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42. 发明专利

JPH03266810A TWO-BEAM SCANNING TYPE OPTICAL DEVICE 失效
公开(公告)号：JPH03266810A
公开(公告)日：1991-11-27
申请号：JP6787290
申请日：1990-03-16
申请人： HITACHI KOKI KK
发明人： OSHIMA MINORU , SAITO SUSUMU , ISHIKAWA MASAMI , OGAWA TSUKASA , OBARA KAZUTOSHI
IPC分类号： G02B26/10 , B41J2/44 , B41J2/47 , H04N1/047 , H04N1/113 , H04N1/12 , H04N1/19 , H04N1/191
摘要： PURPOSE:To improve the reliability of two-beam scanning technique by providing a beam intensity detecting means for a light source, a beam intensity detecting means for a scanning beam, and a beam intensity detecting means for a beam interval control part. CONSTITUTION:This device has the beam intensity detecting means for the light source, the intensity detecting means for the scanning means, and the beam intensity detecting means for the beam interval control part. A signal 55 is generated by adding a front passing signal 19a and a rear passing signal 19b from an optical scan detector 8 and this signal is used to check the power of the two beams 11a and 11b respectively. Similarly, a signal is generated by adding beam position signals 80 and 81 of an optical position detector 10 to check the two beams 11a and 11b. Further, a current, temperature, and characteristics in deterioration mode are utilized as to the life of a semiconductor laser and a current limiter is provided to check the beam power signal after limitation. Those three kinds of detection are performed to classify three blocks of abnormality, i.e. the abnormality of a light generating source, the contamination of a lens system, the beam deviation of a movable reflector, and the contamination of an optical deflector and an Ftheta lens, thereby preventing the reliability from deteriorating.

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