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    • 2. 发明公开
    • Double-headed spring contact probe
    • 双头弹簧接触探头
    • EP0621485A2
    • 1994-10-26
    • EP93305396.9
    • 1993-07-09
    • VIRGINIA PANEL CORPORATION
    • Stowers, Jeffery P.Burgers,Henri T.Blackard, Paul D.
    • G01R1/067
    • H01R13/2421G01R1/06722H01R12/714H01R13/2414
    • A double-headed spring contact probe (20) for loaded board testing includes a barrel (22) having a hollow interior (25) and opposed plungers (30,50) which slide axially in the barrel. The plungers have outer portions (36,58) which extend through the opposite open ends (23,24) of the barrel, each terminating in a contact tip (38,60) outside the barrel for contacting a test point on a circuit board. One of the plungers (30) has a hollow receptacle (34) extending into the barrel (22) with a rectangular or notched keyway (44) opening into the receptacle. The keyway (44) is disposed at an angle of about 6° to the longitudinal axis thereof. The other plunger (50) has a twisted guide member (54) extending through the barrel into the keyway (44) of the other plunger whereby axial translation of the plungers (30,58) relative to each other also causes a rotation thereof and the keyway (44) rides in the groove (56) for electrical contact as translational movement occurs. A leafspring is further provided on the hollow receptacle (34) adjacent the notched keyway for contacting the twisted guide member (54) of the other plunger to minimize electrical resistance during axial translation. In addition, the plunger (30) may have an open end extending from the barrel (22) with inwardly directed fingers for engaging a contact tip for retaining the same therein.
    • 用于装载板测试的双头弹簧接触探针(20)包括具有中空内部(25)的筒(22)和在筒内轴向滑动的相对柱塞(30,50)。 柱塞具有延伸穿过筒体的相对开口端(23,24)的外部部分(36,58),每个终端部位于筒体外部的接触尖端(38,60),用于接触电路板上的测试点。 其中一个柱塞(30)具有延伸到桶(22)中的中空容器(34),其中矩形或切口的键槽(44)通向容器。 键槽(44)与其纵向轴线成大约6°的角度设置。 另一个柱塞(50)具有扭转的导向构件(54),该导向构件穿过桶延伸到另一个活塞的键槽(44)中,由此柱塞(30,58)相对于彼此的轴向平移也引起其转动,并且 当平移运动发生时,键槽(44)骑在凹槽(56)中用于电接触。 在凹口键槽附近的中空容器(34)上还设置有一个弹簧,用于接触另一个活塞的扭转导向构件(54),以使轴向平移期间的电阻最小。 另外,柱塞(30)可具有从筒体(22)延伸的开口端,其具有向内指向的指状物以接合接触尖端以将其保持在其中。
    • 3. 发明公开
    • Double-headed spring contact probe
    • 弹簧触针有两个接触针。
    • EP0621485A3
    • 1994-12-14
    • EP93305396.9
    • 1993-07-09
    • VIRGINIA PANEL CORPORATION
    • Stowers, Jeffery P.Burgers,Henri T.Blackard, Paul D.
    • G01R1/067
    • H01R13/2421G01R1/06722H01R12/714H01R13/2414
    • A double-headed spring contact probe (20) for loaded board testing includes a barrel (22) having a hollow interior (25) and opposed plungers (30,50) which slide axially in the barrel. The plungers have outer portions (36,58) which extend through the opposite open ends (23,24) of the barrel, each terminating in a contact tip (38,60) outside the barrel for contacting a test point on a circuit board. One of the plungers (30) has a hollow receptacle (34) extending into the barrel (22) with a rectangular or notched keyway (44) opening into the receptacle. The keyway (44) is disposed at an angle of about 6° to the longitudinal axis thereof. The other plunger (50) has a twisted guide member (54) extending through the barrel into the keyway (44) of the other plunger whereby axial translation of the plungers (30,58) relative to each other also causes a rotation thereof and the keyway (44) rides in the groove (56) for electrical contact as translational movement occurs. A leafspring is further provided on the hollow receptacle (34) adjacent the notched keyway for contacting the twisted guide member (54) of the other plunger to minimize electrical resistance during axial translation. In addition, the plunger (30) may have an open end extending from the barrel (22) with inwardly directed fingers for engaging a contact tip for retaining the same therein.