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    • 7. 发明专利
    • Nonaqueous electrolyte secondary battery
    • 非电解电解质二次电池
    • JP2005310662A
    • 2005-11-04
    • JP2004128614
    • 2004-04-23
    • Toshiba Corp株式会社東芝
    • MATSUMOTO KOICHIENDO SHOTASATO ASAKOSATO KAZUYA
    • H01M10/05H01M4/133H01M4/587H01M4/02H01M4/58H01M10/40
    • Y02E60/122
    • PROBLEM TO BE SOLVED: To provide a nonaqueous electrolyte secondary battery having a large initial capacity and a long charge/discharge cycle lifetime.
      SOLUTION: In this nonaqueous electrolyte battery having a positive electrode, a negative electrode containing a mesophase pitch graphite material, and a nonaqueous electrolyte. The negative electrode satisfies the following formula 1 (0.001 ≤ A
      1 /B
      1 ≤0.003) and has a density of 1.3-1.75 g/cm
      3 . In this formula, A
      1 represents a negative electrode density increased quantity (g/cm
      3 ) when the line pressure of a room temperature press using a roll with a diameter of 180 cm is increased from 20 to 180 Kg/cm step by step, while B
      1 is 160 kg/cm as the line pressure change quantity of the room-temperature press.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 解决的问题:提供具有大的初始容量和长的充放电循环寿命的非水电解质二次电池。 解决方案:在具有正极的非水电解质电池中,含有中间相沥青石墨材料的负极和非水电解质。 负极满足下式1(0.001≤A 1 / B 1 ≤0.003),密度为1.3-1.75g / cm 3 SP>。 在该式中,当使用直径为180°的辊进行室温加压的管线压力时,A 1 表示负极密度增加量(g / cm 3 SP 3) cm作为室温压机的管路压力变化量,分别从20kg / cm 2增加到180kg / cm 2,而SB <1> SB = 160kg / cm 2。 版权所有(C)2006,JPO&NCIPI
    • 10. 发明专利
    • METHOD FOR INSPECTING ALIGNER
    • JP2001230179A
    • 2001-08-24
    • JP2000036690
    • 2000-02-15
    • TOSHIBA CORP
    • SATO KAZUYAINOUE SOICHI
    • H01L21/027G01N21/956G03F7/20
    • PROBLEM TO BE SOLVED: To specify the change in light transmission of a projection optical system depending upon the route of light. SOLUTION: A light radiated from an illumination optical system 1 is repeated by a transparent part and a shielding part in a limited period, introduced to a photomask 3 formed of a pattern by an optical member having a light transmission pattern shielded by a shielding region at the periphery by a diffraction grating pattern in which a plurality of ratios of the transparent parts and the shielding parts are given. Then, a diffracted light passed through the mask 3 is radiated to the projection optical system 4 to transfer the pattern onto a wafer 5. Thus, a change in the transmission depending on the route of the light of the system 4 is measured based on the pattern image of the diffracted light transferred onto the wafer 5. In this case, the mask 3 and the wafer 5 are pattern transferred in a non-conjugate state with respect to the system 4.