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1. 发明公开

EP3739587A1 MICROHEAD AND STAGE MECHANISM USING SAME 有权
公开(公告)号：EP3739587A1
公开(公告)日：2020-11-18
申请号：EP19914206.8
申请日：2019-10-01
申请人： BIBLIOS CO., LTD.
发明人： NAKATOMI, Yoshiharu , ONODERA, Takeshi , SUZUKI, Shinji
IPC分类号： G12B5/00 , G01B3/18
摘要： Provided is a micro head having a simple structure and yet entailing extremely little backlash.
A micro head includes a spindle, a sleeve, a thimble, a backlash absorbing member, and a collar, wherein the cylindrical backlash absorbing member is fixed to the sleeve in a state where the spindle is inserted at a position in the sleeve.

2. 发明公开

EP3450906A1 BAR LENGTH DETECTION TOOL AND METHOD FOR DETECTING BAR LENGTH 审中-公开
公开(公告)号：EP3450906A1
公开(公告)日：2019-03-06
申请号：EP18175909.3
申请日：2018-06-05
申请人： Miasolé Equipment Integration (Fujian) Co., Ltd.
发明人： Wu, Fuzhong , Huang, Xi´nan , Lei, Guixian , Chen, Jindao , Wang, Xiutao , Lan, Bangyin , Cai, Ailing
IPC分类号： G01B5/00 , G01B3/18 , G01B5/02
摘要： A bar length detection tool and a method for detecting a length of a bar (14) are provided, the bar length detection tool comprises: a substrate (1), a first bearing seat (2) and a second bearing seat (2') oppositely disposed on the substrate (1), and a micrometer (3); wherein a positioning device (5) is rotatably connected to the first bearing seat (2), a mounting plate (6) is rotatably connected to the second bearing seat (2'), and the first bearing seat (2) and the second bearing seat (2') are each provided with at least two needle bearings (12).

3. 发明公开

EP1832853A3 Absolute position measuring device 有权
标题翻译：设备用于测量绝对位置
公开(公告)号：EP1832853A3
公开(公告)日：2016-04-20
申请号：EP07004604.0
申请日：2007-03-06
申请人： Mitutoyo Corporation
发明人： Sakaki, Kouji
IPC分类号： G01D5/22 , G01B3/18
CPC分类号： G01D5/22
摘要： An absolute position measuring device includes a main body, a spindle (300), a rotary encoder (500), a linear encoder (600), and an arithmetic processor (720). The rotary encoder (500) has a rotor plate encoder (520) that rotates integrally with the spindle (300). A rotary cylinder (530) rotates integrally with the spindle (300) and has an external thread (531). A nut member (610) is engaged with the external thread (531) of the rotary cylinder (530) in a rotation stop state. The linear encoder (600) has a slider (620) that slides together with the nut member (610), and a detection scale (630) that detects the slider position. The rotary encoder (500) absolutely detects the rotary angle of the rotor plate (520) within one revolution, and the linear encoder (600) absolutely detects the position of the slider (620).

4. 发明公开

EP2883017A1 HANDHELD MEASURING INSTRUMENT 有权
标题翻译：便携式仪表
公开(公告)号：EP2883017A1
公开(公告)日：2015-06-17
申请号：EP13745110.0
申请日：2013-08-05
申请人： Hexagon Technology Center GmbH
发明人： JORDIL, Pascal
IPC分类号： G01B3/18 , G01B3/20 , G01B21/04
CPC分类号： G01B3/18 , G01B3/002 , G01B3/205 , G01B21/047 , G01B2210/58
摘要： The invention relates to a handheld measurement instrument (10) and a configurator (80) forming a measurement kit. The measuring instrument (10) and the configurator (80) are provided each with an interface (30, 35, 36, 84, 86, 87), enabling communication between the measuring instrument (10) and the configurator (80). The handheld measurement instrument (10) further comprises a measuring unit (21, 21a, 21b) for measuring distances or angles of an object by contacting physically distinct points of said object; and a circuit unit (50) applying a function of a functionality on electronic signals/electronic measurement results delivered from the measuring unit (21, 21a, 21b) in order to deliver the measuring results in a desired form to the user by output means (28). The form the results should be presented can be selected by the user using input means (26) of the measuring instrument (10). The circuit unit (50) is configurable by the user using the configurator (80) in order to determine, with which functionality the circuit unit (50) and the input means (26), respectively should be equipped.

