passing through the comparator. A control circuit is also arranged so as not to use backup of the record data and the magnetic head satisfying a threshold, when reaching the threshold set in the counter.
      COPYRIGHT: (C)2009,JPO&INPIT
    • 解决的问题:为了通过检测对再现元件施加的扰动的过电压来提高磁记录和重放装置的可靠性,从而期望将来的再现元件的损坏和所使用的记录和再现介质的记录数据的迁移 通过磁头到另一个记录和再现介质,从而当预期损坏时可靠地保护记录数据。 解决方案:该控制电路设置有:用于检测磁头的再现元件的电压的监视器; 比较器,用于识别击穿强度的阈值与再现元件; 以及用于计数通过比较器的信号(产生ESD和EOS的次数)的计数器。 控制电路也被设置为当达到设置在计数器中的阈值时不使用记录数据的备份和磁头满足阈值。 版权所有(C)2009,JPO&INPIT
    • 52. 发明专利
    • Test method for data storage device and method of manufacturing data storage device
    • 数据存储设备的测试方法和数据存储设备的制造方法
    • JP2007066126A
    • 2007-03-15
    • JP2005252964
    • 2005-09-01
    • Hitachi Global Storage Technologies Netherlands Bvヒタチグローバルストレージテクノロジーズネザーランドビーブイ
    • NISHIUCHI SHIGETOTAKAHASHI MASARUTSUYAMA MASAFUMINAKAGAWA TAKAHIRO
    • G06F3/06G11B20/18
    • G01R33/1207G11B19/048G11B20/1816G11B2220/2516
    • PROBLEM TO BE SOLVED: To provide a test method for data storage device and a method for manufacturing a data storage device, in which a plurality of data storage devices can be simultaneously connected to a testing device to shorten the test time in operation test thereof.
      SOLUTION: When a plurality of HDDs 8
      1 -8
      4 connected to the testing device 1 receive and execute commands from the testing device 1, whereby the respective operation tests are performed, the testing device 1 executes operation test to another HDD in a waiting time where data exchange between the testing device 1 and, for example, the data storage device HDD8
      1 is rested during execution of the operation test between the testing device 1 and the data storage device HDD8
      1 . The waiting time includes the time until HDD8
      1 becomes command-receivable, the time to end transfer of data, or the time until it can receive the next command. During this waiting time, the testing device 1 issues a command, for example, when HDD8
      2 is command-receivable, and transfers data when data transfer can be performed.
      COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供数据存储装置的测试方法和数据存储装置的制造方法,其中多个数据存储装置可以同时连接到测试装置以缩短操作中的测试时间 测试。

      解决方案:连接到测试设备1的多个HDD 8 8 4 接收并执行来自测试设备1的命令,由此相应的操作测试 在执行操作期间,在测试装置1与例如数据存储装置HDD8 1 之间进行数据交换的等待时间内,测试装置1对另一个HDD执行操作测试 测试设备1和数据存储设备HDD8 1 之间的测试。 等待时间包括直到HDD8 1 变为可接收命令的时间,结束数据传输的时间,或直到接收到下一个命令的时间为止。 在该等待时间期间,测试装置1发出命令,例如当HDD8 2 是可指令接收的时候,并且可以在执行数据传送时传送数据。 版权所有(C)2007,JPO&INPIT