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    • 38. 发明专利
    • TREATMENT OF WASTE GAS
    • JPH10128069A
    • 1998-05-19
    • JP29394296
    • 1996-11-06
    • BABCOCK HITACHI KK
    • FUJITA KAZUNORI
    • B01D53/34B01D46/02B01D53/54B01D53/86B01D53/94
    • PROBLEM TO BE SOLVED: To prevent the deterioration of a catalyst in a functional bag filter by blowing an alumina or silica fine particle to an upstream flue of a bag house, in which the functional bag filter carrying an activated material for removing a harmful component is housed. SOLUTION: A waste gas of a municipal waste incineration furnace is introduced through the flue 9, and at first, slaked lime is blown into the flue 9 from a slaked lime storage tank 5 by a powder feed device 4. Next, an ammonia water is blown into the flue 9 from an ammonia water storage tank 6 by a pump 7. Finally, the alumina or silica fine particle is blown into the flue 9 from an alumina of silica fine particle storage tank 3 by the powder feed device 4. The waste gas is introduced into the bag house 1 and a harmful material such as smoke dust, hydrogen chloride is removed by the activated material contained in the functional bag filter 2 and the slaked lime blown into the flue 9. The smoke dust, the slaked lime and the alumina or silica fine particle stuck to the functional bag filter 2 are stripped off and discharged to a smoke dust storage tank 8 from a hopper part of the bag house 1.
    • 39. 发明专利
    • REMOVAL OF AND DEVICE FOR HARMFUL SUBSTANCE FROM EXHAUST GAS IN SEMICONDUCTOR MANUFACTURING
    • JPH1085555A
    • 1998-04-07
    • JP26529796
    • 1996-09-12
    • KANKEN TECHNO KK
    • IMAMURA KEIJI
    • B01D53/34B01D53/54B01D53/68B01D53/77H01L21/304
    • PROBLEM TO BE SOLVED: To reduce the volume of generated PFC to eliminate its harmful effects and at the same time, inhibit the high temperature corrosion attributed to a byproduct F2 by heating a water-insoluble and heat-decomposable gas contained in an exhaust gas generated from the semiconductor cleaning process after the removal by water wash of a hydrolytic gas contained in the exhaust gas and removing by water wash the generated metal corrosive and hydrolytic gas. SOLUTION: First, an exhaust gas generated from the semiconductor cleaning process using a semiconductor manufacturing device is diluted to a specified concentration with an inert gas. Then the diluted exhaust gas is introduced into an inlet scrubber 8 to spray atomized cleaning water from a shower nozzle 8a. Consequently, a hydrolytic gas and/or a water-soluble gas are removed by water wash through a gas and liquid contact. After that, the water-washed exhaust gas is guided to a heat-reaction part 2 to be heated with a heater 5, and as a result, a water-insoluble, heat-decomposable gas is thermally decomposed. Next, the decomposed gas is guided to an outlet scrubber 9 to bring the decomposed gas to come into contact with a cleaning water from a shower nozzle 9a. Thus a metal-corrosive and hydrolytic gas and/or a water-soluble gas which are contained in a byproduct gas generated by heat decomposition are removed by water wash. The device is permanently used after the removal of the corrosive component.