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    • 2. 发明公开
    • Voltage offset compensation method for time-interleaved multi-path analog-to-digital sigma-delta converters and respective circuit
    • Offsetspannungskompensationsverfahrenfürparallele zeitverschachtelte Analog-Digitalwandler sowie Schaltungdafür
    • EP1401105A1
    • 2004-03-24
    • EP02425563.0
    • 2002-09-17
    • Siemens Mobile Communications S.p.A.
    • Gatti, UmbertoMalcovati, PieroFerragina, VincenzoFornasari, Andrea
    • H03M1/10
    • H03M3/384H03M3/47
    • A multi-path time-interleaved analog-to-digital converter (MP-ADC) exploits an additional reference ADC cyclically connected in parallel to each ADC component part to be calibrated of the multi-path ADC, which can be of any kind, in particular sigma-delta, to whom conventional calibration techniques cannot be applied because of its stochastic behaviour. For each ADC component part the algebraic differences between successive digital outputs of the reference ADC and the ADC under calibration are forwarded to an accumulator circuit (13) which integrates them over a given time slot, obtaining a digital word (CH1',...,CH4') proportional to the difference between the offset of the two paths. A digital adder adds up the digital word so obtained to the output of the ADC component part under calibration multiplied by a scale factor which depends on the length of the given time slot. After a reasonable time the voltage offset of each individual path is proportional to the voltage offset of the only reference path, not necessarily zero. Optionally, the outputs of the digital adder are de-scaled by the same scale factor, restoring the original value. The time-interleaved ADC is continuously running and the voltage offset calibration is performed in background without affecting the normal operation (fig.7) .
    • 多路时间交织的模数转换器(MP-ADC)利用了一个额外的参考ADC,并行地并行地与待校准的多路径ADC的每个ADC组件部分并行地进行校准,该多路径ADC可以是任何类型的, 特定的Σ-Δ,由于其随机行为,传统的校准技术不能应用于此。 对于每个ADC组件部分,参考ADC和ADC在校准之间的连续数字输出之间的代数差异被转发到累加器电路(13),其在给定时隙上对它们进行积分,获得数字字(CH1',...) ,CH4')与两个路径的偏移之间的差成比例。 数字加法器将所获得的数字字相加在校准下的ADC分量部分的输出乘以比例因子,该比例因子取决于给定时隙的长度。 在合理的时间之后,每个单独路径的电压偏移量与唯一参考路径的电压偏移成比例,不一定为零。 可选地,数字加法器的输出通过相同的比例因子进行缩放,恢复原始值。 时间交织的ADC连续运行,并且在背景中执行电压偏移校准,而不影响正常操作(图7)。
    • 6. 发明公开
    • Electronic device and method for analogue to digital conversion according to Delta-Sigma modulation using double sampling
    • 一种电子装置和方法,用于模拟 - 数字转换按照所述Δ-Σ调制使用双采样
    • EP2658131A1
    • 2013-10-30
    • EP12002892.3
    • 2012-04-24
    • Texas Instruments DeutschlandTexas Instruments Incorporated
    • Schmid, KonstantinReinhold, MichaelOhnhaeuser, Frank
    • H03M3/02
    • H03M3/338H03M3/34H03M3/43H03M3/47
    • The invention relates to an electronic device and a method for analogue-to-digital conversion according to Delta-Sigma modulation. The modulator comprises at least a first switched capacitor integration stage (INT1), a second switched capacitor integration stage and a single-bit comparator, wherein the first switched capacitor Integration stage (INT1) is implemented in a fully differential architecture and comprises: an operational amplifier (OP1), a plurality of sets of input sampling capacitors (CIN1-CIN4) for sampling an analogue input voltage (VIN) and a plurality of sets of reference feedback capacitors (CRF1-CRF8) for sampling a feedback reference voltage (VREF), and wherein the first integration stage (INT1) is further configured to sample the analog input voltage (VIN) on a first set of input capacitors (CIN1, CIN2; CIN3, CIN4) out of the plurality of sets of input capacitors (CIN1-CIN4) during a first portion of a clock cycle and on a second set (CIN3, CIN4; CIN1, CIN2) out of the plurality of sets of input capacitors (CIN1-CIN4) during a second portion of the clock cycle and to sample the feedback reference voltage (VREF) on a first set of reference feedback capacitors (CRF1, CRF2; CRF3, CRF4; CRF5, CRF6; CRF7, CRF8) out of the plurality of sets of reference feedback capacitors (CRF1-CRF8) during the first portion of the clock cycle and on a second set of reference feedback capacitors (CRF1, CRF2; CRF3, CRF4; CRF5, CRF6; CRF7, CRF8) out of the plurality of sets of reference feedback capacitors (CRF1-CRF8) during the second portion of the clock cycle and wherein the first set of reference feedback capacitors and the second set of reference feedback capacitors are randomly selected out of the plurality of sets of reference feedback capacitors (CRF1-CRF8) from clock cycle to clock cycle.
    • 本发明涉及在电子装置和用于模拟 - 数字转换gemäß到delta-sigma调制的方法。 所述调制器包括至少一个第一开关电容积分级(INT1),第二开关电容积分级和一个单个位比较器,worin第一开关电容积分级(INT1)在全差分结构,并包括被实现:运算 放大器(OP1),用于模拟输入电压(VIN)和套参考反馈电容器(CRF1 CRF8)用于采样反馈参考电压的多个采样组输入取样电容器(CIN1 CIN4)的多个(VREF) 和worin第一积分级(INT1)被进一步配置为在第一组输入电容器的采样模拟输入电压(VIN)(CIN1,CIN2,CIN3,CIN4)出的组输入电容器的多个(CIN1- CIN4)期间的时钟周期的第一部分和在第二组(CIN3,CIN4; CIN1,CIN2)出的组输入电容(CIN1 CIN4)的多个期间,在时钟周期的第二部分,并以采样 反馈参考, NCE电压(VREF)上的第一组参考反馈电容器(CRF1,CRF2; CRF3,CRF4; CRF5,CRF6; CRF7,CRF8)选自组参考反馈电容器(CRF1 CRF8)的时钟周期的第一部分期间与在第二组参考反馈电容器(CRF1,CRF2多个; CRF3,CRF4; CRF5,CRF6; CRF7 ,在时钟周期的第二部分和worin所述第一组参考反馈电容器和第二组参考反馈电容器期间CRF8)选自组参考反馈电容器(CRF1 CRF8)多个随机选择从所述多个 套从时钟周期参考反馈电容器(CRF1 CRF8)时钟周期。