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    • 1. 发明公开
    • PULSE PROCESSING
    • IMPULSVERARBEITUNG
    • EP3062126A1
    • 2016-08-31
    • EP16156848.0
    • 2016-02-23
    • FEI Company
    • Kontaras, NikolaosJanssen, BartKooijman, CornelisAntunes, Duarte
    • G01T1/17
    • H01J37/244G01T1/17H01J37/28H01J2237/22
    • The invention relates to a method for analyzing an analogue signal (fig. 3, 400) comprising randomly spaced events (301, 302), the event having an event height, the method comprising:
      • Converting the signal to a series of samples S(t), with t the moment of sampling, thereby forming a sampled, discrete time signal,
      • Detecting the presence of an event, the event detected at t = T,
      • Estimating the event height using a number of samples preceding the event and a number of samples following S(T),
      the method further comprising:
      • Using a model (412, fig. 5) to estimate a noise contribution N(t) for t = (T-Δ 1 ) to t = (T+Δ 2 ), the noise contribution derived from samples S(t) with t ≤ (T-Δ 1 ) and/or samples S(t) with t ≥ (T+Δ 2 ), with Δ 1 and Δ 2 predetermined or preset time periods, Δ 1 having a value such that the event has a negligible contribution to samples taken before (T-Δ 1 ) and Δ 2 having a value such that the event has a negligible contribution to samples taken after (T+Δ 2 ),
      • Estimating the event height E by integrating the series of samples from (T-Δ 1 ) to (T+Δ 2 ) minus the noise contribution for said samples, E = ∑ t = T − Δ 1 t = T + Δ 2 S t − ∑ t = T − Δ 1 t = T + Δ 2 N t = ∑ t = T − Δ 1 t = T + Δ 2 S t − N t .
      In an important aspect of the invention, the sampled signal is subjected to a sparsification operation that causes said event to be temporally compressed.
      This method is particularly useful for X-ray detectors, such as Silicon Drift Detectors, used in a SEM. By estimating the noise contribution to the signal, the step height is estimated with improved accuracy. The invention further describes several methods to be used as a model.
    • 本发明涉及一种用于分析包含随机间隔事件(301,302)的模拟信号(图3,400)的方法,所述事件具有事件高度,所述方法包括:将信号转换为一系列样本S (t),t为采样时刻,从而形成采样的离散时间信号,¢检测事件的存在,t = T时检测到的事件,¢使用前面的多个样本估计事件高度 事件和S(T)之后的多个样本,该方法还包括:使用模型(412,图5)估计t =(T-1)到t =的噪声贡献N(t) (T +“2),从t‰(T - 1)和/或样本S(t)得到的样本S(t)的噪声贡献与t‰(T +”2),“1和”2 预定或预设的时间段,“1具有使得事件对(T-1)之前采取的样本的贡献可忽略不计的值,并且”2具有使得事件具有可忽略的公理 对(T +“2)之后采样的样本的贡献,¢通过将来自(T-1)到(T + 2)的一系列样本减去所述样本的噪声贡献来估计事件高度E,E ='t = T'“1 t = T +”2 S t“t = T'”1 t = T +“2 N t ='t = T'”1 t = T + t'N t。 在本发明的一个重要方面,采样信号经受使所述事件被时间压缩的稀疏化操作。 该方法对于SEM中使用的X射线检测器,例如硅漂移探测器特别有用。 通过估计对信号的噪声贡献,以提高的精度估计台阶高度。 本发明还描述了用作模型的几种方法。
    • 9. 发明公开
    • Pulse processing
    • Impulsverarbeitung
    • EP3062125A1
    • 2016-08-31
    • EP15156716.1
    • 2015-02-26
    • FEI COMPANY
    • Kontaras, NikolaosJanssen, BartKooijman, KeesAntunes, Duarte
    • G01T1/17
    • H01J37/244G01T1/17H01J37/28H01J2237/22
    • The invention relates to a method for analyzing an analogue signal (fig. 3, 400) comprising randomly spaced events (301, 302), the event having an event height, the method comprising:
      • Converting the signal to a series of samples S(t), with t the moment of sampling, thereby forming a sampled, discrete time signal,
      • Detecting the presence of an event, the event detected at t = T,
      • Estimating the event height using a number of samples preceding the event and a number of samples following S(T),
      Characterized in that the method further comprises
      • Using a model (412, fig. 5) to estimate a noise contribution N(t) for t = (T-Δ 1 ) to t = (T+Δ 2 ), the noise contribution derived from samples S(t) with t ≤ (T-Δ 1 ) and/or samples S(t) with t ≥ (T+Δ 2 ), witch Δ 1 and Δ 2 predetermined or preset time periods, Δ 1 having a value such that the event has a negligible contribution to samples taken before (T-Δ 1 ) and Δ 2 having a value such that the event has a negligible contribution to samples taken after (T+Δ 2 ),
      • Estimating the event height E by integrating the series of samples from (T-Δ 1 ) to (T+Δ 2 ) minus the noise contribution for said samples, E = ∑ t = T - Δ 1 t = T + Δ 2 S t - ∑ t = T - Δ 1 t = T + Δ 2 N t = ∑ t = T - Δ 1 t = T + Δ 2 S t - N t .
      This method is particularly useful for X-ray detectors, such as Silicon Drift Detectors, used in a SEM. By estimating the noise contribution to the signal, the step height is estimated with improved accuracy. The invention further describes several methods to be used as a model.
    • 本发明涉及一种用于分析包含随机间隔事件(301,302)的模拟信号(图3,400)的方法,所述事件具有事件高度,所述方法包括:将信号转换为一系列样本S (t),t为采样时刻,从而形成采样的离散时间信号,¢检测事件的存在,t = T时检测到的事件,¢使用前面的多个样本估计事件高度 事件和S(T)之后的多个样本,其特征在于该方法还包括使用模型(412,图5)估计t =(T-1)至 t =(T +“2),样本S(t)与t‰(T-”1)和/或样本S(t)t +(T +“2)的噪声贡献, “2个预定或预设时间段”1具有使得该事件对(T-1)之前采取的采样具有可忽略的贡献的值,并且“2具有使得偶数 对(T +“2)之后采样的样本贡献可以忽略不计,通过将来自(T-1)到(T + 2)的一系列样本减去所述样本的噪声贡献来估计事件高度E,E = t = T - “1 t = T +”2 S t - 't = T - “1 t = T +”2 N t ='t = T - “1 t = T + t - N t。 该方法对于SEM中使用的X射线检测器,例如硅漂移探测器特别有用。 通过估计对信号的噪声贡献,以提高的精度估计台阶高度。 本发明还描述了用作模型的几种方法。