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    • 5. 发明公开
    • PARTICLE MEASUREMENT DEVICE AND PARTICLE MEASUREMENT METHOD
    • EP4361594A1
    • 2024-05-01
    • EP22828123.4
    • 2022-05-25
    • FUJIFILM Corporation
    • NAKAMURA, SohichiroHAMADA, Kenichi
    • G01N15/02G01N21/17G01N21/27G01N21/49
    • G01N21/17G01N15/02G01N21/27G01N21/49
    • Provided are a particle measurement device and a particle measurement method capable of measuring a refractive index or a complex refractive index and a particle size distribution of a single type of particles included in a dispersion liquid. A particle measurement device includes a light source unit that irradiates a dispersion liquid including a single type of particles with measurement light, a parameter setting unit that sets at least one of a scattering angle or a measurement wavelength as a measurement parameter, a scattered light measurement unit that obtains a plurality of pieces of scattering intensity data by measuring a scattering intensity of scattered light emitted from the dispersion liquid by the measurement light a plurality of times while changing a value of the set measurement parameter a plurality of times, and a calculation unit that calculates a refractive index and a particle diameter distribution of the single type of particles by calculating scattering intensity time variation characteristic data and scattering intensity parameter-dependent data from the plurality of pieces of scattering intensity data and fitting the calculated scattering intensity time variation characteristic data and the calculated scattering intensity parameter-dependent data using a theoretical formula or a simulation based on a theory of electromagnetic wave behavior that defines a relationship of the refractive index, a particle diameter, and the scattering intensity.