5. 发明公开

EP2657641A1 Micrometer 有权
标题翻译： Mikrometer
公开(公告)号：EP2657641A1
公开(公告)日：2013-10-30
申请号：EP13162416.5
申请日：2013-04-05
申请人： Mitutoyo Corporation
发明人： Tsuji, Shozaburo
IPC分类号： G01B3/18
CPC分类号： G01B3/18
摘要： A micrometer (1) includes: a frame (10); an anvil (11); a spindle (20); an encoder (40); a display (60); a strain gauge (50) that detects a deformation of the frame; a storage that stores a change amount of the detection value (a displacement of the spindle detected by the encoder) per a unit deformation detected by the strain gauge, as a compensation factor; and a compensator that compensates the detection value based on a difference between a zeroset-time deformation that is detected by the strain gauge when a command for zeroset is given and a measurement-time deformation that is detected by the strain gauge in measurement, and based on the compensation factor stored in the storage.
摘要翻译：千分尺（1）包括：框架（10）; 砧座（11）; 主轴（20）; 编码器（40）; 显示器（60）; 应变计（50），其检测所述框架的变形; 作为补偿因子，存储由应变计检测出的每单位变形的检测值的变化量（由编码器检测的主轴的位移）的变化量; 以及补偿器，其基于当给出用于零点的命令时由应变计检测到的零点时间变形与由测量中的应变计检测到的测量时间变形之间的差异来补偿检测值，并且基于关于存储在存储器中的补偿因子。

6. 发明公开

EP2584303A1 Micrometer 有权转让
标题翻译：千分尺
公开(公告)号：EP2584303A1
公开(公告)日：2013-04-24
申请号：EP12007192.3
申请日：2012-10-17
申请人： Mitutoyo Corporation
发明人： Hayashida, Shuji
IPC分类号： G01B3/18
CPC分类号： G01B3/18
摘要： A micrometer (1) includes: a displacement detector that detects a displacement of a spindle (1C); a display device (2) that is rotatably attached to a fixed sleeve (1B); and a control device that controls the display device (2). The display device (2) includes: an image display section that displays an image including a measurement value based on the displacement detected by the displacement detector; a surface member (21) that faces the image display section and has a touch surface (21A); a position sensor that detects a position pressed on the touch surface (21A); and a support member (24) that supports the image display section, the surface member (21) and the position sensor while the touch surface (21A) is exposed to an outside, the support member (24) being rotatably attached to the fixed sleeve (1B).
摘要翻译：测微计（1）包括：位移检测器，其检测主轴（1C）的位移; 显示装置（2），其可旋转地安装在固定套筒（1B）上; 和控制显示装置（2）的控制装置。显示装置（2）包括：图像显示部分，其基于由位移检测器检测到的位移来显示包括测量值的图像; 表面构件（21），其面向图像显示部并具有触摸表面（21A）; 位置传感器，其检测按压在触摸表面（21A）上的位置; 以及在所述触摸表面（21A）暴露于外部的同时支撑所述图像显示部分，所述表面构件（21）和所述位置传感器的支撑构件（24），所述支撑构件（24）可旋转地附接到所述固定套筒（1B）。

