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    • 102. 发明专利
    • OPTICAL PICKUP AND OPTICAL INFORMATION REPRODUCING DEVICE USING THE SAME
    • JP2002269795A
    • 2002-09-20
    • JP2001071383
    • 2001-03-14
    • HITACHI LTDHITACHI MEDIA ELECTRON KK
    • IZUMI KATSUHIKOONISHI KUNIKAZUSASAKI TORUMATSUDA YUTAKA
    • G11B7/135
    • PROBLEM TO BE SOLVED: To provide an optical system such as reducing the P-polarization component of a return light to a semiconductor laser with the simple constitution, when the dependency of transmissivity polarization, the phase difference, etc., exist in optical components such as a dichroic half prism, etc., as to an optical pickup, and to reduce further the change of detecting light quantity by a photodetector even to the change of disk retardation. SOLUTION: In the optical pickup provided with a polarization element for converting the polarized state of a light beam emitted from the semiconductor laser, the photodetector for detecting the light beam reflected from an optical disk, and a branching optical element for branching the going path optical system including the semiconductor laser and the returning path optical system including the photodetector, the polarization element is arranged in the optical path between the semiconductor laser and the branching optical element, and simultaneously the angle θ between the polarizing direction of the light beam emitted from the semiconductor laser and the optical axis of the polarization element, or the phase difference α between the transmitting polarization light in the direction of optical axis of the polarization element and the transmitting polarization light in the axial direction perpendicular thereto is arranged to set to the prescribed value.
    • 109. 发明专利
    • PHASE DIFFERENCE MEASUREMENT METHOD AND PHASE DIFFERENCE MEASURING DEVICE OF OPTICAL PART USING THE SAME
    • JP2000002652A
    • 2000-01-07
    • JP17076498
    • 1998-06-18
    • HITACHI LTD
    • NAKAO TAKESHIONISHI KUNIKAZU
    • G01J9/00G01M11/02G01N21/23
    • PROBLEM TO BE SOLVED: To specify the phase difference and the direction of an optical axis with a simple optical system, by measuring the elliptical rate of a light beam through a sample and the angle between an elliptical long axis and incidence straight-line polarization. SOLUTION: A light beam emitted from a light source 1 is propagated in Z-axis direction, and transmission light of an analyzer 2 is converted into straight-line polarization in X-axis direction. The transmission light of the analyzer 2 generally becomes an elliptical polarization with a long axis in the direction of an angle of θ=θmax for an incidence straight-line polarization direction (X-axis direction). Then, by rotating an analyzer 4 around a light axis (Z axis) and measuring the output of a photo detector 5, inclination angles θmax and θmin of the long and short axes for the incidence polarization direction (X axis) are obtained from light intensity Imax and Imin corresponding to the long and short axes of elliptical polarization and the rotary angle of the analyzer 4. By using these values, a phase difference Δ of a sample 3 and an angle formed by the sample 3 and the incidence polarization (namely, an azimuth angle α of the optical axis of the sample 3) can be calculated.