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    • 3. 发明公开
    • Integrated supply protection
    • Schutz einer integrierten Stromversorgung
    • EP0854555A3
    • 1999-09-01
    • EP97310049.8
    • 1997-12-12
    • SGS-THOMSON MICROELECTRONICS, INC.
    • Notaro, JosephSwanson, David Frank
    • H02H11/00
    • H02H11/003H02H9/046Y10T307/839
    • An electrical power protection integrated circuit provides protection against reverse battery and overvoltage conditions that is particularly of value in automotive applications in which reverse battery and overvoltage conditions are commonplace. The electrical power protection integrated circuit device contains a reverse battery condition protection element, supplied either directly or indirectly from a battery power source, that protects against a reverse battery condition of the battery power source and an overvoltage protection element coupled to the reverse battery condition protection device that protects against an overvoltage condition of the battery power source and produces a protected power output that is isolated from both battery overvoltage and reverse battery voltage conditions. Additionally, the integrated circuit device can further produce an auxiliary protected power output that is isolated from reverse battery voltage conditions.
    • 电力保护集成电路提供防止反向电池和过电压条件的保护,这在特别是在反向电池和过电压条件是常见的汽车应用中是有价值的。 电力保护集成电路装置包含反向电池状态保护元件,其直接或间接地从电池电源提供,其防止电池电源的反向电池状态和与反向电池状态保护耦合的过电压保护元件 该装置可以防止电池电源的过压状态,并产生与电池过电压和反向电池电压条件隔离的受保护的电源输出。 此外,集成电路器件可以进一步产生与反电池电压条件隔离的辅助受保护功率输出。
    • 10. 发明公开
    • Method of stress testing integrated circuit having memory and integrated circuit having stress tester for memory thereof
    • 一种用于压力测试方法与存储器和集成的电路的集成电路与存储器测试器用于应力
    • EP0886280A1
    • 1998-12-23
    • EP98303802.7
    • 1998-05-14
    • SGS-THOMSON MICROELECTRONICS, INC.
    • So, Jason Siucheong
    • G11C29/00
    • G11C29/28G11C11/41G11C29/34G11C29/50G11C29/56
    • An integrated circuit having enhanced testing capabilities and a method of testing an integrated circuit are provided. The integrated circuit preferably includes a substrate and a memory block on the substrate. The memory block preferably has a plurality of memory cells arranged in a plurality of rows and a plurality of columns within a defined area on the substrate, at least one bit line connected to each of the plurality of memory cells and defining a column, at least one word line connected to each of the plurality of memory cells and defining a row, and sense amplifying means connected to the at least one bit line for sensing a state of an addressed memory cell in at least one of the plurality of columns. The integrated circuit also includes a selectable stress tester on the substrate and connected to the memory block for selectively stress testing only portions of the memory block and not other portions so as to determine whether to accept or reject a memory block.
    • 一种集成电路,具有增强的检测能力并且提供集成电路的测试的方法。 集成电路优选地包括基板和在基板上的存储块。 存储器块优选地具有在基片上的限定区域内的行中的多个和列排列的多个存储单元的复数,连接到每个存储单元的所述多个所述至少一个位线和限定一列中,至少, 连接到每个存储单元的多元性和一个限定行的一条字线,并读出放大连接到所述至少一个位线用于在列的多个所述至少一个感测被寻址的存储器单元的状态的装置。 因此,该集成电路包括在衬底上的可选择的应力测试器和连接到用于选择性地应力测试存储器块仅部分而不是其他部分,以便确定是否矿接受或拒绝一个存储器块中的存储器块。