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    • 93. 发明专利
    • Specimen analyzer and computer program
    • 样本分析仪和计算机程序
    • JP2009243978A
    • 2009-10-22
    • JP2008088827
    • 2008-03-28
    • Sysmex Corpシスメックス株式会社
    • IKEDA MINORU
    • G01N15/14G01N21/47G01N21/64G01N33/48
    • G01N35/00732G01N2015/008G01N2015/0084G01N2015/1486G01N2015/1488G01N2035/00891
    • PROBLEM TO BE SOLVED: To provide a specimen analyzer for accurately analyzing various kinds of specimens without changing measurement conditions according to the specimens, and a computer program therefor. SOLUTION: A specimen containing a plurality of kinds of particles is analyzed. Quantization information is obtained which is quantized into a prescribed number of bits representing the character of the plurality of particles, First and second sets of data for classification are generated from the obtained quantization information. The particles in the specimen are classified into a plurality of kinds of particles based on either of the sets of generated data for classification and on classification conditions stored in a classification condition storing part. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:提供一种用于在不改变测量条件的情况下准确地分析各种样本的样本分析仪及其计算机程序。 解决方案:分析含有多种颗粒的样品。 获得量化为表示多个粒子的字符的规定位数的量化信息,从获得的量化信息生成用于分类的第一和第二组数据。 基于存储在分类条件存储部分中的用于分类的生成数据集合和分类条件中的任一个,将样本中的粒子分类为多种粒子。 版权所有(C)2010,JPO&INPIT