7. 发明公开

EP2378238A1 Displacement measuring instrument 有权
标题翻译： Wegmessgerät
公开(公告)号：EP2378238A1
公开(公告)日：2011-10-19
申请号：EP11162625.5
申请日：2011-04-15
申请人： Mitutoyo Corporation
发明人： Tsuji, Shozaburo
IPC分类号： G01B3/18
CPC分类号： G01B3/18
摘要： A displacement measuring instrument includes a spindle (10) screwed to a stationary sleeve (20), a thimble (30), an operation sleeve (40), and a constant pressure mechanism (50). The constant pressure mechanism (50) includes: a rotary driving element (51) rotatable together with the operation sleeve; a rotary driven element (52) coupled to the rotary driving element in such a manner as to be rotatable together with the rotary driving element but not to be rotatable when a predetermined or more load is applied to the spindle; and a rotation transmitting mechanism (53) transmitting a rotation of the rotary driven element to the spindle. A male thread portion (23) with the same pitch as that of a male thread portion (12) of the spindle is formed on the outer circumference of the stationary sleeve. A female thread portion (31) is formed on the inner circumference of the thimble and screwed to the male thread portion of the stationary sleeve.
摘要翻译：位移测量仪器包括旋转到固定套筒（20），套管（30），操作套筒（40）和恒压机构（50）的心轴（10）。恒压机构（50）包括：与操作套筒一起旋转的旋转驱动元件（51）; 旋转驱动元件（52），其以与所述旋转驱动元件一起旋转的方式联接到所述旋转驱动元件，但是当预定的或更大的负载施加到所述心轴时，所述旋转从动元件不能旋转; 以及将旋转从动元件的旋转传递到主轴的旋转传递机构（53）。在静止套筒的外周上形成有与心轴的外螺纹部分（12）相同节距的外螺纹部分（23）。内螺纹部分（31）形成在套筒的内圆周上并与固定套筒的阳螺纹部分螺纹连接。

9. 发明授权

EP0884555B1 Micrometer and method for manufacturing cylindrical components for a micrometer 失效
标题翻译：微米，和方法用于制造微米圆柱形部件
公开(公告)号：EP0884555B1
公开(公告)日：2003-04-16
申请号：EP98304544.4
申请日：1998-06-09
申请人： Mitutoyo Corporation
发明人： Sato, Hajime , Nakata, Kiyohiro , Hamano, Chikashi , Mishima, Toshihiko , Fujimitsu, Tohru
IPC分类号： G01B3/18 , G01B5/02
CPC分类号： G01B3/004 , G01B3/18

10. 发明公开

EP1099928A1 Micrometer 有权
标题翻译： Mikrometer
公开(公告)号：EP1099928A1
公开(公告)日：2001-05-16
申请号：EP00309945.4
申请日：2000-11-09
申请人： Mitutoyo Corporation
发明人： Saeki, Akitomo, c/o Mitutoyo Corporation
IPC分类号： G01B3/18
CPC分类号： G01B3/18
摘要： A thimble (5) and a spindle (4) are rotated through a first constant-force device (70) by rotating an operation sleeve (6) integrally having a first operation section (61) and a second operation section (62). When a more than predetermined load is applied to the spindle (4), the first constant-force device (70) is actuated to spin the operation sleeve (6) idly. Since the operation sleeve (6) integrally has the first operation section (61) and the second operation section (62), both double-handed operation for holding the frame by left hand and rotating the first operation section (61) by right hand and single-handed operation for holding the frame and rotating the second operation section (62) with a single-handed are possible while retaining the same operability as in conventional operation during measurement.
摘要翻译：通过使具有第一操作部分（61）和第二操作部分（62）的整体的操作套筒（6）旋转，套筒（5）和主轴（4）通过第一恒力装置（70）旋转。当超过预定的负载施加到主轴（4）时，第一恒力装置（70）被致动以使操作套筒（6）空转。由于操作套筒6一体地具有第一操作部61和第二操作部62，所以双手握住框架的双手操作，并且用右手旋转第一操作部61，可以在保持与测量期间的常规操作相同的可操作性的同时单手握住框架并旋转第二操作部分（62）的单手操作。

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