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1. 发明公开

EP4320447A1 SYSTEMS, DEVICES AND METHODS FOR IDENTIFYING, COLLECTING, RELOCATING, AND ANALYZING MICROMETER- AND NANOMETER-SCALE PARTICLES 审中-实审
公开(公告)号：EP4320447A1
公开(公告)日：2024-02-14
申请号：EP23788849.0
申请日：2023-04-11
申请人： Wyonics LLC
发明人： DI BONA, Kristin R. , HILL, Caleb M.
IPC分类号： G01Q20/02 , G01Q30/02 , H01J37/28 , G01N1/28

2. 发明授权

EP3596483B1 SCANNING SENSOR COMPRISING A SPIN DEFECT 有权
公开(公告)号：EP3596483B1
公开(公告)日：2022-04-20
申请号：EP18709616.9
申请日：2018-03-14
发明人： DEGEN, Christian , BOSS, Jens , CHANG, Kevin , RHENSIUS, Jan
IPC分类号： G01R33/32 , G01N24/10 , G01R33/12 , G01Q60/52 , G01Q70/14 , G01R33/035 , G01R33/10 , G01R29/08 , G01Q20/04

3. 发明授权

EP2972065B1 OPTICAL BEAM POSITIONING UNIT FOR ATOMIC FORCE MICROSCOPE 有权转让
公开(公告)号：EP2972065B1
公开(公告)日：2022-02-16
申请号：EP14772613.7
申请日：2014-03-31
发明人： The designation of the inventor has not yet been filed
IPC分类号： G01Q20/02 , G01Q10/04 , G01B11/30

4. 发明公开

EP3888533A1 BIOLOGICAL TISSUE INSPECTION DEVICE AND METHOD THEREFOR[ 有权
公开(公告)号：EP3888533A1
公开(公告)日：2021-10-06
申请号：EP21165794.5
申请日：2017-05-12
申请人： Koh Young Technology Inc.
发明人： KIM, Hong Ki , KIM, Min Kyu , HWANGBO, Min Young
IPC分类号： A61B5/00 , G01N21/45 , G01Q20/00 , G01B9/02 , G02B27/14
摘要： A biological tissue inspection device is disclosed. The biological tissue inspection device comprises a stage portion and a probe portion. The probe portion comprises an optical imaging portion, an optical interference detection portion, and an optical induction portion. An inspection object is loaded on the stage portion. The probe portion acquires data regarding optical images and optical interference, which are related to the inspection object, through the optical imaging portion and the optical interference detection portion. The stage portion or the probe portion may move such that a selected area of the inspection object is positioned in the FOV of the optical imaging portion and of the optical interference detection portion. The optical induction portion is configured such that illumination light from the optical imaging portion and measurement light from the optical interference detection portion are coaxially emitted to the inspection object. A guide beam may be additionally emitted to display the area that is being measured. A magnification changing portion is included to adjust the magnification of the measured image. As lenses are changed by the magnification changing portion, the position of a reference mirror included in the optical interference detection portion is changed together in order to correct the optical path difference.

5. 发明授权

EP3456244B1 BIOLOGICAL TISSUE INSPECTION DEVICE AND METHOD THEREFOR 有权
公开(公告)号：EP3456244B1
公开(公告)日：2021-05-05
申请号：EP17796423.6
申请日：2017-05-12
发明人： KIM, Hong Ki , KIM, Min Kyu , HWANGBO, Min Young
IPC分类号： A61B5/00 , G01N21/45 , G01Q20/00 , G01B9/02 , G02B27/14

6. 发明授权

EP3542170B1 HIGH-PRECISION SCANNING DEVICE 有权
公开(公告)号：EP3542170B1
公开(公告)日：2020-05-13
申请号：EP17817247.4
申请日：2017-11-17
申请人： Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek (TNO)
发明人： DEKKER, Albert , BIJNAGTE, Anton Adriaan
IPC分类号： G01Q10/04 , G01Q20/04

7. 发明授权

EP3324194B1 IMAGING A GAP BETWEEN SAMPLE AND PROBE OF A SCANNING PROBE MICROSCOPE IN SUBSTANTIALLY HORIZONTAL SIDE VIEW 有权
公开(公告)号：EP3324194B1
公开(公告)日：2019-06-26
申请号：EP16200047.5
申请日：2016-11-22
申请人： Anton Paar GmbH
发明人： Koller, Daniel , Gomez-Casado, Alberto , Brandner, Markus
IPC分类号： G01Q30/02 , G01Q10/06 , G01Q20/02

8. 发明公开

EP3467518A1 CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIELD SPECTROSCOPY 有权
公开(公告)号：EP3467518A1
公开(公告)日：2019-04-10
申请号：EP18205484.1
申请日：2014-03-14
申请人： Bruker Nano, Inc.
发明人： ANDREEV, Gregory , OSECHINSKIY, Sergey , MINNE, Stephen , SU, Chanmin
IPC分类号： G01Q20/02 , G01Q60/22
摘要： Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction. Nano-identification is realized with sub-50 nm resolution and, optionally, in the mid-infrared portion of he spectrum.

9. 发明公开

EP3465230A1 CRYOGENIC COOLING SYSTEM 审中-公开
公开(公告)号：EP3465230A1
公开(公告)日：2019-04-10
申请号：EP17727340.6
申请日：2017-05-26
申请人： Oxford Instruments Nanotechnology Tools Limited
发明人： PATTON, Mark
IPC分类号： G01Q20/02 , B01L7/00 , F25D19/00 , G01Q30/10 , G02B6/42 , G01N21/01 , G02B21/28

10. 发明公开

EP3404424A1 SCANNING PROBE MICROSCOPY SYSTEM FOR AND METHOD OF MAPPING NANOSTRUCTURES ON THE SURFACE OF A SAMPLE 审中-公开
公开(公告)号：EP3404424A1
公开(公告)日：2018-11-21
申请号：EP17171030.4
申请日：2017-05-15
申请人： Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO
发明人： Sadeghian Marnani, Hamed , Kastelijn, Aukje , Toet, Peter Martijn , Kramer, Geerten Frans Ijsbrand , Nieuwkoop, Evert , Dekker, Albert , van Riel, Marinus Cornelius Johannes Maria , Kruidhof, Rik
IPC分类号： G01Q20/02 , G01B9/02
CPC分类号： G01Q20/02 , G01B9/02023 , G01B9/02028 , G01B9/02057 , G01B9/02065 , G01B2290/45
摘要： The present document relates to a scanning probe microscopy system and method for mapping nanostructures on the surface of a sample. The system comprises a sample support structure, a scan head including a probe comprising a cantilever and a probe tip, and an actuator for scanning the probe tip relative to the sample surface. The system also includes an optical source, and a sensor unit for obtaining a sensor signal indicative of a position of the probe tip. The sensor unit includes a partially reflecting element for reflecting a reference fraction and for transmitting a sensing fraction of the optical signal. It further includes directional optics for directing the sensing fraction as an optical beam towards the probe tip, and for receiving a reflected fraction thereof to provide a sensed signal. Moreover the sensor includes an interferometer for providing one or more output signals, and signal conveyance optics for conveying the sensed signal and the reference signal to the interferometer. The directional optics is configured for directing the sensing fraction such that at least a part of the sensing fraction is reflected by the probe tip such as to form the reflected fraction.

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