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1. 发明授权

EP3381045B1 IMPROVED ION MIRROR AND ION-OPTICAL LENS FOR IMAGING 有权
公开(公告)号：EP3381045B1
公开(公告)日：2024-10-16
申请号：EP16869126.9
申请日：2016-11-21
IPC分类号： H01J49/40 , H01J49/06
CPC分类号： H01J49/406 , H01J49/067

2. 发明授权

EP3204961B1 GROUPING AMPLITUDES OF TOF EXTRACTIONS TO DETECT CONVOLUTION DUE TO RESOLUTION SATURATION 有权
公开(公告)号：EP3204961B1
公开(公告)日：2024-08-21
申请号：EP15848310.7
申请日：2015-09-21
IPC分类号： H01J49/40 , H01J49/00 , G01N27/62 , H01J49/04 , H01J49/26 , H01J49/28
CPC分类号： H01J49/0036 , H01J49/40 , G01N27/62

3. 发明公开

EP4374415A1 MASS SPECTROMETER FOR GENERATING AND SUMMING MASS SPECTRAL DATA 审中-实审
公开(公告)号：EP4374415A1
公开(公告)日：2024-05-29
申请号：EP22744814.9
申请日：2022-07-19
申请人： Micromass UK Limited
发明人： GREEN, Martin
IPC分类号： H01J49/00 , H01J49/40
CPC分类号： H01J49/0027 , H01J49/40

4. 发明公开

EP4354487A1 TIME-OF-FLIGHT MASS SPECTROMETER AND TIME-OF-FLIGHT MASS SPECTROMETRY 审中-实审
公开(公告)号：EP4354487A1
公开(公告)日：2024-04-17
申请号：EP21945082.2
申请日：2021-06-09
申请人： Shimadzu Corporation
发明人： MIYAZAKI, Yuta , OSHIRO, Tomoyuki
IPC分类号： H01J49/00 , H01J49/40
CPC分类号： H01J49/40 , H01J49/00
摘要： A mode of TOFMS according to the present invention includes flight space formation electrodes (11, 12) configured to form a flight space for separating ions derived from a component contained in a sample according to a m/z, an ion detection unit (13) configured to detect ions that have flown in the flight space, voltage switching units (4, 2) configured to switch a voltage to be applied to the flight space formation electrode from a first voltage for flying ions of a first polarity to a second voltage for flying ions of a second polarity at a given switching timing, ion information acquisition units (30, 32) configured to obtain a time of flight during which the ions fly in the flight space or a m/z of the ions based on a detection result of the ions of the second polarity obtained by the ion detection unit after the voltage has been switched by the voltage switching unit, a correction information storage unit (31) configured to store correction information related to a deviation in time of flight or a m/z associated with an elapsed time from the switching timing, and a correction unit (33) configured to correct the flight time or the m/z obtained by the ion information acquisition unit according to an elapsed time from the switching timing when the detection result of the ion is obtained using the correction information stored in the correction information storage unit.

5. 发明授权

EP3306640B1 TIME-OF-FLIGHT MASS SPECTROMETER 有权
公开(公告)号：EP3306640B1
公开(公告)日：2024-04-10
申请号：EP17202314.5
申请日：2011-12-20
发明人： Kinugawa, Tohru , Furuhashi, Osamu
IPC分类号： H01J49/40 , G01N27/62

6. 发明公开

EP4268263A1 MASS AND/OR ION MOBILITY SPECTROMETRY 审中-实审
公开(公告)号：EP4268263A1
公开(公告)日：2023-11-01
申请号：EP21835817.4
申请日：2021-12-23
申请人： Micromass UK Limited
发明人： WILDGOOSE, Jason , GREEN, Martin , LANGRIDGE, David , GILES, Kevin , UJMA, Jakub
IPC分类号： H01J49/40 , G01N27/622

7. 发明公开

EP4264657A1 COMPACT LASER ION SOURCE APPARATUS AND METHOD 审中-实审
公开(公告)号：EP4264657A1
公开(公告)日：2023-10-25
申请号：EP21908194.0
申请日：2021-12-21
申请人： Atomic Energy of Canada Limited/ Énergie Atomique du Canada Limitée
发明人： CHAUDHURI, Ankur , LI, Liqian , JOHNSTON, James , CUSICK, Martin-lee
IPC分类号： H01J49/40 , H01J49/06

8. 发明授权

EP2880438B1 SYSTÈME D'ANALYSE DE GAZ COMPRENANT UN SPECTROMÈTRE DE GAZ MUNI D'UN MICRO-RÉFLECTRON 有权
公开(公告)号：EP2880438B1
公开(公告)日：2023-09-27
申请号：EP13745095.3
申请日：2013-08-05
发明人： DURAFFOURG, Laurent , ANDREUCCI, Philippe , TASSETTI, Charles-Marie , COLINET, Eric , PUGET, Pierre , WHITING, Joshua , STEVENS, Peter Thomas , PETITJEAN, Mélanie
IPC分类号： G01N30/72 , H01J49/40

9. 发明公开

EP4089713A1 HYBRID MASS SPECTROMETRY APPARATUS 审中-实审转让
公开(公告)号：EP4089713A1
公开(公告)日：2022-11-16
申请号：EP21173705.1
申请日：2021-05-12
申请人： Analytik Jena GmbH
发明人： Lehmann, Roland , Kalinitchenko, Iouri
IPC分类号： H01J49/00 , H01J49/40 , H01J49/42
摘要： The present invention concerns a mass spectrometry apparatus (100) for analyzing an analyte sample, comprising an ion source (1) from which a quantity of analyte ions from the analyte sample may be sourced for providing an ion beam (7,11), a mass analyzer (9) serving to filter the analyte ions of the ion beam (7,11) based on their mass-to-charge ratio, a first detector unit (A) for analyzing the ions of the ion beam (7,11), and a second detector unit (B) being based on the time-of-flight principle and comprising a second detector (15) for analyzing the ions of the ion beam (7,11). The present invention also concerns a method for analyzing an analyte sample by a mass spectrometry apparatus (100) according to the present invention.

10. 发明授权

EP3384520B1 MULTIMODE ION MIRROR PRISM AND ENERGY FILTERING APPARATUS AND SYSTEM FOR TIME-OF-FLIGHT MASS SPECTROMETRY 有权
公开(公告)号：EP3384520B1
公开(公告)日：2022-08-03
申请号：EP16871386.5
申请日：2016-11-30
发明人： VERYOVKIN, Igor Vladimirovich , HANLEY, Luke
IPC分类号： H01J49/40 , H01J49/48

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