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    • 2. 发明公开
    • MULTI-PEAK REFERENCE GRATING
    • MEHRFACHSPITZEN-REFERENZGITTER
    • EP2980537A1
    • 2016-02-03
    • EP15179029.2
    • 2015-07-30
    • Weatherford/Lamb, Inc.
    • Taverner, Domino
    • G01D5/26G01D5/353
    • G01M11/335G01D5/35316G01D5/35387G01M11/331
    • Methods and apparatus are provided for using a multi-peak reference grating as an optical reference element to produce an optical spectrum with a plurality of reference wavelength peaks spanning a desired wavelength range. This multi-peak reference grating is suitable for use in swept-wavelength interrogation systems, such as those utilizing Bragg grating sensors. Each of the reference wavelength peaks may be characterized for absolute wavelength over a range of environmental operating conditions, such that the absolute wavelength of each reference wavelength peak can be found at any time given the contemporaneous environmental operating condition. This reference grating is interrogated concurrently with the Bragg grating sensors, and the position of each sensor peak relative to the reference grating peaks is used to calculate the absolute wavelength of each sensor (and hence, the corresponding parameter of interest).
    • 提供了使用多峰参考光栅作为光学参考元件以产生具有跨越期望波长范围的多个参考波长峰值的光谱的方法和装置。 该多峰参考光栅适用于扫频波长询问系统,例如使用布拉格光栅传感器的扫描系统。 每个参考波长峰值可以在环境操作条件的范围内被表征为绝对波长,使得在给定同时期的环境操作条件的情况下,可以在任何时候发现每个参考波长峰值的绝对波长。 该参考光栅与布拉格光栅传感器同时询问,并且每个传感器峰值相对于参考光栅峰值的位置用于计算每个传感器的绝对波长(因此,相应的相关参数)。