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1. 发明专利

JPH09283000A FUSE STRUCTURE AND CONNECTING SOCKET 失效
公开(公告)号：JPH09283000A
公开(公告)日：1997-10-31
申请号：JP11208096
申请日：1996-04-09
申请人： SONY TEKTRONIX CORP
发明人： ONOZAWA TOSHIHIKO , YASU JUNICHI , HIDAKA TOSHIAKI , MUROFUSHI TATSUYA
IPC分类号： H01H85/08 , H01H85/046 , H01H85/20 , H01H85/56
摘要： PROBLEM TO BE SOLVED: To reduce the generation of inductance of a fuse. SOLUTION: A first and a second connecting terminals of a fuse structure 10 are electrically connected to an input side 24a or an output side 24b of a conduction passage. A first and a second melting passages 16, 18 are provided on first and a second main surfaces of an insulating thin plate 14 opposite to each other. The first and the second melting passages 16, 18 are connected to each other at an end 17 of the insulating thin plate 14, and while connected to the first and the second terminals. At this stage, magnetic fluxes generated by the current flowing in the first and the second melting passages 16, 18 are offset with each other so as to reduce the generation of inductance.

2. 发明专利

JPH08308093A CIRCUIT BREAKER APPARATUS FOR HEAVY CURRENT 失效
公开(公告)号：JPH08308093A
公开(公告)日：1996-11-22
申请号：JP12702495
申请日：1995-04-27
申请人： SONY TEKTRONIX CORP
发明人： MUROFUSHI TATSUYA , KATO KATSUHISA , ONOZAWA TOSHIHIKO , MATSUDA SHUNICHI
IPC分类号： H02H3/093 , H02H7/20 , H03K17/12
摘要： PURPOSE: To equalize a current flowing into a plurality of semiconductor elements connected in parallel. CONSTITUTION: Each output current path of a plurality of IGBT 10, 12 is inserted in parallel to a current path of a load 12. Upon detection of a current in the current path of load higher than the predetermined current, a resistor 22, a differential amplifier 24 and a comparator 26 change the output signal condition. Moreover, an amplifier 34 receives an output signal of the comparator 26 via a delay circuit 28 and an optical coupler 30 to control the gate of IGBT via resistors 40 and 42. When a current flowing into the particular IGBT increases, a gate current thereof also increases and thereby voltage drop of the resistor becomes high, increasing an inverse bias. Therefore, a current flowing to the relevant IGBT decreases. Meanwhile, when a current flowing into the particular IGBT reduces, a gate current also reduces, lowering the voltage drop of resistor and bringing about forward bias. Therefore, the current flowing into the relevant IGBT increases. Accordingly, a current flowing into a plurality of IGBT is balanced.

3. 发明专利

JPH07174813A ELEMENT TESTING METHOD 失效
公开(公告)号：JPH07174813A
公开(公告)日：1995-07-14
申请号：JP34467893
申请日：1993-12-21
申请人： SONY TEKTRONIX CORP
发明人： KATO KATSUHISA , ONOZAWA TOSHIHIKO , EBISAWA AKIRA , USUDA KOICHI
IPC分类号： G01R31/26
摘要： PURPOSE:To recognize the contact condition of terminals of an element to be tested, and surely carry out a characteristic test by applying prescribed voltage to terminals for a signal channel and testing whether the detected voltage is the prescribed voltage or not. CONSTITUTION:Each terminal of an insulated gate bipolar transistor(IGBT) 10, an element to be tested, is so put as to be brought into contact with a terminal of a testing apparatus. Electric continuity of an emitter fourth terminal (a terminal for a signal channel) 22 and a gate return terminal 26 is checked. In a processing apparatus 52, a voltage generating circuit 32 supplied prescribed voltage to the terminal 26 and at the same time, a differential amplifier 44 controls as to amplify only the voltage of an input terminal connected to the terminal 22 of a resistor 34. When the value computed from the output signal of an ADC (A/D converter) 46 corresponds to the prescribed voltage supplied to the terminal 26, the terminals 26, 22 are electrically continued. When the value does not corresponds to the voltage, they are not electrically continued and the abnormality is displayed. Successively, following the processing procedure stored in the apparatus 52, prior testing is carried out to check the contact condition of each terminal of the IGBT 10 with each corresponding terminal.

