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    • 92. 发明专利
    • RADIATION ANALYZING INSTRUMENT
    • JPS61193057A
    • 1986-08-27
    • JP3290485
    • 1985-02-22
    • MITSUBISHI ELECTRIC CORP
    • UMADONO SHINJIYUKIMARU MASAKITOMOTA TOSHIMASA
    • G01N9/24G01N23/02G01N23/203
    • PURPOSE:To determine easily element components by irradiating radiation on a material to be measured, measuring the photon energy of the back scattered rays and making four arithmetic operations of the mass absorption coefft. of the incident photons, the mass absorption coefft. of the back scattered rays, etc. CONSTITUTION:The material which is constituted of, for example, C, H and O and flows in a piping 102 is measured. gamma/X-rays are radiated from a radiation source 1 and are detected by a pulse type detector 2. The radiations of the high and low photon energies are made incident from the radiation source 1 and the energy of the corresponding back scattered photons is supplied to the 1st and 2nd pulse height discriminators 4a, 4b to discriminate the photons. The pulse outputs are counted by the 1st and 2nd counting rate meters 5a, 5b. The four arithmetic operations of the radiation intensity, the mass absorption coefft. of the incident photons, the mass back scattering coefft. of the incident light and the mass absorption coefft. of the back scattered photons are made by a calculator 6, by which the mass components of the respective elements are determined. Since the back scattered rays are measured in the above-mentioned manner, the components elements are determined by a measuring system fewer by one than the number of the constituting elements. The need for the arithmetic processing is thus eliminated.