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1. 发明公开

EP1474958A4 MICROWAVE PLASMA SOURCE 有权
标题翻译：微波等离子体源
公开(公告)号：EP1474958A4
公开(公告)日：2005-04-27
申请号：EP02766928
申请日：2002-08-23
申请人： VARIAN AUSTRALIA
发明人： HAMMER MICHAEL RON
IPC分类号： G01N21/68 , G01N21/73 , H01J37/32 , H05H1/24 , H05H1/30 , H05H1/46
CPC分类号： G01N21/73 , G01N21/68 , H05H1/30
摘要： A plasma source for a spectrometer includes a plasma torch (10) located within a waveguide or resonant cavity (40) for both the electric and the magnetic field comoponents of a microwave electromagnetic field to excite a plasma (54). This produces a plasma (54) having a generally elliptical cross section into which sample is relatively easily injected but which still provides good thermal coupling between the plasma and the sample. The invention gives significantly improved limits of detection compared to prior art microwave induced plasma systems. The torch is preferably axially aligned with the direction of the magnetic field component and may be located within a resonant iris (32) within the waveguide or cavity (40).

2. 发明公开

EP1864555A4 A PLASMA SPECTROSCOPY SYSTEM WITH A GAS SUPPLY 有权
标题翻译：与燃气供应等离子光谱系统
公开(公告)号：EP1864555A4
公开(公告)日：2009-09-16
申请号：EP06721305
申请日：2006-03-31
申请人： VARIAN AUSTRALIA
发明人： HAMMER MICHAEL RON
IPC分类号： H05H1/30 , G01N21/73 , H01J49/10
CPC分类号： H01J49/105 , G01N21/68 , G01N21/73 , H05H1/30

3. 发明公开

EP1169624A4 METHOD AND APPARATUS FOR SPECTROCHEMICAL ANALYSIS 审中-公开
标题翻译：方法和设备光谱化学分析
公开(公告)号：EP1169624A4
公开(公告)日：2008-02-20
申请号：EP01905490
申请日：2001-02-15
申请人： VARIAN AUSTRALIA
发明人： WILSON PHILIP VALMONT , WILLIAMS MARK RICHARD , BRICKER DOWER CAMERON , HAMMER MICHAEL RON , MASTERS MARTIN KEITH , CAMPBELL STEWART RALPH , LAYTON PETER GEORGE
IPC分类号： G01J3/02 , G01J3/18 , G01J3/28 , G01J3/36 , G01J5/62 , G01N21/27 , G01N21/31
CPC分类号： G01J3/36 , G01J3/02 , G01J3/0213 , G01J3/0227 , G01J3/0229 , G01J3/0232 , G01J3/1809 , G01J3/2803 , G01J5/62 , G01J2003/1828 , G01N21/27 , G01N21/31
摘要： A method and apparatus for the spectrochemical analysis of a sample in which a solid state array detector (82) is used to detect radiation (62) of spectrochemical interest. The invention involves the use of a shutter (72) adjacent the entrance aperture (70) of a polychromator (74-80) to expose the detector (82) to the radiation (62) for varying lengths of time whereby for short duration exposure times charge accumulation in elements (i.e. pixels) of the detector (82) due to high intensity components of the radiation is limited and for longer exposure times charge accumulation in elements (pixels) of the detector (82) due to feeble intesity components of radiation (62) is increased. This ensures that each reading of the detector (82) includes at least one exposure in which the amount of charge accumulated at each wavelength of interest is neither too little or too great. The problems of feeble radiation components not being accurately measurable and of high intensity radiation components exceeding the charge carrying capacity of elements (pixels) of the detector (82) are thereby able to be avoided. An attenuator (90) may be placed between the radiation source (60) and the detector (82) to permit longer exposure times to be used for very high intensity radiation.

4. 发明公开

EP1305604A4 PLASMA SOURCE FOR SPECTROMETRY 有权
标题翻译：等离子体源光谱法
公开(公告)号：EP1305604A4
公开(公告)日：2006-08-30
申请号：EP01947049
申请日：2001-07-04
申请人： VARIAN AUSTRALIA
发明人： HAMMER MICHAEL RON
IPC分类号： G01N21/73 , H05H1/24 , H05H1/30 , H05H1/46
CPC分类号： H05H1/46 , H05H1/30 , H05H2001/4622
摘要： A plasma source for a spectrometer for spectrochemical analysis of a sample is characterised by use of the magnetic field component of applied microwave energy for exciting a plasma. The source includes a waveguide cavity (10) fed with TE10 mode microwave power. A plasma torch (16) passes through the cavity (10) and is axially aligned with a magnetic field maximum (18) of the applied microwave electromagnetic field. Magnetic field concentration structures such as triangular section metal bars (20) may be provided. In an alternative embodiment a resonant iris may be provided within a waveguide and the plasma torch positioned relative thereto such that the microwave electromagnetic field at the resonant iris excites the plasma.

