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1. 发明公开

EP2912443A4 AUTOMATED MINERAL CLASSIFICATION 审中-公开
标题翻译： AUTOCATISIERTE KLASSIFIZIERUNG VON MINERALIEN
公开(公告)号：EP2912443A4
公开(公告)日：2015-11-04
申请号：EP13849908
申请日：2013-09-30
申请人： FEI CO
发明人： OWEN MICHAEL JAMES , BUHOT MICHAEL
IPC分类号： G01N23/225
CPC分类号： G01N23/2252 , G01N2223/418 , H01J37/256 , H01J37/28 , H01J2237/2442 , H01J2237/24425 , H01J2237/2804 , H01J2237/2807

2. 发明公开

EP2912443A1 AUTOMATED MINERAL CLASSIFICATION 审中-公开
标题翻译：自动矿物分类
公开(公告)号：EP2912443A1
公开(公告)日：2015-09-02
申请号：EP13849908.2
申请日：2013-09-30
申请人： FEI Company
发明人： OWEN, Michael James , BUHOT, Michael
IPC分类号： G01N23/225
CPC分类号： G01N23/2252 , G01N2223/418 , H01J37/256 , H01J37/28 , H01J2237/2442 , H01J2237/24425 , H01J2237/2804 , H01J2237/2807
摘要： The present invention discloses a combination of two existing approaches for mineral analysis and makes use of the Similarity Metric Invention, that allows mineral definitions to be described in theoretical compositional terms, meaning that users are not required to find examples of each mineral, or adjust rules. This system allows untrained operators to use it, as opposed to previous systems, which required extensive training and expertise.
摘要翻译：本发明公开了用于矿物分析的两种现有方法的组合，并且利用了相似度量发明，其允许以理论组成术语来描述矿物定义，这意味着用户不需要找到每种矿物的例子或调整规则。这个系统允许未经培训的操作员使用它，而不是以前的系统，这需要广泛的培训和专业知识。

3. 发明公开

EP0877930A1 X-RAY ANALYSIS APPARATUS PROVIDED WITH A DOUBLE COLLIMATOR MASK 失效
标题翻译：提供双重定位掩模的X射线分析装置
公开(公告)号：EP0877930A1
公开(公告)日：1998-11-18
申请号：EP97941147.0
申请日：1997-10-03
申请人： Koninklijke Philips Electronics N.V.
发明人： VAN DER WAL, Hendricus, Gerardus, Maria
IPC分类号： G01N23 , G21K1 , H01J37
CPC分类号： G01N23/223 , G01N2223/076 , H01J2237/24425
摘要： A Soller slit (16) in an X-ray spectrometer can parallelize fluorescent radiation which emanates from a specimen (4) and is to be analyzed according to wavelength by an analyzer crystal (18). Because the aim is to irradiate an as large as possible surface of the specimen (4) by means of primary X-rays (10), inevitably disturbing fluorescent radiation is also generated by the environment of the specimen, for example the specimen holder (6). In order to intercept this disturbing radiation so that it cannot reach the X-ray detector, a collimator mask (12) is arranged in a fixed location in the beam path. In the case of varying specimen dimensions it is not always possible to choose such dimensions for this mask that the disturbing radiation is intercepted. Therefore, a second collimator mask (28) is provided (behind the Soller slit (16)) in order to intercept the disturbing radiation in cooperation with the first mask (12).
摘要翻译：在X射线分光计中的索勒狭缝（16）可以平行化从样品（4）发出并且将由分析仪晶体（18）根据波长进行分析的荧光辐射。因为目标是通过初级X射线（10）照射试样（4）的尽可能大的表面，所以试样的环境也会产生不可避免的干扰荧光辐射，例如样品架（6 ）。为了拦截该干扰辐射以使其不能到达X射线探测器，准直器掩模（12）布置在光路中的固定位置。在样品尺寸不同的情况下，选择这种掩模的尺寸并不总是可能的，即干扰辐射被截断。因此，提供第二准直器掩模（28）（在索勒狭缝（16）后面）以便与第一掩模（12）协作地拦截干扰辐射。

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