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    • 2. 发明公开
    • TESTING METHOD USING GUIDED WAVE
    • TESTVERFAHREN UNTER VERWENDUNG EINER GELEITETEN WELLE
    • EP2527827A4
    • 2017-03-15
    • EP10843898
    • 2010-02-12
    • IHI INSPECTION AND INSTR CO LTD
    • DAIKOKU KOKIYOSHIZAKI MASATOSATO SHUICHI
    • G01N29/04G01N29/44
    • G01N29/44G01N29/11G01N29/2412G01N29/4427G01N29/4472G01N2291/0425G01N2291/044G01N2291/2634
    • (A) first data for defect amount estimation for the guided wave of a first frequency is obtained, the data indicating a relationship among amplitude of the reflected wave, a defect cross-sectional area and a defect width. (B) second data for defect amount estimation for the guided wave of a second frequency is obtained, the data indicating a relationship among amplitude of the reflected wave, a defect cross-sectional area and a defect width. (C) a guided wave of the first frequency is generated, and amplitude of a reflected wave is detected as first amplitude. (D) a guided wave of the second frequency is generated, and amplitude of a reflected wave is detected as second amplitude. (E) on a basis of the first and second data and the first and second amplitude, a defect cross-sectional area and a defect width of the defect part are estimated.
    • (A)获得用于第一频率的导波的缺陷量估计的第一数据,该数据表示反射波的振幅,缺陷横截面积和缺陷宽度之间的关系。 (B)获得用于第二频率的导波的缺陷量估计的第二数据,该数据表示反射波的振幅,缺陷横截面积和缺陷宽度之间的关系。 (C)产生第一频率的导波,并且反射波的振幅被检测为第一振幅。 (D)产生第二频率的导波,并且反射波的振幅被检测为第二振幅。 (E)根据第一和第二数据以及第一和第二幅值估算缺陷部分的缺陷横截面积和缺陷宽度。