5. 发明公开

EP1373866A4 MEASURING SPECULAR REFLECTANCE OF A SAMPLE 审中-公开
标题翻译：测量样品的缓解
公开(公告)号：EP1373866A4
公开(公告)日：2009-08-12
申请号：EP02712621
申请日：2002-03-28
申请人： VARIAN AUSTRALIA
发明人： HAMMER MICHAEL RON , FRANCIS ROBERT JOHN
IPC分类号： G01N21/55
CPC分类号： G01N21/55
摘要： Apparatus ( 10 ) for measuring absolute specular reflectance of a surface of a sample ( 22 ) includes a sample holder ( 12 ), a light source ( 18 ) for transmitting an incident light beam ( 16 ) onto a surface of the sample ( 22 ) and a detector ( 26 ) for detecting a specularly reflected component of the incident light. The light source ( 18 ), sample holder ( 12 ) and detector ( 26 ) are mounted and operatively associate ( 14, 24, 28 ) to be relatively moveable to vary the angle of incidence of light ( 16 ) onto sample ( 22 ) and to correspondingly automatically vary the relative position of the detector ( 26 ) such that the angle of reflection equals the angle of incidence. In the absence of the sample ( 22 ) or upon removal of the sample holder ( 12 ), light ( 16 ) impinges directly onto detector ( 26 ) to directly allow measurement of the absolute intensity of the light beam ( 16 ) as a reference measurement. This avoids the need to use intervening optical components such as mirrors which may degrade over time. It also allows provision of a relatively simplified apparatus.

6. 发明公开

EP1169623A4 OPTICAL SHUTTER FOR SPECTROSCOPY INSTRUMENT 有权
标题翻译：光密闭盖FOR分光单元
公开(公告)号：EP1169623A4
公开(公告)日：2006-07-05
申请号：EP01905489
申请日：2001-02-15
申请人： VARIAN AUSTRALIA
发明人： HAMMER MICHAEL RON , MASTERS MARTIN KEITH , CAMPBELL STEWART RALPH , LAYTON PETER GEORGE
IPC分类号： G01J3/02 , G01J3/18 , G01J3/28 , G01J3/36 , G01J5/62 , G01N21/01 , G01N21/27 , G01N21/31
CPC分类号： G01J5/62 , G01J3/02 , G01J3/0213 , G01J3/0227 , G01J3/0229 , G01J3/0232 , G01J3/1809 , G01J3/2803 , G01J2003/1828 , G01N21/27 , G01N21/31
摘要： Spectroscopy apparatus for spectrochemical analysis of a sample having an excitation source (60) for providing spectral light (62) of the sample for analysis. The spectral light (62) is analysed via an optical system (64-66-68) that includes a polychromator (70, 74-80) and solid state multielement array detector (82). The elements (i.e. pixels) of the detector (82) are serially read by means (84) to provide light intensity measurements as a function of wavelength. A problem is that the elements (pixels) of the detector (82) continue to accumulate charge during the serial read-out. This is avoided by providing an optical shutter (72) for blocking the spectral light (62) whilst elements (pixels) of the detector (82) are being serially read. Shutter (72) has a piezoelectric actuator which is preferably a bimorph mounted as a cantilever. It is preferably located adjacent to the entrance aperture (70) of the polychromator. Bimorph structures for the actuator and drive and protective circuit arrangements are also disclosed.

7. 发明公开

EP1137917A4 UV-VIS SPECTROPHOTOMETRY 审中-公开
标题翻译： UV-UND SICHTBARE SPEKTROPHOTOMETRIE
公开(公告)号：EP1137917A4
公开(公告)日：2005-04-13
申请号：EP99959145
申请日：1999-12-02
申请人： VARIAN AUSTRALIA
发明人： HAMMER MICHAEL RON
IPC分类号： G01J1/02 , G01J3/04 , G01J3/10 , G01J3/28 , G01J3/42
CPC分类号： G01J3/28 , G01J3/04 , G01J3/10
摘要： An ultraviolet/visible/infrared spectrophotometer, with a pulsed light source (10), has a monochromator with variable slit width to provide variable spectral resolution. The dynamic range at the detectors (24, 28) is reduced by varying the pulse energy emitted by the light source (10) in accordance with the wavelength and slit width settings (34, 36), and/or by varying the slit height in accordance with the slit width. The ligth source (10) may be a xenon flash lamp.
摘要翻译：具有脉冲光源（10）的紫外/可见/红外分光光度计具有可变狭缝宽度的单色仪，以提供可变的光谱分辨率。通过根据波长和狭缝宽度设置（34,36）改变由光源（10）发射的脉冲能量和/或通过改变光源（10）中的狭缝高度来减小检测器（24,28）处的动态范围根据狭缝宽度。光源（10）可以是氙闪光灯。

8. 发明公开

EP0866961A4 IMPROVED SPECTROPHOTOMETER 失效
标题翻译：改进分光光度计
公开(公告)号：EP0866961A4
公开(公告)日：2001-08-01
申请号：EP97938690
申请日：1997-09-16
申请人： VARIAN AUSTRALIA
发明人： HAMMER MICHAEL RON
IPC分类号： G01J3/04 , G01J3/42 , G01J11/00 , G01N21/27 , G01N21/59 , G01J1/08 , G01J1/16 , G01N21/55
CPC分类号： G01J3/42
摘要： A spectrophotometer including a light source (1) operative to emit a beam of light (15), an optical system for directing the light beam (15) to a sample (8) to be analysed, and a detector (9) which detects the intensity of the light beam after that beam interacrs with the sample (8). The light source (1) is operative to emit bursts of light separated by an interval during which no light is emitted. By way of example, a xenon tube may be used for that purpose. The spectrophotometer measures the intensity of the light beam generated by each burst of light after that beam interacts with the sample. Each such light beam may be divided into first and second parts (5 and 4) prior to interaction with the sample (8), and the optical system is arranged to direct the first part (5) to the sample (8) and to direct the second part (4) to a second detector (7) for conducting a reference measurement. A dark signal measurement may be conducted immediately before or after each burst of light.

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