专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2008216325A Compensating layer optical characteristic evaluation method and compensating layer optical characteristics evaluation system 审中-公开
标题翻译：补偿层光学特性评估方法和补偿层光学特性评估系统
公开(公告)号：JP2008216325A
公开(公告)日：2008-09-18
申请号：JP2007049916
申请日：2007-02-28
申请人： Nitto Denko Corp , 日東電工株式会社
发明人： YAMAGATA KAZUTO , NAKANO SHUSAKU , KAJIMA TAKESHI , RINNAI RIE , NISHIMORI TOSHIMASA , SATO MASAYO , MAIKAWA HIDETOSHI
IPC分类号： G02B5/30
CPC分类号： G01N21/211 , G02B5/3083
摘要： PROBLEM TO BE SOLVED: To provide a compensation layer characteristic evaluation method capable of exactly and accurately evaluating the optical characteristics of a compensation layer without peeling the compensation layer from an optical film body, namely, without giving rise to the destruction and optical characteristic change of the compensation layer, or a compensation layer optical characteristic evaluation system which can be used for the method.
SOLUTION: The compensation layer characteristic evaluation method for evaluating the optical characteristics of the compensation layer in an optical film constituted by laminating at least a polarizer and the compensation layer comprises an optical characteristic data preparation step, an ellipticity measurement step of measuring the ellipticity of the polarized light of an optical film sample, and an optical characteristic data extraction step of extracting the data coinciding with or approximating to the ellipticity of the polarized light measured from the data prepared in the optical characteristic data preparation step.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种补偿层特性评估方法，其能够准确且准确地评估补偿层的光学特性，而不会从光学膜体剥离补偿层，即不会引起破坏和光学补偿层的特性变化，或者可以用于该方法的补偿层光学特性评价系统。解决方案：用于评估由至少层合至少偏振器和补偿层构成的光学膜中的补偿层的光学特性的补偿层特性评估方法包括光学特性数据准备步骤，椭圆度测量步骤，以及光学特性数据提取步骤，从光学特性数据准备步骤中准备的数据测量出的与偏振光的椭圆率一致或近似的数据提取步骤。版权所有（C）2008，JPO＆INPIT

IPRDB

热门服务

关于我们

友情链接

联系方式