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    • 51. 发明专利
    • METHOD FOR ANALYZING AND TESTING STRUCTURE
    • JP2002214085A
    • 2002-07-31
    • JP2001011023
    • 2001-01-19
    • OHBAYASHI CORP
    • OKANO MOTOYUKITAKEDA ATSUSHI
    • E04B1/00G01M99/00G01N3/20G01M19/00
    • PROBLEM TO BE SOLVED: To grasp the behavior after the maximum yield point of a material showing brittle fracture. SOLUTION: In a method for analyzing a structure, an analytical model is formed in such a state that a structure to be analyzed such as a concrete structure or the like is connected to a dummy structure (step 101). Herein, the structure 1 to be analyzed and the dummy structure 2 are mutually connected through a rigid element so that analyzing external force form an aspect of analysis or the external force accompanied by forcible deformation is distributed in proportion to rigidity. The dummy structure is constituted so as to hold positive rigidity of which the absolute value is the same as or more than that of the negative rigidity after the maximum yield point of the structure to be analyzed over an analyzing range. When the analytical model is formed, analyzing external force is applied to the analytical model or forcible deformation is applied thereto to analyze the load-deformation characteristics of the structure 1 to be analyzed.