4. 发明专利

JP2000002757A DATA.PATTERN GENERATOR 失效
公开(公告)号：JP2000002757A
公开(公告)日：2000-01-07
申请号：JP10098499
申请日：1999-04-08
申请人： SONY TEKTRONIX CORP
发明人： TAKAHASHI HISAO , ONOZAWA TOSHIHIKO
IPC分类号： H04N17/00 , G01R31/3183 , H03K5/156
摘要： PROBLEM TO BE SOLVED: To generate a data pattern having a desirable jitter in an edge in an optional position. SOLUTION: A data.pattern.memory 10 generates a bsic data.pattern A. The data.pattern A passes through an LPF 16 to be transformed into a rounded basic data.pattern A'. An edge control signal B output by an edge control circuit 12 is compared with the data.pattern A' to generate a jitter data.pattern C. A multiplexer 20 switches for output the data.pattern A with the data.pattern C in response to a gate signal D from a gate.pattern.memory 14 so as to generate a data.pattern Z having a desirable jitter in an optional edge.

5. 发明专利

JPH08330183A CAPACITOR 失效
公开(公告)号：JPH08330183A
公开(公告)日：1996-12-13
申请号：JP15675595
申请日：1995-05-31
申请人： SONY TEKTRONIX CORP
发明人： YASU JUNICHI , ONOZAWA TOSHIHIKO , MUROFUSHI TATSUYA
IPC分类号： H01G4/224 , H01G2/00 , H01G4/228
摘要： PURPOSE: To provide a capacitor in which the inductance is reduced at the terminal. CONSTITUTION: First and second terminals 12, 14 are made of a planar body and abutted against the major surfaces of second planar bodies 12, 14 through an insulator 13. Currents flowing into the first and second terminals, i.e., the first and second planar bodies 12, 14, have substantially identical magnitude and inverted phase. The field induced at respective terminals can be offset by abutting the major surfaces of first and second planar bodies 12, 14 through the insulator 13 and thereby the inductance can be reduced at the terminal of capacitor.

6. 发明专利

JPH07142976A METHOD FOR REDUCING NOISE 失效
公开(公告)号：JPH07142976A
公开(公告)日：1995-06-02
申请号：JP31430193
申请日：1993-11-19
申请人： SONY TEKTRONIX CORP
发明人： KATO KATSUHISA , ONOZAWA TOSHIHIKO , MUROFUSHI TATSUYA
IPC分类号： H03K17/16
摘要： PURPOSE:To reduce noises generated in a wiring line which connects a load and a peripheral circuit when a high speed signal is supplied to the load by folding back one of the two wiring lines near the input part of a differential amplifier and reducing the area required to be surrounded by the wiring line. CONSTITUTION:A wiring line 16 from a gate terminal G is folded back near the part connected to a coaxial cable being an input part 14. It is connected to the coaxial cable along a wiring line 18 through near an element to be measured 10. Each wiring line is shown by 20, 22, and 24 in the Figure. The smaller area surrounded by the element 10 and the wiring lines 16, 18, 20, 22, and 24 is required than the area surrounded by the conventional element to be measured and the wiring line. In this case, the wiring line 16 is folded back near the input part 14. Similarly, the wiring line 18 may be folded back near the input part 14. The wiring lines 16 and 22 can be bifilar wound.

7. 发明专利

JPH09237702A RESISTANCE BODY STRUCTURE 失效
公开(公告)号：JPH09237702A
公开(公告)日：1997-09-09
申请号：JP6931896
申请日：1996-02-29
申请人： SONY TEKTRONIX CORP
发明人： YASU JUNICHI , ONOZAWA TOSHIHIKO
IPC分类号： H01C1/02 , H01C17/00
摘要： PROBLEM TO BE SOLVED: To provide a resistance body structure of a small inductance at a low cost. SOLUTION: A central conductor 22 has a first connecting terminal 22a at its one end. A second connecting terminal 26a is provided near one end part 26b of a central conductor 22 through an insulating layer. An axial resistor 54 is electrically connected to the second connecting terminal 26a at its one end and the other end is electrically connected to the other end of the central conductor 22. At that time, when the axial resistor 54 is arranged near and in parallel with the central conductor 22, an inductance can be effectively reduced.

