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    • 41. 发明专利
    • LATERAL PLATE THERMOMETER IN FURNACE
    • JPH06117939A
    • 1994-04-28
    • JP27038092
    • 1992-10-08
    • NIPPON STEEL CORP
    • MATSUMOTO SHUNJITAKEUCHI TAMAYUKI
    • G01J5/00G01J5/02G01J5/10
    • PURPOSE:To obtain a cheap plate thermometer in which scanning is allowed at a measuring position and relatively low temperature lower than 600 deg.C can be measured while suppressing failure. CONSTITUTION:A radiation thermometer 35 (in a detecting unit 30) is installed on the outside of a furnace in order to measure the temperature of a band steel 1 placed in the furnace directly through a seal glass 40. The radiation thermometer is secured to the shaft of a drive unit 20 and supported on the furnace. The drive unit is then driven to rock the radiation thermometer itself thus scanning the detecting shaft in the lateral direction of the band steel. Detecting shaft of the radiation thermometer is normally secured to the center of the band steel and scanning is performed upon turn ON of a switch PB1. Scanning range is set within + or -45 deg.. Water cooling pipe is laid along inner peripheral wall of the furnace and the inner surface of seal glass is subjected to N2 purging. The radiation thermometer and the drive unit are provided with a water cooling mechanism and an air purge mechanism.
    • 42. 发明专利
    • POLISHING METHOD AND DEVICE FOR PIN SAMPLE
    • JPH11123647A
    • 1999-05-11
    • JP30960097
    • 1997-10-24
    • NIPPON STEEL CORP
    • TOYAMA HARUYUKIMATSUMOTO SHUNJIHONDA TOSHIOSUGAWARA MASAHIRO
    • B24B21/02
    • PROBLEM TO BE SOLVED: To quickly polish a pin sample without affecting component analyzing accuracy by arranging a wear plate in its slant attitude in the axial direction of the pin sample, and reciprocating the wear plate in the direction for running along a traveling polishing surface of a polishing belt. SOLUTION: A wear plate 8 is arranged in a position opposed to a pin sample A by sandwiching a polishing belt 1, and this wear plate 8 is arranged so that an inclined part of a Z shape 82 inclines in the axial direction of the pin sample A. A traveling polishing surface of the polishing belt 1 travels downward from above, and the rotational direction of the pin sample A and the traveling direction of the polishing belt 1 are set in the inverse direction. The pin sample A also operates so as to push the axial radial direction at a right angle against the traveling polishing surface of the polishing belt 1. The wear plate 8 vertically reciprocates so that the pin sample A is pushed against a part corresponding to a width L1 of an oblique part of the Z shape 82, and a polishing surface of the pin sample A is uniformly polished in a width of the Z shape 82.