8. 发明专利

JPH07294592A ELEMENT CHARACTERISTIC TESTING DEVICE 失效
公开(公告)号：JPH07294592A
公开(公告)日：1995-11-10
申请号：JP11189194
申请日：1994-04-28
申请人： SONY TEKTRONIX CORP
发明人： KATO KATSUHISA , ONOZAWA TOSHIHIKO , MUROFUSHI TATSUYA
IPC分类号： G01R31/26 , H01L21/66 , H01L29/78
摘要： PURPOSE:To provide an element characteristic testing device which is less affected by the contact resistance between contact terminals. CONSTITUTION:The device is provided with a first contact terminal 28 which is in contact with a first terminal 16 which is one terminal of the main current path of an element 10 to be tested and where a main current flows to the first terminal 16, a second contact terminal 22 which is in contact with a second terminal 14 which is the other terminal of the main current part of the element 10 to be tested and where the main current flows, a third contact terminal 18 which is in contact with a third terminal 12 which is the control terminal of the element 10 to be tested and where a control current flows, a fourth contact terminal 26 which is in contact with the second terminal 14 of the element 10 to be tested and where a control current flows, and a control signal source 32 which is connected between the third and fourth contact terminals 18 and 26, thus preventing and erroneous voltage due to the large current of the main current path and the contact resistance of the contact terminal from being generated.

9. 发明专利

JPH08308092A HIGHLY VOLTAGE-RESISTANT CIRCUIT BREAKER APPARATUS 失效
公开(公告)号：JPH08308092A
公开(公告)日：1996-11-22
申请号：JP12702395
申请日：1995-04-27
申请人： SONY TEKTRONIX CORP
发明人： MUROFUSHI TATSUYA , KATO KATSUHISA , ONOZAWA TOSHIHIKO , MATSUDA SHUNICHI
IPC分类号： H02H3/093 , H02H7/20 , H03K17/10
摘要： PURPOSE: To prevent unbalance of voltage to be applied to each transistor by saturating all of a plurality of transistors connected inseries when an excessive current flows due to the short circuit of a load. CONSTITUTION: A couple of IGBT 10, 14 of which current paths of the emitter and collector are connected in series is inserted into a current path of a load 20. Capacitors 12, 16 are connected between the collector and emitter of these IGBT. When an excessive current flows, if one IGBT is saturated while the other IGBT is not saturated, a current flows into the capacitor connected in parallel to the saturated IGBT and a total current flows into unsaturated IGBT to saturate it. Therefore, the voltage to be applied to each IGBT is never unbalanced.

10. 发明专利

JPH07280838A PROBE UNIT 失效
公开(公告)号：JPH07280838A
公开(公告)日：1995-10-27
申请号：JP9048694
申请日：1994-04-04
申请人： SONY TEKTRONIX CORP
发明人： KATO KATSUHISA , ONOZAWA TOSHIHIKO , MUROFUSHI TATSUYA , NABESHIMA TAKANARI
IPC分类号： G01R1/067 , G01R13/20
摘要： PURPOSE:To provide a probe unit having good signal transmission characteristics and excellent in durability, machinability, and handling performance at low cost. CONSTITUTION:The probe unit comprises a parallel circuit of a first resistor Rp and a first capacitor Cp having one ends connected with the tip of a probe, a second resistor R1 having one end connected with the other end of the parallel circuit, a coaxial cable 18 having a characteristic impedance substantially equal to the resistance of a second resistor R1 and connected with the other end of the second resistor R1, and a capacitor C1 connected between one end of the second resistor R1 and a ground terminal, wherein the resistivity of the central conductor in the coaxial cable 18 is set as low as 1OMEGA/m or less.

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